Demo Data from EDBT 2026 / reviewers in the wild / expert
Frank E. Barber
dblp:328/6746
· DBLP profile ↗
1ranked-venue papers
0as first author
0since 2021 · last 1988
—ORCID · none
Domains — the database's venue-derived domains; a paper can count in several
Applied, interdisciplinary, general and emerging computing · 1
Expertise — from the expertise taxonomy: the topics of the expert's papers under the CCF categories. A weight counts papers with recency: 1 for a paper about the topic, 0.3 when the topic is its context, halved every five years.
| Computer architecture, parallel and distributed computing, and storage systems
1 paper |
Hardware reliability and fault tolerance · 46% Integrated circuit design · 41% Performance modeling and evaluation · 14% |
Topics — the 3 heaviest of 5, each with the papers that count most for it
| Topic | Weight | Papers | Last | Evidence papers |
|---|---|---|---|---|
Hardware reliability and fault tolerance
radiation hardening |
0.0 | 1 | 1988 | The design of radiation-hardened ICs for space: a compendium of approaches · Proc. IEEE 1988 |
Integrated circuit design › semiconductor device fabrication
CMOS technology |
0.0 | 1 | 1988 | The design of radiation-hardened ICs for space: a compendium of approaches · Proc. IEEE 1988 |
Integrated circuit design › semiconductor devices
silicon-on-insulator |
0.0 | 1 | 1988 | The design of radiation-hardened ICs for space: a compendium of approaches · Proc. IEEE 1988 |
| Year | Publication | Venue | Position |
|---|---|---|---|
| 1988 | The design of radiation-hardened ICs for space: a compendium of approachesabstractSeveral technologies, including bulk and epi CMOS, CMOS/SOI-SOS (silicon-on-insulator-silicon-on-sapphire), CML (current-mode logic), ECL (emitter-coupled logic), analog bipolar (JI, single-poly DI, and SOI) and GaAs E/D (enhancement/depletion) heterojunction MESFET, are discussed. The discussion includes the direct effects of space radiation on microelectronic materials and devices, how these effects are evidenced in circuit and device design parameter variations, the particular effects of most significance to each functional class of circuit, specific techniques for hardening high-speed circuits, design examples for integrated systems, including operational amplifiers and A/D (analog/digital) converters, and the computer simulation of radiation effects on microelectronic ICs.> Sherra E. Kerns, B. D. Shafer, Leonard R. Rockett, Jeffrey S. Pridmore, Dale F. Berndt, Nick van Vonno, Frank E. Barber |
Proc. IEEE | 7 |