Demonstration venue · read-only. Every page can be browsed; the buttons that would change it are switched off. Create an account to run TaxoReview on your own data. A simulation from public publication records: the people listed were not invited and did not agree to review.
? Tutorial for this page

David L. Foster

dblp:29/7863 · DBLP profile ↗
← Back
1ranked-venue papers
1as first author
0since 2021 · last 2010
—ORCID · none

Domains — the database's venue-derived domains; a paper can count in several

Systems, architecture and hardware · 1 · 1 first-author

Expertise — from the expertise taxonomy: the topics of the expert's papers under the CCF categories. A weight counts papers with recency: 1 for a paper about the topic, 0.3 when the topic is its context, halved every five years.

Computer architecture, parallel and distributed computing, and storage systems
1 paper
Hardware reliability and fault tolerance · 50% Reconfigurable computing and FPGAs · 50%

Topics — the 1 heaviest of 2, each with the papers that count most for it

TopicWeightPapersLastEvidence papers
Reconfigurable computing and FPGAs › FPGA reliability
FPGA fault tolerance
0.112010
Maximizing area-constrained partial fault tolerance in reconfigurable logic · FPGA 2010

Methods — techniques the papers use, named apart from their topics

fault injection · 0.1fault coverage analysis · 0.1
YearPublicationVenuePosition
2010 Maximizing area-constrained partial fault tolerance in reconfigurable logic
abstract
As field programmable gate arrays find increasing use in aerospace and terrestrial applications, a number of methods of fault tolerance have been developed to ensure reliable operation. Most current techniques output the required circuit area based on the desired level of fault tolerance with some techniques increasing the area by over 200%. In deployed systems, however, the FPGA is fixed and the area available for adding fault tolerance is limited. As a consequence, protecting an updated, larger circuit using the same fault tolerance scheme may result in a design that no longer fits in the deployed FPGA. This situation dictates the need for techniques that can trade fault tolerance for lower area penalties. Area constrained approaches accept available hardware resources as an input and outputs a partially fault tolerant circuit. The open question with these approaches is selecting the circuit subset to protect which will maximize the fault coverage. This paper presents several methodologies for selecting subsets and analyzes their performances on several circuits based on fault coverage provided and additional delay.
David L. Foster, Darrin M. Hanna
FPGA1