The increasing IC manufacturing cost encourages a business model where design houses outsource IC fabrication to remote foundries. Despite cost savings, this model exposes design houses to IC piracy as remote foundries can manufacture in excess to sell on the black market. Recent efforts in digital hardware security aim to thwart piracy by using XOR-based chip locking, cryptography, and active metering. To counter direct attacks and lower the exposure of unlocked circuits to the foundry, we introduce a multiplexor-based locking strategy that preserves test response allowing IC testing by an untrusted party before activation. We demonstrate a simple yet effective attack against a locked circuit that does not preserve test response, and validate the effectiveness of our locking strategy on IWLS 2005 benchmarks.

The increasing IC manufacturing cost encourages a business model where design houses outsource IC fabrication to remote foundries. Despite cost savings, this model exposes design houses to IC piracy as remote foundries can manufacture in excess to sell on the black market. Recent efforts in digital hardware security aim to thwart piracy by using XOR-based chip locking, cryptography, and active metering. To counter direct attacks and lower the exposure of unlocked circuits to the foundry, we introduce a multiplexor-based locking strategy that preserves test response allowing IC testing by an untrusted party before activation. We demonstrate a simple yet effective attack against a locked circuit that does not preserve test response, and validate the effectiveness of our locking strategy on IWLS 2005 benchmarks.

We explore the use of signatures, i.e., partial truth tables generated via bit-parallel functional simulation, during soft error analysis and logic synthesis. We first present a signature-based CAD framework that incorporates tools for the logic-level Analysis of Soft Error Rate (x) and for Signature-based Design for Reliability (SiDeR). We observe that the soft error rate (SER) of a logic circuit is closely related to various testability parameters, such as signal observability and probability. We show that these parameters can be computed very efficiently (in linear time) by means of signatures. Consequently, AnSER evaluates logic masking two to three orders of magnitude faster than other SER evaluators while maintaining accuracy. AnSER can also compute SER efficiently in sequential circuits by approximating steady-state probabilities and sequential signal observabilities. In the second part of this paper, we incorporate AnSER into logic synthesis design flows aimed at reliable circuit design. SiDeR identifies and exploits redundancy already present in a circuit via signature comparison to decrease SER. We show that SiDeR reduces SER by 40% with only 13% area overhead. We also describe a second signature-based synthesis strategy that employs local rewriting to simultaneously improve area and decrease SER. This technique yields 13% reduction in SER with a 2% area decrease. We show that combining the two synthesis approaches can result in further area-reliability improvements.

Despite the growing research effort in formal verification, constraint-based random simulation remains an integral part of design validation, especially for large design components where formal techniques do not scale. However, stimulating important aspects of a design to uncover bugs often requires the construction of complex constraints to guide stimulus generation. We propose Toggle, a stimulus generation engine, which features (1) an entropy-based coverage analysis to efficiently find portions of the design inadequately sensitized by simulation and (2) a novel strategy to automatically stimulate these portions through a specialized SAT algorithm that uses small randomized XOR constraints. As our experimental results demonstrate, Toggle requires minimal input from the verification engineer, and significantly improves the coverage qualities of the generated stimuli when compared to plain random simulation.

Abstract — The relatively poor scaling of interconnect in modern digital circuits necessitates a number of design optimizations, which must typically be iterated several times to meet the specified performance objectives. Such iterations are often due to the difficulty of early delay estimation, especially before placement. Therefore, effective logic restructuring to reduce interconnect delay has been a major challenge in physical synthesis, a phase during which more accurate delay estimates can be finally gathered. In this work, we develop a new approach that enhances modern high-performance logic synthesis techniques with flexibility and accuracy in the physical domain. This approach is based on (1) a novel criterion based on path monotonicity, that identifies those interconnects amenable to optimization through logic restructuring and (2) a synthesis algorithm relying on logic simulation and placement information to identify placed subcircuits that hold promise for interconnect reduction. Experiments indicate that our techniques find optimization opportunities and improve interconnect delay by 11.7 % on average at less than 2% wirelength and area overhead. I.

The relatively poor scaling of interconnect in modern digital circuits necessitates a number of design optimizations, which must typically be iterated several times to meet the specified performance objectives. Such iterations are often due to the difficulty of early delay estimation, particularly before placement. Therefore, effective logic restructuring to reduce interconnect delay has been a major challenge in physical synthesis, a phase during which more accurate delay estimates can be finally gathered. In this paper, we develop a new approach that enhances modern high-performance logic synthesis techniques with flexibility and accuracy in the physical domain. This approach is based on the following: 1) a novel criterion based on path monotonicity, which identifies those interconnects that are amenable to optimization through logic restructuring, and 2) a synthesis algorithm relying on logic simulation and placement information to identify placed subcircuits that hold promise for interconnect reduction. Experiments indicate that our techniques find optimization opportunities and improve interconnect delay by 11.7% on average at less than 2% wirelength and area overhead.

