Yu-Jin Xie

dblp:284/8526 · DBLP profile ↗
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2ranked-venue papers
2as first author
2since 2021 · last 2023
—ORCID · none

Domains — the database's venue-derived domains; a paper can count in several

Systems, architecture and hardware · 2 · 2 first-author · 2 since 2021

Expertise — from the expertise taxonomy: the topics of the expert's papers under the CCF categories. A weight counts papers with recency: 1 for a paper about the topic, 0.3 when the topic is its context, halved every five years.

Computer architecture, parallel and distributed computing, and storage systems
1 paper
Electronic design automation · 100%

Topics — the 2 heaviest of 2, each with the papers that count most for it

TopicWeightPapersLastEvidence papers
Electronic design automation › physical design › placement
detailed placement
0.712023
Drain-to-Drain Abutment-Aware Detailed Placement Refinement for Power Staple Insertion Optimization · IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 2023
Electronic design automation
physical design
0.712023
Drain-to-Drain Abutment-Aware Detailed Placement Refinement for Power Staple Insertion Optimization · IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 2023

Methods — techniques the papers use, named apart from their topics

cell shifting · 0.7cell flipping · 0.7
YearPublicationVenuePosition
2023 Drain-to-Drain Abutment-Aware Detailed Placement Refinement for Power Staple Insertion Optimization
abstract
Power staple insertion is an effective means to mitigate IR drop in the advanced technology process. Previous works have shown that detailed placement refinement can greatly enhance the power staple insertion rate. However, with FinFET, it is necessary to consider the drain-to-drain abutment (DDA) constraints. We note that extra source node insertion for resolving DDA violations can interfere with power staple insertion. To handle DDA constraints and optimize power staple insertion at the same time, we formulate and solve a new DDA-aware placement refinement problem in this work. Given an initial nonoverlapping placement optimized for other conventional objectives, we compute a refined placement with cell shifting subject to DDA constraints such that the number of staple insertion slots can be maximized. An effective approach is proposed that supports a nonrestricted cell displacement range during placement refinement. It provides the flexibility to adjust the displacement bound of each cell dynamically in order to resolve all DDA violations. As a result, our algorithm guarantees that a placement solution with no DDA violation can always be computed without using a large displacement range for each cell which would require much longer runtime and larger average cell displacement. In addition to cell shifting, we incorporate concurrent cell flipping to reduce the required cell displacement to satisfy the DDA constraints and to facilitate power staple insertion. The experimental results showed the effectiveness of the proposed approach.
Yu-Jin Xie, Wai-Kei Mak
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.1
2021 Manufacturing-Aware Power Staple Insertion Optimization by Enhanced Multi-Row Detailed Placement Refinement
abstract
Power staple insertion is a new methodology for IR drop mitigation in advanced technology nodes. Detailed placement refinement which perturbs an initial placement slightly is an effective strategy to increase the success rate of power staple insertion. We are the first to address the manufacturing-aware power staple insertion optimization problem by triple-row placement refinement. We present a correct-by-construction approach based on dynamic programming to maximize the total number of legal power staples inserted subject to the design rule for 1D patterning. Instead of using a multidimensional array which incurs huge space overhead, we show how to construct a directed acyclic graph (DAG) on the fly efficiently to implement the dynamic program for multi-row optimization in order to conserve memory usage. The memory usage can thus be reduced by a few orders of magnitude in practice.
Yu-Jin Xie, Wai-Kei Mak
ASP-DAC1