Demonstration venue · read-only. Every page can be browsed; the buttons that would change it are switched off. Create an account to run TaxoReview on your own data. A simulation from public publication records: the people listed were not invited and did not agree to review.
? Tutorial for this page

Deyuan Xiao

dblp:31/2362 · DBLP profile ↗
← Back
2ranked-venue papers
1as first author
0since 2021 · last 2009
0009-0006-7312-6247ORCID · reported

Domains — the database's venue-derived domains; a paper can count in several

Applied, interdisciplinary, general and emerging computing · 2 · 1 first-author

Expertise — from the expertise taxonomy: the topics of the expert's papers under the CCF categories. A weight counts papers with recency: 1 for a paper about the topic, 0.3 when the topic is its context, halved every five years.

Computer architecture, parallel and distributed computing, and storage systems
2 papers
Integrated circuit design · 100%

Topics — the 6 heaviest of 6, each with the papers that count most for it

TopicWeightPapersLastEvidence papers
Integrated circuit design › semiconductor device fabrication
CMOS technology
0.112009
Challenges of 22 nm and beyond CMOS technology · Sci. China Ser. F Inf. Sci. 2009
Integrated circuit design
technology scaling
0.112009
Challenges of 22 nm and beyond CMOS technology · Sci. China Ser. F Inf. Sci. 2009
Integrated circuit design › semiconductor devices › multi-gate devices
dual-gate transistor
0.112008
Planar split dual gate MOSFET · Sci. China Ser. F Inf. Sci. 2008
Integrated circuit design › semiconductor devices › field-effect transistor
MOSFET
0.112008
Planar split dual gate MOSFET · Sci. China Ser. F Inf. Sci. 2008
Integrated circuit design › semiconductor devices › device scaling
CMOS scaling limits
0.012009
Challenges of 22 nm and beyond CMOS technology · Sci. China Ser. F Inf. Sci. 2009
Integrated circuit design
low-power circuit design
0.012008
Planar split dual gate MOSFET · Sci. China Ser. F Inf. Sci. 2008

Methods — techniques the papers use, named apart from their topics

survey · 0.1
YearPublicationVenuePosition
2009 Challenges of 22 nm and beyond CMOS technology
Ru Huang 0001, HanMing Wu, Jinfeng Kang, Deyuan Xiao, XueLong Shi, Xia An, Runsheng Wang, Xing Zhang 0002, Yangyuan Wang
Sci. China Ser. F Inf. Sci.4
2008 Planar split dual gate MOSFET
Deyuan Xiao, Gary Chen, Roger Lee, Yung Liu, ChiCheong Shen
Sci. China Ser. F Inf. Sci.1