Demonstration venue · read-only. Every page can be browsed; the buttons that would change it are switched off. Create an account to run TaxoReview on your own data. A simulation from public publication records: the people listed were not invited and did not agree to review.
? Tutorial for this page

Robert Doering

dblp:314/5029 · DBLP profile ↗
← Back
2ranked-venue papers
1as first author
0since 2021 · last 2001
—ORCID · none

Domains — the database's venue-derived domains; a paper can count in several

Applied, interdisciplinary, general and emerging computing · 2 · 1 first-author

Expertise — from the expertise taxonomy: the topics of the expert's papers under the CCF categories. A weight counts papers with recency: 1 for a paper about the topic, 0.3 when the topic is its context, halved every five years.

Computer architecture, parallel and distributed computing, and storage systems
2 papers
Integrated circuit design · 77% Electronic design automation · 14% Performance modeling and evaluation · 9%

Topics — the 3 heaviest of 4, each with the papers that count most for it

TopicWeightPapersLastEvidence papers
Integrated circuit design › semiconductor devices › device scaling
CMOS scaling limits
0.012001
Limits of integrated-circuit manufacturing · Proc. IEEE 2001
Integrated circuit design
semiconductor technology
0.011998
The future of microelectronics · Proc. IEEE 1998
Electronic design automation
design methodology
0.012001
Limits of integrated-circuit manufacturing · Proc. IEEE 2001

Methods — techniques the papers use, named apart from their topics

hierarchical modeling · 0.0moore's law analysis · 0.0
YearPublicationVenuePosition
2001 Limits of integrated-circuit manufacturing
abstract
A methodology is suggested for the study of integrated-circuit manufacturing limits. It is based on a hierarchical view of manufacturing detractors and associates limits with levels in this hierarchy. The methodology is illustrated with examples of steady-state, theoretical, and process limits at today's state of the art as well as example projections to future manufacturing at what may be near the limits of complementary metal-oxide-semiconductor (CMOS) scaling. There are also some speculations on possibilities beyond these limits.
Robert Doering, Yoshio Nishi
Proc. IEEE1
1998 The future of microelectronics
abstract
The future of microelectronics will be determined largely by the success of the semiconductor industry in continuing to exploit the "productivity engine". The cycle of this engine is: 1) exponential trends in technology and productivity improvement, which enable 2) expanding markets and revenues, which enable 3) larger research and development (R&D) and manufacturing investments, which, in turn, enable 1). This paradigm has served us well for almost four decades, and the semiconductor industry is probably unique in maintaining such a steep performance/price improvement trend for its products over such a relatively long period. Agriculture has shown improvement over a longer period (thousands of years) but at a much slower pace. Other industries have enjoyed occasional step-function advances, but not on a regular basis spanning several decades. Of course, there is a diversity of opinion about how much longer the fundamental trends (e.g., "Moore's law") can persist. In this paper, we will discuss some of the challenges and opportunities associated with the extension of these trends and indulge in some speculation about potential future scenarios in microelectronics business and technology.
Pallab K. Chatterjee, Robert Doering
Proc. IEEE2