SAT sweeping is the process of merging two or more functionally equivalent nodes in a circuit by selecting one of them to represent all the other equivalent nodes. This provides significant advantages in synthesis by reducing circuit size and provides additional flexibility in technology mapping, which could be crucial in post-synthesis optimizations. Furthermore, it is also critical in verification because it can reduce the complexity of the netlist to be analyzed in equivalence checking. Most algorithms available so far for this goal do not exploit observability don't cares (ODCs) for node merging since nodes equivalent up to ODCs do not form an equivalence relation. Although a few recently proposed solutions can exploit ODCs by overcoming this limitation, they constrain their analysis to just a few levels of surrounding logic to avoid prohibitive runtime. We develop an ODC-based node merging algorithm that performs efficient global ODC analysis (considering the entire netlist) through simulation and SAT. Our contributions which enable global ODC-based optimizations are: (1) a fast ODC-aware simulator and (2) an incremental verification strategy that limits computational complexity. In addition, our technique operates on arbitrarily mapped netlists, allowing for powerful post-synthesis optimizations. We show that global ODC analysis discovers on average 25% more (and up to 60%) node-merging opportunities than current state-of-the-art solutions based on local ODC analysis.

While circuit density and power efficiency increase with each major advance in IC technology, reliability with respect to soft errors tends to decrease. Current solutions to this problem such as TMR require high area and power overhead. In this work, soft-error reliability is improved with minimal area overhead by careful, localized circuit restructuring. The key idea is to increase logic masking of errors by taking advantage of conditions already present in the circuit, such as observability don't-cares. We describe two circuit modification techniques to improve reliability: don't-care-based resynthesis and local rewriting. A key feature of these techniques is fast, on-the-fly estimation of soft error rate (SER) using our reliability evaluator AnSER. This tool is compared against prior SER evaluators and found to run orders of magnitude faster. We show empirically that our reliability-driven synthesis methods can reduce SER by 29-40% with only 5-13% area overhead.

As silicon technologies move into the nanometer regime, transistor reliability is expected to wane as devices become subject to extreme process variation, particle-induced transient errors, and transistor wear-out. Unless these challenges are addressed, computer vendors can expect low yields and short mean-times-to-failure. In this article, we examine the challenges of designing complex computing systems in the presence of transient and permanent faults. We select one small aspect of a typical chip multiprocessor (CMP) system to study in detail, a single CMP router switch. Our goal is to design a BulletProof CMP switch architecture capable of tolerating significant levels of various types of defects. We first assess the vulnerability of the CMP switch to transient faults. To better understand the impact of these faults, we evaluate our CMP switch designs using circuit-level timing on detailed physical layouts. Our infrastructure represents a new level of fidelity in architectural-level fault analysis, as we can accurately track faults as they occur, noting whether they manifest or not, because of masking in the circuits, logic, or architecture. Our experimental results are quite illuminating. We find that transient faults, because of their fleeting nature, are of little concern for our CMP switch, even within large switch fabrics with fast clocks. Next, we develop a unified model of permanent faults, based on the time-tested bathtub curve. Using this convenient abstraction, we analyze the reliability versus area tradeoff across a wide spectrum of CMP switch designs, ranging from unprotected designs to fully protected designs with on-line repair and recovery capabilities. Protection is considered at multiple levels from the entire system down through arbitrary partitions of the design. We find that designs are attainable that can tolerate a larger number of defects with less overhead than naïve triple-modular redundancy, using domain-specific techniques, such as end-to-end error detection, resource sparing, automatic circuit decomposition, and iterative diagnosis and reconfiguration.

As silicon technologies move into the nanometer regime, transistor reliability is expected to wane as devices become subject to extreme process variation, particle-induced transient errors, and transistor wear-out. Unless these challenges are addressed, computer vendors can expect low yields and short mean-times-to-failure. In this paper, we examine the challenges of designing complex computing systems in the presence of transient and permanent faults. We select one small aspect of a typical chip multiprocessor (CMP) system to study in detail, a single CMP router switch. To start, we develop a unified model of faults, based on the time-tested bathtub curve. Using this convenient abstraction, we analyze the reliability versus area tradeoff across a wide spectrum of CMP switch designs, ranging from unprotected designs to fully protected designs with online repair and recovery capabilities. Protection is considered at multiple levels from the entire system down through arbitrary partitions of the design. To better understand the impact of these faults, we evaluate our CMP switch designs using circuit-level timing on detailed physical layouts. Our experimental results are quite illuminating. We find that designs are attainable that can tolerate a larger number of defects with less overhead than naive triple-modular redundancy, using domain-specific techniques such as end-to-end error detection, resource sparing, automatic circuit decomposition, and iterative diagnosis and reconfiguration.

A disjoint support decomposition (DSD) is a representation of a Boolean function F obtained by composing two or more simpler component functions such that the component functions have no common inputs. The decomposition of a function is desirable for several reasons. First, it's a method to obtain a multiple-level implementation of a function. It leads to a partition in simpler blocks that easily results in smaller areas and fewer interconnects. Moreover, it exposes a parallelism in the computation of the function that can be exploited by hardware as well as during simulation.In this paper we present a novel algorithm, STACCATO, that generates a DSD decomposition starting from the BDD of a function. STACCATO is novel because 1) it provides a complete description of each decomposition, that is, it computes the "kernel" function K relating the elements of each decomposition, and 2) it has better performance than previously known algorithms. Experimental results run on both IWLS and industrial test-benches show that STACCATO's performance is in most cases three times as fast or more than previously known solutions.