Demonstration venue · read-only. Every page can be browsed; the buttons that would change it are switched off. Create an account to run TaxoReview on your own data. A simulation from public publication records: the people listed were not invited and did not agree to review.
? Tutorial for this page

Nobuyuki Akiyama

dblp:32/9703 · DBLP profile ↗
← Back
1ranked-venue papers
0as first author
0since 2021 · last 1983
—ORCID · none

Domains — the database's venue-derived domains; a paper can count in several

Artificial intelligence and machine learning · 1

Expertise — from the expertise taxonomy: the topics of the expert's papers under the CCF categories. A weight counts papers with recency: 1 for a paper about the topic, 0.3 when the topic is its context, halved every five years.

Computer architecture, parallel and distributed computing, and storage systems
1 paper
Electronic design automation · 100%
Artificial intelligence
1 paper
3D vision · 100%

Topics — the 3 heaviest of 4, each with the papers that count most for it

TopicWeightPapersLastEvidence papers
Electronic design automation
hardware verification and test
0.011983
Automatic Inspection System for Printed Circuit Boards · IEEE Trans. Pattern Anal. Mach. Intell. 1983
Electronic design automation › hardware verification and test › board-level testing
printed circuit board inspection
0.011983
Automatic Inspection System for Printed Circuit Boards · IEEE Trans. Pattern Anal. Mach. Intell. 1983
Computer vision › 3D vision
visual inspection
0.011983
Automatic Inspection System for Printed Circuit Boards · IEEE Trans. Pattern Anal. Mach. Intell. 1983

Methods — techniques the papers use, named apart from their topics

local feature comparison · 0.0illumination techniques · 0.0
YearPublicationVenuePosition
1983 Automatic Inspection System for Printed Circuit Boards
abstract
The purpose of this correspondence is to present problems and methods in automating visual inspection of printed circuit boards (PCB's). Vertical and diagonal illumination are useful in detecting PCB patterns correctly. An algorithm comparing local features of the patterns to be inspected with those of the pattern to be referenced is proposed. An inspection system using developed technologies is also described.
Yasuhiko Hara, Nobuyuki Akiyama, Koichi Karasaki
IEEE Trans. Pattern Anal. Mach. Intell.2