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T. Fukui

dblp:28/6046 · DBLP profile ↗
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2ranked-venue papers
0as first author
0since 2021 · last 2002
—ORCID · none

Domains — the database's venue-derived domains; a paper can count in several

Artificial intelligence and machine learning · 1Systems, architecture and hardware · 1

Expertise — from the expertise taxonomy: the topics of the expert's papers under the CCF categories. A weight counts papers with recency: 1 for a paper about the topic, 0.3 when the topic is its context, halved every five years.

Computer architecture, parallel and distributed computing, and storage systems
1 paper
Electronic design automation · 93% Integrated circuit design · 7%

Topics — the 4 heaviest of 5, each with the papers that count most for it

TopicWeightPapersLastEvidence papers
Electronic design automation › hardware test
fault localization
0.011978
Automatic System Level Test Generation and Fault Location for Large Digital Systems · DAC 1978
Electronic design automation
hardware verification and test
0.011978
Automatic System Level Test Generation and Fault Location for Large Digital Systems · DAC 1978
Electronic design automation › hardware verification and test › test generation › high-level test generation
system-level test generation
0.011978
Automatic System Level Test Generation and Fault Location for Large Digital Systems · DAC 1978
Electronic design automation › hardware verification and test
test generation
0.011978
Automatic System Level Test Generation and Fault Location for Large Digital Systems · DAC 1978
YearPublicationVenuePosition
2002 Sensor selected fusion with sensor selection based gating neural network
abstract
Manufacturing systems have become more and more complex for adapting to various process conditions. Various and numerous sensors are equipped in the system for measuring various states in process. For efficient manufacturing, a sensor fusion method is needed for inferring state which conventional sensors cannot measure. We (2001) have proposed a sensor fusion method with sensor selection based on the reliability of the sensor value and knowledge database for a response to various environmental conditions. In this paper, we propose a sensor selected fusion system with the sensor selection based gating neural network. The gating neural network is stored, which links the neural network for the inference that should be used. Thus, the gating neural network decides the configuration of the neural network from the sensor selection rule and process conditions. For showing the effectiveness, we apply the proposed method to the inference of the surface roughness in the grinding process.
Futoshi Kobayashi, T. Fukui, Fumihito Arai, Toshio Fukuda, Fumio Kojima, Makoto Onoda, Yuzo Hotta
FUZZ-IEEE2
1978 Automatic System Level Test Generation and Fault Location for Large Digital Systems
Akihiko Yamada, Nobuo Wakatsuki, T. Fukui, Shigehiro Funatsu
DAC3