Demonstration venue · read-only. Every page can be browsed; the buttons that would change it are switched off. Create an account to run TaxoReview on your own data.

Xiuyuan Ma

dblp:276/2126 · DBLP profile ↗
← Back
2ranked-venue papers
0as first author
1since 2021 · last 2022
—ORCID · none

Domains — the database's venue-derived domains; a paper can count in several

Systems, architecture and hardware · 2 · 1 since 2021

Expertise — from the expertise taxonomy: the topics of the expert's papers under the CCF categories. A weight counts papers with recency: 1 for a paper about the topic, 0.3 when the topic is its context, halved every five years.

Computer architecture, parallel and distributed computing, and storage systems
2 papers
Electronic design automation · 100%
Artificial intelligence
1 paper
Deep learning architectures and training · 100%

Topics — the 5 heaviest of 5, each with the papers that count most for it

TopicWeightPapersLastEvidence papers
Electronic design automation
physical design
1.022022
Deep Learning-Driven Simultaneous Layout Decomposition and Mask Optimization · IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 2022
Deep Learning-Driven Simultaneous Layout Decomposition and Mask Optimization · DAC 2020
Electronic design automation › physical design › lithography
layout decomposition
0.612022
Deep Learning-Driven Simultaneous Layout Decomposition and Mask Optimization · IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 2022
Electronic design automation › physical design
mask optimization
0.612022
Deep Learning-Driven Simultaneous Layout Decomposition and Mask Optimization · IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 2022
Electronic design automation › physical design
optical proximity correction
0.612022
Deep Learning-Driven Simultaneous Layout Decomposition and Mask Optimization · IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 2022
Machine learning › Deep learning architectures and training
convolutional neural network
0.112020
Deep Learning-Driven Simultaneous Layout Decomposition and Mask Optimization · DAC 2020

Methods — techniques the papers use, named apart from their topics

convolutional neural network · 1.4sampling strategy · 0.9autoencoder · 0.6
YearPublicationVenuePosition
2022 Deep Learning-Driven Simultaneous Layout Decomposition and Mask Optimization
abstract
Combining multiple patterning lithography (MPL) and optical proximity correction (OPC) pushes the limit of 193-nm wavelength lithography to go further. Considering that layout decomposition may generate plenty of solutions with diverse printabilities, relying on conventional mask optimization (MO) process to select the best candidate for manufacturing is computationally expensive. Therefore, an accurate and efficient printability estimation is crucial and can significantly accelerate the layout decomposition and MO (LDMO) flow. In this article, we propose a convolutional neural network (CNN)-based prediction and integrate it into our new high-performance LDMO framework. The optimization process can be considerably improved as the decomposition quality has been inferred in the early phase. To facilitate the network training and ensure better estimation accuracy, we develop sampling strategies for both layout and decomposition. Moreover, we enhance the layout sampling approach by adopting autoencoder to distance evaluation that promises superior sampling results. The experimental results demonstrate the effectiveness and the efficiency of the proposed algorithms.
Shuxiang Hu, Yuzhe Ma, Xiuyuan Ma, Bei Yu 0001
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.5
2020 Deep Learning-Driven Simultaneous Layout Decomposition and Mask Optimization
abstract
Combining multiple pattern lithography (MPL) and optical proximity correlation (OPC) pushes the limit of 193nm wavelength lithography to go further. Considering that layout decomposition may generate plenty of solutions with diverse printabilities, relying on conventional mask optimization process to select the best candidates for manufacturing is computationally expensive. Therefore, an accurate and efficient printability estimation is crucial and can significantly accelerate the layout decomposition and mask optimization (LDMO) process. In this paper, we propose a CNN based prediction and integrate it into our new high performance LDMO framework. We also develop both the layout and the decomposition sampling strategies to facilitate the network training. The experimental results demonstrate the effectiveness and the efficiency of the proposed algorithms.
Shuxiang Hu, Yuzhe Ma, Xiuyuan Ma, Bei Yu 0001
DAC5