Graph learning is now a dominant tool for analyzing and optimizing hardware designs, yet its effectiveness is repeatedly bottlenecked by circuit representation instead of neural network. We present Halo, a typed multi-view heterogeneous-graph abstraction framework that unifies register-transfer level (RTL) and gate-level netlists. Halo explicitly represents syntax, dataflow, control, sequential/time, hierarchy, hyperedge-correct nets, and cross-level alignment between RTL objects and their synthesized counterparts. We developed deterministic conversion pipelines that maps elaborated SystemVerilog designs using Surelog/UHDM and synthesized netlists, extracted through Yosys JSON into PyTorch-Geometric and DGL heterographs under an append-only schema. HALO is evaluated on a compact representative set of downstream tasks, including cross-level alignment prediction, vulnerability detection, localization, and robustness analysis across synthesis flows.

Forget and Rewire (FaR) methodology has demonstrated strong resilience against Bit-Flip Attacks (BFAs) on Transformer-based models by obfuscating critical parameters through dynamic rewiring of linear layers. However, the application of FaR introduces non-negligible performance and memory overheads, primarily due to the runtime modification of activation pathways and the lack of hardware-level optimization. To overcome these limitations, we propose FaRAccel, a novel hardware accelerator architecture implemented on FPGA, specifically designed to offload and optimize FaR operations. FaRAccel integrates reconfigurable logic for dynamic activation rerouting, and lightweight storage of rewiring configurations, enabling low-latency inference with minimal energy overhead. We evaluate FaRAccel across a suite of Transformer models and demonstrate substantial reductions in FaR inference latency and improvement in energy efficiency, while maintaining the robustness gains of the original FaR methodology. To the best of our knowledge, this is the first hardware-accelerated defense against BFAs in Transformers, effectively bridging the gap between algorithmic resilience and efficient deployment on real-world AI platforms.

On-chip learning is the process of training or updating machine learning models directly on specialized hardware. This approach differs from traditional machine learning, which typically conducts training on external computing resources like Central Processing Units (CPUs) or Graphics Processing Units (GPUs). On-chip learning offers several advantages, including reduced latency, improved energy efficiency, enhanced privacy, and adaptability. Consequently, it holds great promise for enabling intelligent decision-making and adaptability in resource-constrained edge and IoT devices while addressing privacy concerns. In Spiking Neural Network (SNN), on-chip learning is enabled by adjusting synaptic weights, allowing the network’s behavior to dynamically align with desired outcomes. However, this adaptability may introduce potential security vulnerabilities. Unmitigated security risks in on-chip learning can lead to various threats, including data leaks, unauthorized access, and even adversarial manipulation of the learning process. This manuscript aims to provide a comprehensive overview of the security risks associated with on-chip learning, with a focus on potential vulnerabilities within the SNN architecture. We will explore real-world scenarios where these vulnerabilities can be exploited and outline protective measures and mitigation strategies to address these security concerns.

The globalization of the manufacturing process and the supply chain for electronic hardware has been driven by the need to maximize profitability while lowering risk in a technologically advanced silicon sector. However, many hardware IPs’ security features have been broken because of the rise in successful hardware attacks. Existing security efforts frequently ignore numerous dangers in favor of fixing a particular vulnerability. This inspired the development of a unique method that uses emerging spin-based devices to obfuscate circuitry to secure hardware intellectual property (IP) during fabrication and the supply chain. We propose an Optimized and Automated Secure IC (OASIC) Design Flow, a defense-in-depth approach that can minimize overhead while maximizing security. Our EDA tool flow uses a dynamic obfuscation method that employs dynamic lockboxes, which include switch boxes and magnetic random access memory (MRAM)-based look-up tables (LUT) while offering minimal overhead and being flexible and resilient against modern SAT-based attacks and power side-channel attacks. An EDA tool flow for optimized lockbox insertion is also developed to generate SAT-resilient design netlists with the least power and area overhead. PPA metrics and security (SAT attack time) are provided to the designer for each lockbox insertion run. A verification methodology is provided to verify locked and unlocked designs for functional correctness. Finally, we use ISCAS’85 benchmarks to show that the EDA tool flow provides a secure hardware netlist with maximum security while considering power and area constraints. Our results indicate that the proposed OASIC design flow can maximize security while incurring less than 15% area overhead and maintaining a similar power footprint compared to the original design. OASIC design flow demonstrates improved performance as design size increases, which demonstrates the scalability of the proposed approach.

