EDBT 2026 Demo / reviewers in the wild / expert
Satish S. Soman
dblp:33/2966
· DBLP profile ↗
1ranked-venue papers
0as first author
0since 2021 · last 1988
—ORCID · none
Domains — the database's venue-derived domains; a paper can count in several
Systems, architecture and hardware · 1
Expertise — from the expertise taxonomy: the topics of the expert's papers under the CCF categories. A weight counts papers with recency: 1 for a paper about the topic, 0.3 when the topic is its context, halved every five years.
| Computer architecture, parallel and distributed computing, and storage systems
1 paper |
Electronic design automation · 100% |
Topics — the 4 heaviest of 4, each with the papers that count most for it
| Topic | Weight | Papers | Last | Evidence papers |
|---|---|---|---|---|
Electronic design automation › hardware verification and test
fault coverage |
0.0 | 1 | 1988 | Functional Test Generation Based on Unate Function Theory · IEEE Trans. Computers 1988 |
Electronic design automation › hardware verification and test › test generation
functional test generation |
0.0 | 1 | 1988 | Functional Test Generation Based on Unate Function Theory · IEEE Trans. Computers 1988 |
Electronic design automation
hardware verification and test |
0.0 | 1 | 1988 | Functional Test Generation Based on Unate Function Theory · IEEE Trans. Computers 1988 |
Electronic design automation › hardware verification and test
test generation |
0.0 | 1 | 1988 | Functional Test Generation Based on Unate Function Theory · IEEE Trans. Computers 1988 |
Methods — techniques the papers use, named apart from their topics
unate function analysis · 0.0recursive decomposition · 0.0
| Year | Publication | Venue | Position |
|---|---|---|---|
| 1988 | Functional Test Generation Based on Unate Function TheoryabstractThe generation of a universal test set (UTS) for unate functions is used as a starting point. This test set is complete and minimal for the set of all unateness-preserving faults. However, for functions that are not unate in any variable, the UTS generated by this algorithm is the exhaustive set. An algorithm is presented that computes a good functional test set (GFTS) of reasonable size even for such functions. The algorithm does this by breaking up functions into more unate components, recursively computing GFTS for them, and combining the test sets in an appropriate way. The GFTS generated by the algorithm is compared to random test sets of the same size for gate-level fault coverage in typical implementations.> Vijay Pitchumani, Satish S. Soman |
IEEE Trans. Computers | 2 |