EDBT 2026 Demo / reviewers in the wild / expert
Xiuyuan Ma
dblp:276/2126
· DBLP profile ↗
2ranked-venue papers
0as first author
1since 2021 · last 2022
—ORCID · none
Domains — the database's venue-derived domains; a paper can count in several
Systems, architecture and hardware · 2 · 1 since 2021
Expertise — from the expertise taxonomy: the topics of the expert's papers under the CCF categories. A weight counts papers with recency: 1 for a paper about the topic, 0.3 when the topic is its context, halved every five years.
| Computer architecture, parallel and distributed computing, and storage systems
2 papers |
Electronic design automation · 100% | |
| Artificial intelligence
1 paper |
Deep learning architectures and training · 100% |
Topics — the 5 heaviest of 5, each with the papers that count most for it
| Topic | Weight | Papers | Last | Evidence papers |
|---|---|---|---|---|
Electronic design automation
physical design |
1.0 | 2 | 2022 | Deep Learning-Driven Simultaneous Layout Decomposition and Mask Optimization · IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 2022 Deep Learning-Driven Simultaneous Layout Decomposition and Mask Optimization · DAC 2020 |
Electronic design automation › physical design › lithography
layout decomposition |
0.6 | 1 | 2022 | Deep Learning-Driven Simultaneous Layout Decomposition and Mask Optimization · IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 2022 |
Electronic design automation › physical design
mask optimization |
0.6 | 1 | 2022 | Deep Learning-Driven Simultaneous Layout Decomposition and Mask Optimization · IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 2022 |
Electronic design automation › physical design
optical proximity correction |
0.6 | 1 | 2022 | Deep Learning-Driven Simultaneous Layout Decomposition and Mask Optimization · IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 2022 |
Machine learning › Deep learning architectures and training
convolutional neural network |
0.1 | 1 | 2020 | Deep Learning-Driven Simultaneous Layout Decomposition and Mask Optimization · DAC 2020 |
Methods — techniques the papers use, named apart from their topics
convolutional neural network · 1.4sampling strategy · 0.9autoencoder · 0.6
| Year | Publication | Venue | Position |
|---|---|---|---|
| 2022 | Deep Learning-Driven Simultaneous Layout Decomposition and Mask OptimizationabstractCombining multiple patterning lithography (MPL) and optical proximity correction (OPC) pushes the limit of 193-nm wavelength lithography to go further. Considering that layout decomposition may generate plenty of solutions with diverse printabilities, relying on conventional mask optimization (MO) process to select the best candidate for manufacturing is computationally expensive. Therefore, an accurate and efficient printability estimation is crucial and can significantly accelerate the layout decomposition and MO (LDMO) flow. In this article, we propose a convolutional neural network (CNN)-based prediction and integrate it into our new high-performance LDMO framework. The optimization process can be considerably improved as the decomposition quality has been inferred in the early phase. To facilitate the network training and ensure better estimation accuracy, we develop sampling strategies for both layout and decomposition. Moreover, we enhance the layout sampling approach by adopting autoencoder to distance evaluation that promises superior sampling results. The experimental results demonstrate the effectiveness and the efficiency of the proposed algorithms. Shuxiang Hu, Yuzhe Ma, Xiuyuan Ma, Bei Yu 0001 |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. | 5 |
| 2020 | Deep Learning-Driven Simultaneous Layout Decomposition and Mask OptimizationabstractCombining multiple pattern lithography (MPL) and optical proximity correlation (OPC) pushes the limit of 193nm wavelength lithography to go further. Considering that layout decomposition may generate plenty of solutions with diverse printabilities, relying on conventional mask optimization process to select the best candidates for manufacturing is computationally expensive. Therefore, an accurate and efficient printability estimation is crucial and can significantly accelerate the layout decomposition and mask optimization (LDMO) process. In this paper, we propose a CNN based prediction and integrate it into our new high performance LDMO framework. We also develop both the layout and the decomposition sampling strategies to facilitate the network training. The experimental results demonstrate the effectiveness and the efficiency of the proposed algorithms. Shuxiang Hu, Yuzhe Ma, Xiuyuan Ma, Bei Yu 0001 |
DAC | 5 |