EDBT 2026 Demo / reviewers in the wild / expert
Mahmoud S. Elsaholy
dblp:29/3359
· DBLP profile ↗
1ranked-venue papers
1as first author
0since 2021 · last 1998
—ORCID · none
Domains — the database's venue-derived domains; a paper can count in several
Systems, architecture and hardware · 1 · 1 first-author
Expertise — from the expertise taxonomy: the topics of the expert's papers under the CCF categories. A weight counts papers with recency: 1 for a paper about the topic, 0.3 when the topic is its context, halved every five years.
| Computer architecture, parallel and distributed computing, and storage systems
1 paper |
Electronic design automation · 100% |
Topics — the 4 heaviest of 4, each with the papers that count most for it
| Topic | Weight | Papers | Last | Evidence papers |
|---|---|---|---|---|
Electronic design automation › hardware verification and test › test response compaction
aliasing probability |
0.0 | 1 | 1998 | A Unified Analytical Expression for Aliasing Error Probability Using Single-Input · IEEE Trans. Computers 1998 |
Electronic design automation › hardware verification and test › design for testability
built-in self-test |
0.0 | 1 | 1998 | A Unified Analytical Expression for Aliasing Error Probability Using Single-Input · IEEE Trans. Computers 1998 |
Electronic design automation
hardware verification and test |
0.0 | 1 | 1998 | A Unified Analytical Expression for Aliasing Error Probability Using Single-Input · IEEE Trans. Computers 1998 |
Electronic design automation › hardware verification and test › test response compaction
signature analysis |
0.0 | 1 | 1998 | A Unified Analytical Expression for Aliasing Error Probability Using Single-Input · IEEE Trans. Computers 1998 |
Methods — techniques the papers use, named apart from their topics
markov chain analysis · 0.0linear feedback shift register analysis · 0.0
| Year | Publication | Venue | Position |
|---|---|---|---|
| 1998 | A Unified Analytical Expression for Aliasing Error Probability Using Single-InputabstractIn this paper, an exact unified analytical expression for the transient (and the steady state) behavior of the Aliasing Error Probability (AEP) of signature analysis testing using single-input external- and internal-XOR LFSR is deduced. The expression, contrary to what is known in the literature, uses the leftmost bit of the LFSR. Mahmoud S. Elsaholy, Samir I. Shaheen, Reda H. Seireg |
IEEE Trans. Computers | 1 |