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Wei-Jin Dai

dblp:28/3489 · DBLP profile ↗
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6ranked-venue papers
2as first author
0since 2021 · last 2003
—ORCID · none

Domains — the database's venue-derived domains; a paper can count in several

Systems, architecture and hardware · 6 · 2 first-author

Expertise — from the expertise taxonomy: the topics of the expert's papers under the CCF categories. A weight counts papers with recency: 1 for a paper about the topic, 0.3 when the topic is its context, halved every five years.

Computer architecture, parallel and distributed computing, and storage systems
3 papers
Electronic design automation · 58% Reconfigurable computing and FPGAs · 42%

Topics — the 8 heaviest of 8, each with the papers that count most for it

TopicWeightPapersLastEvidence papers
Reconfigurable computing and FPGAs › FPGA-based emulation
logic emulation
0.021995
Local ratio cut and set covering partitioning for huge logic emulation systems · IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 1995
Circuit Partitioning for Huge Logic Emulation Systems · DAC 1994
Electronic design automation › hardware verification and test › fault simulation
fault grading
0.011999
Fault emulation: A new methodology for fault grading · IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 1999
Reconfigurable computing and FPGAs
FPGA-based emulation
0.011999
Fault emulation: A new methodology for fault grading · IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 1999
Electronic design automation
hardware verification and test
0.011999
Fault emulation: A new methodology for fault grading · IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 1999
Electronic design automation › physical design
circuit partitioning
0.021995
Circuit Partitioning for Huge Logic Emulation Systems · DAC 1994
Local ratio cut and set covering partitioning for huge logic emulation systems · IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 1995
Reconfigurable computing and FPGAs
FPGA partitioning
0.011995
Local ratio cut and set covering partitioning for huge logic emulation systems · IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 1995
Electronic design automation › logic synthesis › technology mapping
FPGA technology mapping
0.011994
Circuit Partitioning for Huge Logic Emulation Systems · DAC 1994
Electronic design automation
physical design
0.011994
Circuit Partitioning for Huge Logic Emulation Systems · DAC 1994

Methods — techniques the papers use, named apart from their topics

local ratio-cut clustering · 0.0Espresso II · 0.0serial fault emulation · 0.0dual-railed logic · 0.0set-covering partitioning · 0.0set covering · 0.0
YearPublicationVenuePosition
2003 Silicon virtual prototyping: the new cockpit for nanometer chip design
abstract
A design methodology for the implementation of multi-million gate system-on-chip designs is described. The new methodology is based on the creation of a silicon virtual prototype early in the back-end design process. The prototype is generated in a fraction of the time required to complete the traditional back-end flow but still maintains very high correlation with the final design. The physical prototype becomes the 'cockpit' where many design implementation decisions can be optimized by leveraging the short iteration times. Hierarchical design methodologies benefit from the prototyping stage by enabling a more optimal partitioning. The silicon virtual prototype also alters the nature of the hand-off model between front-end and back-end designers. The netlist can now be quickly validated using the prototype: the physical reality is being injected early in the design process resulting in fewer iterations between front-end and back-end.
Wei-Jin Dai, Dennis Jen-Hsin Huang, Chin-Chih Chang, Michel Courtoy
ASP-DAC1
2001 Hierarchical physical design methodology for multi-million gate chips
abstract
In this paper, a design methodology for the implementation of multi-million gate system-on-chip designs is described.
Wei-Jin Dai
ISPD1
1999 Fault emulation: A new methodology for fault grading
abstract
In this paper, we introduce a method that uses the field programmable gate array (FPGA)-based emulation system for fault grading. The real-time simulation capability of a hardware emulator could significantly improve the performance of fault grading, which is one of the most time consuming tasks in the circuit design and test process. We employ a serial fault emulation algorithm enhanced by two speed-up techniques. First, a set of independent faults can be injected and emulated at the same time. Second, multiple dependent faults can be simultaneously injected within a single FPGA-configuration by adding extra circuitry. Because the reconfiguration time of mapping the numerous faulty circuits into the FPGA's is pure overhead and could be the bottleneck of the entire process, using extra circuitry for injecting a large number of faults can reduce the number of FPGA-reconfigurations and, thus, improving the performance significantly. In addition, we address the issue of handling potentially detected faults in this hardware emulation environment by using the dual-railed logic. The performance estimation shows that this approach could be several orders of magnitude faster than the existing software approaches for large sequential designs.
Kwang-Ting Cheng, Shi-Yu Huang, Wei-Jin Dai
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.3
1995 Fault emulation: a new approach to fault grading
abstract
In this paper, we propose a method of using an FPGA-based emulation system for fault grading. The real-time simulation capability of a hardware emulator could significantly improve the run-time of fault grading, which is one of the most resource-intensive tasks in the design process. A serial fault emulation algorithm is employed and enhanced by two speed-up techniques. First, a set of independent faults can be emulated in parallel. Second, simultaneous injection of multiple dependent faults is also possible by adding extra supporting circuitry. Because the reconfiguration time spent on mapping the numerous faulty circuits into the FPGA boards could be the bottleneck of the whole process, using extra logic for injecting a large number of faults per configuration can reduce the number of reconfigurations, and thus, significantly improve the efficiency. Some modeling issues that are unique in the fault emulation environment are also addressed. The performance estimation indicates that this approach could be several orders of magnitude faster than the existing software approaches for large designs.
Kwang-Ting Cheng, Shi-Yu Huang, Wei-Jin Dai
ICCAD3
1995 Local ratio cut and set covering partitioning for huge logic emulation systems
abstract
Given a system represented at gate level, we propose an algorithm mapping the design into the minimum number of FPGA's for logic emulation. We first devise a Local Ratio-cut clustering scheme to reduce the circuit complexity. Then a Set Covering partitioning approach, utilizing the paradigm of Espresso II, is proposed as an alternative to the widely adopted recursive partitioning paradigm. Experimental results have shown that our approach achieved significant improvement with much shorter run times compared to the recursive Fiduccia-Mattheyses approach on large designs. For instance, on a benchmark of 160 K gates and 90 K nets, we reduced the number of FPGA's required and the run time by 41 and 86%, respectively.>
Nan-Chi Chou, Lung-Tien Liu, Chung-Kuan Cheng, Wei-Jin Dai, Rodney Lindelof
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.4
1994 Circuit Partitioning for Huge Logic Emulation Systems
abstract
Abstract|Given a huge system represented at gate level, we propose an algorithm mapping the design into the minimum number of FPGAs for logic emulation. We rst devise a Local Ratio-cut clustering scheme to reduce the circuit complexity. Then a Set Covering partitioning approach, utilizing the paradigm of Espresso II, is proposed to replace the widely adopted recursive partitioning paradigm. Experimental results show that our approach achieves signi cant improvement inamuch shorter run time compared to the recursive Fiduccia-Mattheyses approach on large designs. For example, on a benchmark of 160K gates and 90K nets, we reduced the number of FPGAs required by 29 % and reduced the run time by 78%. 1
Nan-Chi Chou, Lung-Tien Liu, Chung-Kuan Cheng, Wei-Jin Dai, Rodney Lindelof
DAC4