Demonstration venue · read-only. Every page can be browsed; the buttons that would change it are switched off. Create an account to run TaxoReview on your own data. A simulation from public publication records: the people listed were not invited and did not agree to review.
? Tutorial for this page

Cletus C. Harry

dblp:322/0817 · DBLP profile ↗
← Back
1ranked-venue papers
1as first author
0since 2021 · last 1993
—ORCID · none

Domains — the database's venue-derived domains; a paper can count in several

Applied, interdisciplinary, general and emerging computing · 1 · 1 first-author

Expertise — from the expertise taxonomy: the topics of the expert's papers under the CCF categories. A weight counts papers with recency: 1 for a paper about the topic, 0.3 when the topic is its context, halved every five years.

Computer architecture, parallel and distributed computing, and storage systems
1 paper
Hardware reliability and fault tolerance · 77% Integrated circuit design · 23%

Topics — the 2 heaviest of 2, each with the papers that count most for it

TopicWeightPapersLastEvidence papers
Hardware reliability and fault tolerance
integrated circuit reliability
0.011993
ASIC reliability and qualification: a user's perspective · Proc. IEEE 1993
Integrated circuit design
ASIC design
0.011993
ASIC reliability and qualification: a user's perspective · Proc. IEEE 1993

Methods — techniques the papers use, named apart from their topics

reliability evaluation · 0.0failure rate projection · 0.0
YearPublicationVenuePosition
1993 ASIC reliability and qualification: a user's perspective
abstract
The process of qualifying an application-specific integrated circuit (ASIC) such as gate arrays of standard cells, that is used in product development at the IBM Rochester, Minnesota, development laboratory is reviewed. The emphasis is on reliability and its evaluation during the qualification process. The varying degrees of involvement in qualification activities that a supplier has had over the last few years are outlined. These qualification activities, such as technology qualification, specific part number qualifications, supplier process surveys, part construction analysis, and failure rate projections, are discussed. Postqualification expectations in terms of burn-in, reliability monitors, and reliability growth goals are also discussed.>
Cletus C. Harry, Curtis H. Mathiowetz
Proc. IEEE1