With continued process scaling, the rate of hardware failures in commodity systems is increasing. Because these commodity systems are highly sensitive to cost, traditional solutions that employ heavy redundancy to handle such failures are no longer acceptable owing to their high associated costs. Detecting such faults by identifying anomalous software execution and recovering through checkpoint-and-replay is emerging as a viable low-cost alternative for future commodity systems. An important but commonly ignored aspect of such solutions is ensuring that external outputs to the system are fault-free. The outputs must be delayed until the detectors guarantee this, influencing fault-free performance. The overheads for resiliency must thus be evaluated while taking these delays into consideration; prior work has largely ignored this relationship. This article concerns recovery for I/O intensive applications from in-core faults. We present a strategy to buffer external outputs using dedicated hardware and show that checkpoint intervals previously considered as acceptable incur exorbitant overheads when hardware buffering is considered. We then present two techniques to reduce the checkpoint interval and demonstrate a practical solution that provides high resiliency while incurring low overheads.

Extreme CMOS scaling is expected to significantly impact the reliability of future microprocessors, prompting recent research effort on low-cost hardware-software cross-layer reliability solutions. To evaluate, statistical fault injection (SFI) is often used to estimate the error coverage of the underlying method. Unfortunately, because a significant number of errors injected by SFI are often derated, the evaluation becomes less rigorous and less efficient. This paper makes the observation that many derated errors can be gracefully avoided to allow the fault injection campaign to focus on likely non-derated faults that stress the method-under-test. We propose a biased injection framework called CriticalFault that employs vulnerability analysis to map out relevant faults for stress testing. With CriticalFault, our results show that the injection space is reduced by 29% and 59% of the biased injections cause either software aborts or silent data corruptions, both are improvements from SFI. Moreover, we characterize different propagation behaviors of these non-derated faults and discuss the implications of designing future cross-layer solutions. Overall, not only CriticalFault is highly effective in identifying relevant test cases for current systems, but reliability researchers and engineers can also conduct more in-depth and meaningful analysis in deveoping future reliability solutions using CriticalFault.

As future microprocessors will be prone to various types of errors, researchers have looked into cross-layer hardware-software reliability solutions to reduce overheads. These mechanisms are shown to be effective when evaluated with statistical fault injection (SFI). However, under SFI, a large number of injected faults can be derated, making the evaluation less rigorous. To handle this problem, we propose a biased fault injection framework called Ciritical Fault that leverages vulnerability analysis to identify faults that are more likely to stress test the underlying reliability solution. Our experimental results show that the injection space is reduced by 30% and a large portion of injected faults cause software aborts and silent data corruptions. Overall, Critical Fault allows us to amplify soft error effects on reliability mechanism-under-test, which can help improve current techniques or inspire other new fault-tolerant mechanisms.

Decreasing hardware reliability is expected to impede the exploitation of increasing integration projected by Moore's Law. There is much ongoing research on efficient fault tolerance mechanisms across all levels of the system stack, from the device level to the system level. High-level fault tolerance solutions, such as at the microarchitecture and system levels, are commonly evaluated using statistical fault injections with microarchitecture-level fault models. Since hardware faults actually manifest at a much lower level, it is unclear if such high level fault models are acceptably accurate. On the other hand, lower level models, such as at the gate level, may be more accurate, but their increased simulation times make it hard to track the system-level propagation of faults. Thus, an evaluation of high-level reliability solutions entails the classical tradeoff between speed and accuracy. This paper seeks to quantify and alleviate this tradeoff. We make the following contributions: (1) We introduce SWAT-Sim, a novel fault injection infrastructure that uses hierarchical simulation to study the system-level manifestations of permanent (and transient) gate-level faults. For our experiments, SWAT-Sim incurs a small average performance overhead of under 3x, for the components we simulate, when compared to pure microarchitectural simulations. (2) We study system-level manifestations of faults injected under different microarchitecture-level and gate-level fault models and identify the reasons for the inability of microarchitecture-level faults to model gate-level faults in general. (3) Based on our analysis, we derive two probabilistic microarchitecture-level fault models to mimic gate-level stuck-at and delay faults. Our results show that these models are, in general, inaccurate as they do not capture the complex manifestation of gate-level faults. The inaccuracies in existing models and the lack of more accurate microarchitecture-level models motivate using infrastructures similar to SWAT-Sim to faithfully model the microarchitecture-level effects of gate-level faults.

