Demo Data from EDBT 2026 / reviewers in the wild / expert
Nobuyuki Akiyama
dblp:32/9703
· DBLP profile ↗
1ranked-venue papers
0as first author
0since 2021 · last 1983
—ORCID · none
Domains — the database's venue-derived domains; a paper can count in several
Artificial intelligence and machine learning · 1
Expertise — from the expertise taxonomy: the topics of the expert's papers under the CCF categories. A weight counts papers with recency: 1 for a paper about the topic, 0.3 when the topic is its context, halved every five years.
| Computer architecture, parallel and distributed computing, and storage systems
1 paper |
Electronic design automation · 100% | |
| Artificial intelligence
1 paper |
3D vision · 100% |
Topics — the 3 heaviest of 4, each with the papers that count most for it
| Topic | Weight | Papers | Last | Evidence papers |
|---|---|---|---|---|
Electronic design automation
hardware verification and test |
0.0 | 1 | 1983 | Automatic Inspection System for Printed Circuit Boards · IEEE Trans. Pattern Anal. Mach. Intell. 1983 |
Electronic design automation › hardware verification and test › board-level testing
printed circuit board inspection |
0.0 | 1 | 1983 | Automatic Inspection System for Printed Circuit Boards · IEEE Trans. Pattern Anal. Mach. Intell. 1983 |
Computer vision › 3D vision
visual inspection |
0.0 | 1 | 1983 | Automatic Inspection System for Printed Circuit Boards · IEEE Trans. Pattern Anal. Mach. Intell. 1983 |
Methods — techniques the papers use, named apart from their topics
local feature comparison · 0.0illumination techniques · 0.0
| Year | Publication | Venue | Position |
|---|---|---|---|
| 1983 | Automatic Inspection System for Printed Circuit BoardsabstractThe purpose of this correspondence is to present problems and methods in automating visual inspection of printed circuit boards (PCB's). Vertical and diagonal illumination are useful in detecting PCB patterns correctly. An algorithm comparing local features of the patterns to be inspected with those of the pattern to be referenced is proposed. An inspection system using developed technologies is also described. Yasuhiko Hara, Nobuyuki Akiyama, Koichi Karasaki |
IEEE Trans. Pattern Anal. Mach. Intell. | 2 |