Demo Data from EDBT 2026 / reviewers in the wild / expert
Thomas F. Kuech
dblp:322/3379
· DBLP profile ↗
1ranked-venue papers
1as first author
0since 2021 · last 1992
—ORCID · none
Domains — the database's venue-derived domains; a paper can count in several
Applied, interdisciplinary, general and emerging computing · 1 · 1 first-author
Expertise — from the expertise taxonomy: the topics of the expert's papers under the CCF categories. A weight counts papers with recency: 1 for a paper about the topic, 0.3 when the topic is its context, halved every five years.
| Computer architecture, parallel and distributed computing, and storage systems
1 paper |
Integrated circuit design · 91% Embedded and real-time systems · 9% |
Topics — the 4 heaviest of 4, each with the papers that count most for it
| Topic | Weight | Papers | Last | Evidence papers |
|---|---|---|---|---|
Integrated circuit design › semiconductor device fabrication
semiconductor growth |
0.0 | 1 | 1992 | Recent advances in metal-organic vapor phase epitaxy · Proc. IEEE 1992 |
Integrated circuit design › semiconductor technology
semiconductor materials |
0.0 | 1 | 1992 | Recent advances in metal-organic vapor phase epitaxy · Proc. IEEE 1992 |
Integrated circuit design › semiconductor devices
wide bandgap semiconductor devices |
0.0 | 1 | 1992 | Recent advances in metal-organic vapor phase epitaxy · Proc. IEEE 1992 |
Embedded and real-time systems › industrial control systems
process control |
0.0 | 1 | 1992 | Recent advances in metal-organic vapor phase epitaxy · Proc. IEEE 1992 |
Methods — techniques the papers use, named apart from their topics
metalorganic chemical vapor deposition · 0.0
| Year | Publication | Venue | Position |
|---|---|---|---|
| 1992 | Recent advances in metal-organic vapor phase epitaxyabstractRecent progress in the development and application of metal-organic vapor phase epitaxy (MOVPE) is reviewed. The formation of new and unique materials and structures, including wide-bandgap materials of both III-V and II-VI semiconductors, is discussed. The basic studies of the underlying chemistry and fluid flow behavior in MOVPE reactors and resulting improvements in the control of material properties and the uniformity of growth are considered. New growth precursors yielding both selective area growth and improved material purity are discussed. Improved reproducibility of the MOVPE growth product using growth monitors, for the real-time determination of film thickness and composition, which have resulted in greater acceptance of the MOVPE technique in the manufacturing environment, is discussed.> Thomas F. Kuech |
Proc. IEEE | 1 |