With the growth and globalization of IC design and development, there is an increase in the number of Designers and Design houses. As setting up a fabrication facility may easily cost upwards of $20 billion, costs for advanced nodes may be even greater. IC design houses that cannot produce their chips in-house have no option but to use external foundries that are often in other countries. Establishing trust with these external foundries can be a challenge, and these foundries are assumed to be untrusted. The use of these untrusted foundries in the global semiconductor supply chain has raised concerns about the security of the fabricated ICs targeted for sensitive applications. One of these security threats is the adversarial infestation of fabricated ICs with a Hardware Trojan (HT) . An HT can be broadly described as a malicious modification to a circuit to control, modify, disable, or monitor its logic. Conventional VLSI manufacturing tests and verification methods fail to detect HT due to the different and un-modeled nature of these malicious modifications. Current state-of-the-art HT detection methods utilize statistical analysis of various side-channel information collected from ICs, such as power analysis, power supply transient analysis, regional supply current analysis, temperature analysis, wireless transmission power analysis, and delay analysis. To detect HTs, most methods require a Trojan-free reference golden IC. A signature from these golden ICs is extracted and used to detect ICs with HTs. However, access to a golden IC is not always feasible. Thus, a mechanism for HT detection is sought that does not require the golden IC. Machine Learning (ML) approaches have emerged to be extremely useful in helping eliminate the need for a golden IC. Recent works on utilizing ML for HT detection have been shown to be promising in achieving this goal. Thus, in this tutorial, we will explain utilizing ML as a solution to the challenge of HT detection. Additionally, we will describe the Electronic Design Automation (EDA) tool flow for automating ML-assisted HT detection. Moreover, to further discuss the benefits of ML-assisted HT detection solutions, we will demonstrate a Neural Network (NN) -assisted timing profiling method for HT detection. Finally, we will discuss the shortcomings and open challenges of ML-assisted HT detection methods.

Modern semiconductor manufacturing often leverages a fabless model in which design and fabrication are partitioned. This has led to a large body of work attempting to secure designs sent to an untrusted third party through obfuscation methods. On the other hand, efficient de-obfuscation attacks have been proposed, such as Boolean Satisfiability attacks (SAT attacks). However, there is a lack of frameworks to validate the security and functionality of obfuscated designs. Additionally, unconventional obfuscated design flows, which vary from one obfuscation to another, have been key impending factors in realizing logic locking as a mainstream approach for securing designs. In this work, we address these two issues for Lookup Table-based obfuscation. We study both Volatile and Non-volatile versions of LUT-based obfuscation and develop a framework to validate SAT runtime using machine learning. We can achieve unparallel SAT-resiliency using LUT-based obfuscation while incurring 7% area and less than 1% power overheads. Following this, we discuss and implement a validation flow for obfuscated designs. We then fabricate a chip consisting of several benchmark designs and a RISC-V CPU in TSMC 65nm for post functionality validation. We show that the design flow and SAT-runtime validation can easily integrate LUT-based obfuscation into existing CAD tools while adding minimal verification overhead. Finally, we justify SAT-resilient LUT-based obfuscation as a promising candidate for securing designs.

The security and trustworthiness of ICs are exacerbated by the modern globalized semiconductor business model. This model involves many steps performed at multiple locations by different providers and integrates various Intellectual Properties (IPs) from several vendors for faster time-to-market and cheaper fabrication costs. Many existing works have focused on mitigating the well-known SAT attack and its derivatives. Power Side-Channel Attacks (PSCAs) can retrieve the sensitive contents of the IP and can be leveraged to find the key to unlock the obfuscated circuit without simulating powerful SAT attacks. To mitigate P-SCA and SAT-attack together, we propose a multi-layer defense mechanism called LOCK&ROLL: Deep-Learning Power Side-Channel Attack Mitigation using Emerging Reconfigurable Devices and Logic Locking. LOCK&ROLL utilizes our proposed Magnetic Random-Access Memory (MRAM)-based Look Up Table called Symmetrical MRAM-LUT (SyM-LUT). Our simulation results using 45nm technology demonstrate that the SyM-LUT incurs a small overhead compared to traditional Static Random Access Memory LUT (SRAM-LUT). Additionally, SyM-LUT has a standby energy consumption of 20aJ while consuming 33fJ and 4.6fJ for write and read operations, respectively. LOCK&ROLL is resilient against various attacks such as SAT-attacks, removal attack, scan and shift attacks, and P-SCA.

An increase in demand for semiconductor ICs, recent advancements in machine learning, and the slowing down of Moore's law have all contributed to the increased interest in using Machine Learning (ML) to enhance Electronic Design Automation (EDA) and Computer-Aided Design (CAD) tools and processes. This paper provides a comprehensive survey of available EDA and CAD tools, methods, processes, and techniques for Integrated Circuits (ICs) that use machine learning algorithms. The ML-based EDA/CAD tools are classified based on the IC design steps. They are utilized in Synthesis, Physical Design (Floorplanning, Placement, Clock Tree Synthesis, Routing), IR drop analysis, Static Timing Analysis (STA), Design for Test (DFT), Power Delivery Network analysis, and Sign-off. The current landscape of ML-based VLSI-CAD tools, current trends, and future perspectives of ML in VLSI-CAD are also discussed.