Demo Data from EDBT 2026 / reviewers in the wild / expert
Tom D. Milster
dblp:314/5103
· DBLP profile ↗
1ranked-venue papers
1as first author
0since 2021 · last 2000
—ORCID · unresolved
Domains — the database's venue-derived domains; a paper can count in several
Applied, interdisciplinary, general and emerging computing · 1 · 1 first-author
Expertise — from the expertise taxonomy: the topics of the expert's papers under the CCF categories. A weight counts papers with recency: 1 for a paper about the topic, 0.3 when the topic is its context, halved every five years.
| Computer architecture, parallel and distributed computing, and storage systems
1 paper |
Storage systems · 100% |
Topics — the 2 heaviest of 2, each with the papers that count most for it
| Topic | Weight | Papers | Last | Evidence papers |
|---|---|---|---|---|
Storage systems
optical storage |
0.0 | 1 | 2000 | Near-field optics: a new tool for data storage · Proc. IEEE 2000 |
Storage systems › magnetic recording
high-density digital recording |
0.0 | 1 | 2000 | Near-field optics: a new tool for data storage · Proc. IEEE 2000 |
Methods — techniques the papers use, named apart from their topics
solid immersion lens · 0.0evanescent coupling · 0.0aperture probe · 0.0
| Year | Publication | Venue | Position |
|---|---|---|---|
| 2000 | Near-field optics: a new tool for data storageabstractEvanescent energy can be used to produce extremely small optical spots. Two practical implementations that use evanescent energy are aperture probes and solid immersion lenses (SILs). For data storage, the optical near field is defined in terms of evanescent coupling between the system used to read data and the recording layer. Because of the small spot size, near-field techniques are applied to optical data storage systems in order to increase recording density. Both aperture-type systems and SIL systems show good promise of achieving densities of more than 150 Gb/in/sup 2/. The characteristics and performance of several systems are compared, and future near-field technologies are discussed. Tom D. Milster |
Proc. IEEE | 1 |