Demo Data from EDBT 2026 / reviewers in the wild / expert
Curtis H. Mathiowetz
dblp:322/0920
· DBLP profile ↗
1ranked-venue papers
0as first author
0since 2021 · last 1993
—ORCID · none
Domains — the database's venue-derived domains; a paper can count in several
Applied, interdisciplinary, general and emerging computing · 1
Expertise — from the expertise taxonomy: the topics of the expert's papers under the CCF categories. A weight counts papers with recency: 1 for a paper about the topic, 0.3 when the topic is its context, halved every five years.
| Computer architecture, parallel and distributed computing, and storage systems
1 paper |
Hardware reliability and fault tolerance · 77% Integrated circuit design · 23% |
Topics — the 2 heaviest of 2, each with the papers that count most for it
| Topic | Weight | Papers | Last | Evidence papers |
|---|---|---|---|---|
Hardware reliability and fault tolerance
integrated circuit reliability |
0.0 | 1 | 1993 | ASIC reliability and qualification: a user's perspective · Proc. IEEE 1993 |
Integrated circuit design
ASIC design |
0.0 | 1 | 1993 | ASIC reliability and qualification: a user's perspective · Proc. IEEE 1993 |
Methods — techniques the papers use, named apart from their topics
reliability evaluation · 0.0failure rate projection · 0.0
| Year | Publication | Venue | Position |
|---|---|---|---|
| 1993 | ASIC reliability and qualification: a user's perspectiveabstractThe process of qualifying an application-specific integrated circuit (ASIC) such as gate arrays of standard cells, that is used in product development at the IBM Rochester, Minnesota, development laboratory is reviewed. The emphasis is on reliability and its evaluation during the qualification process. The varying degrees of involvement in qualification activities that a supplier has had over the last few years are outlined. These qualification activities, such as technology qualification, specific part number qualifications, supplier process surveys, part construction analysis, and failure rate projections, are discussed. Postqualification expectations in terms of burn-in, reliability monitors, and reliability growth goals are also discussed.> Cletus C. Harry, Curtis H. Mathiowetz |
Proc. IEEE | 2 |