Demo Data from EDBT 2026 / reviewers in the wild / expert
K. Mandal
dblp:30/1131
· DBLP profile ↗
1ranked-venue papers
0as first author
0since 2021 · last 1976
—ORCID · none
Domains — the database's venue-derived domains; a paper can count in several
Systems, architecture and hardware · 1
Expertise — from the expertise taxonomy: the topics of the expert's papers under the CCF categories. A weight counts papers with recency: 1 for a paper about the topic, 0.3 when the topic is its context, halved every five years.
| Computer architecture, parallel and distributed computing, and storage systems
1 paper |
Electronic design automation · 100% |
Topics — the 4 heaviest of 4, each with the papers that count most for it
| Topic | Weight | Papers | Last | Evidence papers |
|---|---|---|---|---|
Electronic design automation › hardware verification and test › test generation
boolean difference |
0.0 | 1 | 1976 | Comments on "Derivation of Minimal Complete Sets of Test-Input Sequences Using Boolean Differences" · IEEE Trans. Computers 1976 |
Electronic design automation
hardware verification and test |
0.0 | 1 | 1976 | Comments on "Derivation of Minimal Complete Sets of Test-Input Sequences Using Boolean Differences" · IEEE Trans. Computers 1976 |
Electronic design automation › hardware verification and test › test generation
test sequence generation |
0.0 | 1 | 1976 | Comments on "Derivation of Minimal Complete Sets of Test-Input Sequences Using Boolean Differences" · IEEE Trans. Computers 1976 |
Electronic design automation › hardware verification and test › fault detection
stuck-at fault detection |
0.0 | 1 | 1976 | Comments on "Derivation of Minimal Complete Sets of Test-Input Sequences Using Boolean Differences" · IEEE Trans. Computers 1976 |
| Year | Publication | Venue | Position |
|---|---|---|---|
| 1976 | Comments on "Derivation of Minimal Complete Sets of Test-Input Sequences Using Boolean Differences"abstractThis correspondence comments on certain aspects of a recent paper1 by Marinos relating to derivation of minimal complete sets of test-input sequences to detect stuck-at faults in combinational switching circuits utilizing the concept of Boolean difference. The primary motivation behind this move is to mention some minor inconsistencies, inaccuracies, and deficiencies involving certain key concepts of the paper, and also to generalize some useful results of the author, adding thereby to the utility and worth of the contribution. C. R. Datta, Pradip K. Srimani, K. Mandal |
IEEE Trans. Computers | 4 |