Continued technology scaling is resulting in systems with billions of devices. Unfortunately, these devices are prone to failures from various sources, resulting in even commodity systems being affected by the growing reliability threat. Thus, traditional solutions involving high redundancy or piecemeal solutions targeting specific failure modes will no longer be viable owing to their high overheads. Recent reliability solutions have explored using low-cost monitors that watch for anomalous software behavior as a symptom of hardware faults. We previously proposed the SWAT system that uses such low-cost detectors to detect hardware faults, and a higher cost mechanism for diagnosis. However, all of the prior work in this context, including SWAT, assumes single-threaded applications and has not been demonstrated for multithreaded applications running on multicore systems.

With continued CMOS scaling, future shipped hardware will be increasingly vulnerable to in-the-field faults. To be broadly deployable, the hardware reliability solution must incur low overheads, precluding use of expensive redundancy. We explore a cooperative hardware-software solution that watches for anomalous software behavior to indicate the presence of hardware faults. Fundamental to such a solution is a characterization of how hardware faults indifferent microarchitectural structures of a modern processor propagate through the application and OS.

As devices continue to scale, future shipped hardware will likely fail due to in-the-field hardware faults. As traditional redundancy-based hardware reliability solutions that tackle these faults will be too expensive to be broadly deployable, recent research has focused on low-overhead reliability solutions. One approach is to employ low-overhead (“always-on”) detection techniques that catch high-level symptoms and pay a higher overhead for (rarely invoked) diagnosis. This paper presents trace-based fault diagnosis, a diagnosis strategy that identifies permanent faults in microarchitectural units by analyzing the faulty core’s instruction trace. Once a fault is detected, the faulty core is rolled back and re-executes from a previous checkpoint, generating a faulty instruction trace and recording the microarchitecture-level resource usage. A diagnosis process on another fault-free core then generates a fault-free trace which it compares with the faulty trace to identify the faulty unit. Our result shows that this approach successfully diagnoses 98% of the faults studied and is a highly robust and flexible way for diagnosing permanent faults.

In the near future, hardware is expected to become increasingly vulnerable to faults due to continuously decreasing feature size. Software-level symptoms have previously been used to detect permanent hardware faults. However, they can not detect a small fraction of faults, which may lead to Silent Data Corruptions(SDCs). In this paper, we present a system that uses invariants to improve the coverage and latency of existing detection techniques for permanent faults. The basic idea is to use training inputs to create likely invariants based on value ranges of selected program variables and then use them to identify faults at runtime. Likely invariants, however, can have false positives which makes them challenging to use for permanent faults. We use our on-line diagnosis framework for detecting false positives at runtime and limit the number of false positives to keep the associated overhead minimal. Experimental results using microarchitecture level fault injections in full-system simulation show 28.6% reduction in the number of undetected faults and 74.2% reduction in the number of SDCs over existing techniques, with reasonable overhead for checking code.

The real-time execution of contemporary complex media applications requires energy-efficient processing capabilities beyond those of current superscalar processors. We observe that the complexity of contemporary media applications requires support for multiple forms of parallelism, including ILP, TLP, and various forms of DLP, such as subword SIMD, short vectors, and streams. Based on our observations, we propose an architecture, called ALP, that efficiently integrates all of these forms of parallelism with evolutionary changes to the programming model and hardware. The novel part of ALP is a DLP technique called SIMD vectors and streams (SVectors/SStreams) , which is integrated within a conventional superscalar-based CMP/SMT architecture with subword SIMD. This technique lies between subword SIMD and vectors, providing significant benefits over the former at a lower cost than the latter. Our evaluations show that each form of parallelism supported by ALP is important. Specifically, SVectors/SStreams are effective, compared to a system with the other enhancements in ALP. They give speedups of 1.1 to 3.4X and energy-delay product improvements of 1.1 to 5.1X for applications with DLP.