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Moritoshi Ando

dblp:28/6009 · DBLP profile ↗
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2ranked-venue papers
2as first author
0since 2021 · last 1988
—ORCID · none

Domains — the database's venue-derived domains; a paper can count in several

Artificial intelligence and machine learning · 2 · 2 first-authorSystems, architecture and hardware · 1 · 1 first-author

Expertise — from the expertise taxonomy: the topics of the expert's papers under the CCF categories. A weight counts papers with recency: 1 for a paper about the topic, 0.3 when the topic is its context, halved every five years.

Computer architecture, parallel and distributed computing, and storage systems
1 paper
Electronic design automation · 100%

Topics — the 2 heaviest of 3, each with the papers that count most for it

TopicWeightPapersLastEvidence papers
Electronic design automation
hardware verification and test		 0.011985
Automatic opitcal through hole inspection method for printed wiring boards using leakage light detection · ICRA 1985
Electronic design automation › hardware verification and test › board-level testing
printed circuit board inspection		 0.011985
Automatic opitcal through hole inspection method for printed wiring boards using leakage light detection · ICRA 1985

Methods — techniques the papers use, named apart from their topics

leakage light detection · 0.0
YearPublicationVenuePosition
1988 Automatic optical inspection of plated through-holes for ultrahigh density printed wiring boards
Moritoshi Ando, Takefumi Inagaki
 Mach. Vis. Appl.1
1985 Automatic opitcal through hole inspection method for printed wiring boards using leakage light detection
abstract
New automatic through hole inspection techniques for printed wiring boards (PWBs) were developed. The new method called Leakage Light Detection can detect defects such as cracks and breaks in plating of through holes with aspect ratio as large as ten. A prototype system for automatic through hole inspection is constructed, based on these techniques. This system detects defects in a 250 mm × 250 mm area of a PWB in 8 minutes.
Moritoshi Ando, Kikuo Mita, Takefumi Inagaki
 ICRA1