Demo Data from EDBT 2026 / reviewers in the wild / expert
Changhui You
dblp:279/6893
· DBLP profile ↗
6ranked-venue papers
1as first author
6since 2021 · last 2024
0000-0002-9135-1898ORCID · corroborated
Domains — the database's venue-derived domains; a paper can count in several
Graphics, computer vision, multimedia, augmented reality and games · 3 · 3 since 2021Artificial intelligence and machine learning · 2 · 1 first-author · 2 since 2021Security and privacy · 1 · 1 since 2021
Expertise — from the expertise taxonomy: the topics of the expert's papers under the CCF categories. A weight counts papers with recency: 1 for a paper about the topic, 0.3 when the topic is its context, halved every five years.
| Computer graphics and multimedia
1 paper |
Image and video processing · 100% | |
| Network and information security
1 paper |
Hardware security and side channels · 100% |
Topics — the 4 heaviest of 4, each with the papers that count most for it
| Topic | Weight | Papers | Last | Evidence papers |
|---|---|---|---|---|
Image and video processing › feature extraction
feature descriptor |
0.6 | 1 | 2022 | Circumferential Local Ternary Pattern: New and Efficient Feature Descriptors for Anti-Counterfeiting Pattern Identification · IEEE Trans. Inf. Forensics Secur. 2022 |
Image and video processing
texture analysis |
0.6 | 1 | 2022 | Circumferential Local Ternary Pattern: New and Efficient Feature Descriptors for Anti-Counterfeiting Pattern Identification · IEEE Trans. Inf. Forensics Secur. 2022 |
Image and video processing › texture analysis
texture descriptor |
0.6 | 1 | 2022 | Circumferential Local Ternary Pattern: New and Efficient Feature Descriptors for Anti-Counterfeiting Pattern Identification · IEEE Trans. Inf. Forensics Secur. 2022 |
Hardware security and side channels › intellectual property protection
anti-counterfeiting |
0.2 | 1 | 2022 | Circumferential Local Ternary Pattern: New and Efficient Feature Descriptors for Anti-Counterfeiting Pattern Identification · IEEE Trans. Inf. Forensics Secur. 2022 |
Methods — techniques the papers use, named apart from their topics
local ternary pattern · 1.1local binary pattern · 1.1feature histograms · 0.6feature histogram · 0.6
| Year | Publication | Venue | Position |
|---|---|---|---|
| 2024 | Source camera identification based on an adaptive dual-branch fusion residual network
Changhui You, Jianping Ju |
Multim. Tools Appl. | 2 |
| 2024 | Anti-counterfeiting textured pattern
Changhui You, Jianping Ju |
Vis. Comput. | 4 |
| 2024 | Blind deblurring of QR code using intensity and gradient prior of positioning patterns
Changhui You |
Vis. Comput. | 6 |
| 2023 | Tampering detection and localization base on sample guidance and individual camera device convolutional neural network featuresabstractAbstract This paper proposes an image tampering detection algorithm based on sample guidance and individual camera device's convolutional neural network (CNN) features (SGICD‐CF) to address the challenges in the authenticity and integrity of images. Due to the development of the digital image processing technology, which makes image editing and processing, image tampering and forgery easy and lot simplified, thus solving the problem of image tamper detection, to maintain information security. The principle of SGICD‐CF assumes that pixels of the pristine image come from a single camera device, but on the contrary, if an image to be tested is spliced by multiple images from different cameras, then the pixels from the multiple camera devices will be detected. SGICD‐CF divides the image to be tested into 64 × 64 pixel image patches, extracts the camera‐related features and some camera model‐related information of image patches by source camera identification network (SCI‐Net) which is proposed by us, and obtains the classification confidence degree of the image patch. Furthermore, it determines whether the image patch contains foreign pixels according to the obtained confidence degree and finally determines whether the image was tampered according to the classification results of all the image patches, thus locating the tampered area. However, the experimental results show that SGICD‐CF can detect and locate the tampered area of an image accurately and our methods have a better performance than other existing methods. Our algorithm can achieve an average correct rate of 0.855 on the synthetic data set based on Dresden, which is higher than other existing detection methods. Changhui You, Xiongbin Wu |
Expert Syst. J. Knowl. Eng. | 1 |
| 2022 | Circumferential Local Ternary Pattern: New and Efficient Feature Descriptors for Anti-Counterfeiting Pattern IdentificationabstractAn important aspect of querying whether a product is likely to be forged is to identify its anti-counterfeiting label. However, the use of image processing technology for label-specific texture analysis to quickly and effectively identify the anti-counterfeiting label has been widely studied. Aiming at the defects of the local binary pattern (LBP) and its variants in texture identification, this paper proposes a new texture model for anti-counterfeiting identification, that is, the circular local ternary pattern (CLTP). The highlight of our technology is that it extracts the effective local texture descriptors by using the random features of inkjet printing. This allows for the technology to not only resist the interference of noise and illumination in images of anti-counterfeiting patterns but also to encode and reorganize the fine linear shape structure. Specifically, this paper extracts the CLTP texture feature in the corresponding key areas and forms the final feature histogram vector for comparison through the one-to-one correspondence between the sample image and the inspected image of anti-counterfeiting pattern. Experiments prove that our method not only has high discrimination, stability and effectiveness but also provides a convenient and practical idea for anti-counterfeiting technology. Zhaohui Zheng 0002, Bichao Xu, Jianping Ju, Changhui You, Qiang Lei |
IEEE Trans. Inf. Forensics Secur. | 5 |
| 2021 | A system for identifying an anti-counterfeiting pattern based on the statistical difference in key image regions
Zhaohui Zheng 0002, Jianping Ju, Deng Chen, Changhui You, Mingyu Lin |
Expert Syst. Appl. | 7 |