Demo Data from EDBT 2026 / reviewers in the wild / expert
Shao-Hung Chi
dblp:324/6048
· DBLP profile ↗
1ranked-venue papers
0as first author
1since 2021 · last 2022
—ORCID · none
Domains — the database's venue-derived domains; a paper can count in several
Systems, architecture and hardware · 1 · 1 since 2021
Expertise — from the expertise taxonomy: the topics of the expert's papers under the CCF categories. A weight counts papers with recency: 1 for a paper about the topic, 0.3 when the topic is its context, halved every five years.
| Computer architecture, parallel and distributed computing, and storage systems
1 paper |
Storage systems · 100% |
Topics — the 5 heaviest of 5, each with the papers that count most for it
| Topic | Weight | Papers | Last | Evidence papers |
|---|---|---|---|---|
Storage systems › flash and SSD › flash memory › flash storage
bit-alterable flash memory |
0.6 | 1 | 2022 | Enabling the Duo-Phase Data Management to Realize Longevity Bit-Alterable Flash Memory · IEEE Trans. Computers 2022 |
Storage systems › flash and SSD
flash memory |
0.6 | 1 | 2022 | Enabling the Duo-Phase Data Management to Realize Longevity Bit-Alterable Flash Memory · IEEE Trans. Computers 2022 |
Storage systems › flash and SSD › flash memory management
garbage collection |
0.6 | 1 | 2022 | Enabling the Duo-Phase Data Management to Realize Longevity Bit-Alterable Flash Memory · IEEE Trans. Computers 2022 |
Storage systems › flash and SSD › flash memory management
wear leveling |
0.6 | 1 | 2022 | Enabling the Duo-Phase Data Management to Realize Longevity Bit-Alterable Flash Memory · IEEE Trans. Computers 2022 |
Storage systems › storage reliability › durability
flash lifetime |
0.2 | 1 | 2022 | Enabling the Duo-Phase Data Management to Realize Longevity Bit-Alterable Flash Memory · IEEE Trans. Computers 2022 |
Methods — techniques the papers use, named apart from their topics
duo-phase data management · 0.6
| Year | Publication | Venue | Position |
|---|---|---|---|
| 2022 | Enabling the Duo-Phase Data Management to Realize Longevity Bit-Alterable Flash MemoryabstractBit-alterable flash memory is a cutting-edge technology that enables a novel operation, called page-level erase operation, to erase a flash page within a block arbitrarily. Though the page-level erase operation can ease the overhead of the live-page copying during a garbage collection process, it also introduces a new wear-leveling problem. In such the problem, flash pages within the same block will receive different program/erase (P/E) cycles during runtime. Some specific pages storing hot data will be worn out soon; therefore, the lifespan of the bit-alterable flash memory will be short due to the uneven worn out of flash pages. Consequently, it becomes a critical issue with the bit-alterable flash memory, and the state-of-art wear-leveling designs cannot resolve this problem. For tackling the problem, this study presents a duo-phase data management scheme considering the page-level wear-leveling issue. The duo-phase mechanism simultaneously cares about page- and block-level wear-leveling issues. On the page-level wear-leveling problem, the duo-phase scheme identifies hot flash pages via the few bits and softly restricts the hot flash page to store hot data. On the other hand, our proposed mechanism also figures out the solution to minimize the number of copied live pages for the block-level wear-leveling issue. Tseng-Yi Chen, Shao-Hung Chi, Ming-Chang Yang, Ting-Ying Chien |
IEEE Trans. Computers | 2 |