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Zhibin Yao

dblp:29/11073 · DBLP profile ↗
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5ranked-venue papers
0as first author
1since 2021 · last 2026
—ORCID · none

Domains — the database's venue-derived domains; a paper can count in several

Applied, interdisciplinary, general and emerging computing · 5 · 1 since 2021

Expertise — from the expertise taxonomy: the topics of the expert's papers under the CCF categories. A weight counts papers with recency: 1 for a paper about the topic, 0.3 when the topic is its context, halved every five years.

Computer architecture, parallel and distributed computing, and storage systems
4 papers
Integrated circuit design · 55% Hardware reliability and fault tolerance · 39% Reconfigurable computing and FPGAs · 5%

Topics — the 7 heaviest of 8, each with the papers that count most for it

TopicWeightPapersLastEvidence papers
Integrated circuit design › semiconductor devices › image sensor
CMOS image sensor
0.732019
Modeling dark signal of CMOS image sensors irradiated by reactor neutron using Monte Carlo method · Sci. China Inf. Sci. 2018
Research on proton radiation effects on CMOS image sensors with experimental and particle transport simulation methods · Sci. China Inf. Sci. 2017
Comparison of the dark signal degradation induced by Gamma ray, proton, and neutron radiation in pinned photodiode CMOS image sensors · Sci. China Inf. Sci. 2019
Integrated circuit design › semiconductor devices › image sensor
image sensor design
0.732019
Modeling dark signal of CMOS image sensors irradiated by reactor neutron using Monte Carlo method · Sci. China Inf. Sci. 2018
Research on proton radiation effects on CMOS image sensors with experimental and particle transport simulation methods · Sci. China Inf. Sci. 2017
Comparison of the dark signal degradation induced by Gamma ray, proton, and neutron radiation in pinned photodiode CMOS image sensors · Sci. China Inf. Sci. 2019
Hardware reliability and fault tolerance
radiation effects
0.412019
Comparison of the dark signal degradation induced by Gamma ray, proton, and neutron radiation in pinned photodiode CMOS image sensors · Sci. China Inf. Sci. 2019
Hardware reliability and fault tolerance › radiation effects
single event effects
0.412019
Comparison of the dark signal degradation induced by Gamma ray, proton, and neutron radiation in pinned photodiode CMOS image sensors · Sci. China Inf. Sci. 2019
Hardware reliability and fault tolerance › soft errors
single-event upset
0.112012
Bitstream decoding and SEU-induced failure analysis in SRAM-based FPGAs · Sci. China Inf. Sci. 2012
Hardware reliability and fault tolerance
soft errors
0.112012
Bitstream decoding and SEU-induced failure analysis in SRAM-based FPGAs · Sci. China Inf. Sci. 2012
Reconfigurable computing and FPGAs › FPGA architecture
SRAM-based FPGA
0.112012
Bitstream decoding and SEU-induced failure analysis in SRAM-based FPGAs · Sci. China Inf. Sci. 2012

Methods — techniques the papers use, named apart from their topics

proton irradiation · 0.4neutron irradiation · 0.4gamma ray irradiation · 0.4monte carlo method · 0.3particle transport simulation · 0.3
YearPublicationVenuePosition
2026 MSNet: A Cascade Multitask Learning Framework With Hierarchical Dependence for Microseismic Signal Processing
abstract
In microseismic monitoring systems (MMS), efficiently and accurately recognizing fracture waveforms and picking their arrival times of P-wave and S-wave are two crucial signal processing tasks for timely rockburst warnings. Previous studies have overlooked the potential relationship between these two tasks and have processed them independently, leading to redundant computations and performance bottlenecks. An intuitive solution is to integrate the two tasks into a multitask learning (MTL) framework. However, due to their competing optimization objectives, where recognition primarily focuses on global shape features and picking relies on local detail features, conventional parallel MTL structures often suffer from conflicting gradients. This conflict leads to a severe seesaw phenomenon that results in significant performance degeneration in picking task. To address this issue, we proposeMSNet, a cascade MTL framework forMicroseismicSignal processing. In this framework, a self-supervised fracture-perception module and a dual-scale fusion module are proposed to model the hierarchical dependence between recognition and picking tasks. Specifically, these modules enable a forward cascaded feature refinement from recognition to picking, as well as an information supplement from picking to recognition. Thus, MSNet transforms the two tasks from parallel competing learning into a mutually cooperative process that effectively mitigates the seesaw phenomenon. Finally, MSNet is validated on two datasets collected from different tunnel boring machine excavation projects. The results demonstrate its superiority over state-of-the-art methods in terms of accuracy that achieves an approximate 2% improvement under laboratory conditions. Furthermore, the practical applicability of MSNet is further validated through its deployment in a real-world tunnelling project, where it successfully detects rockburst events and provides real-time warnings.
Xianrui Ji, Xiating Feng, Xin Bi 0001, Zhibin Yao, Fuqi Kang, Jun Fu 0001
IEEE Trans. Ind. Informatics4
2019 Comparison of the dark signal degradation induced by Gamma ray, proton, and neutron radiation in pinned photodiode CMOS image sensors
Zujun Wang, Yuanyuan Xue, Wei Chen 0153, Hao Ning, Baoping He, Zhibin Yao, Minbo Liu, Jiangkun Sheng, Wuying Ma, Guantao Dong
Sci. China Inf. Sci.7
2018 Modeling dark signal of CMOS image sensors irradiated by reactor neutron using Monte Carlo method
Yuanyuan Xue, Zujun Wang, Wei Chen 0153, Baoping He, Zhibin Yao, Minbo Liu, Jiangkun Sheng, Wuying Ma, Guantao Dong, Junshan Jin
Sci. China Inf. Sci.5
2017 Research on proton radiation effects on CMOS image sensors with experimental and particle transport simulation methods
Yuanyuan Xue, Zujun Wang, Minbo Liu, Baoping He, Zhibin Yao, Jiangkun Sheng, Wuying Ma, Guantao Dong, Junshan Jin
Sci. China Inf. Sci.5
2012 Bitstream decoding and SEU-induced failure analysis in SRAM-based FPGAs
Zhongming Wang, Zhibin Yao, Min Lv
Sci. China Inf. Sci.2