Diffusion models have found phenomenal success as expressive priors for solving inverse problems, but their extension beyond natural images to more structured scientific domains remains limited. Motivated by applications in materials science, we aim to reduce the number of measurements required from an expensive imaging modality of interest, by leveraging side information from an auxiliary modality that is much cheaper to obtain. To deal with the non-differentiable and black-box nature of the forward model, we propose a framework to train a multimodal diffusion model over the joint modalities, turning inverse problems with black-box forward models into simple linear inpainting problems. Numerically, we demonstrate the feasibility of training diffusion models over materials imagery data, and show that our approach achieves superior image reconstruction by leveraging the available side information, requiring significantly less amount of data from the expensive microscopy modality.

Score-based diffusion models, while achieving remarkable empirical performance, often suffer from low sampling speed, due to extensive function evaluations needed during the sampling phase. Despite a flurry of recent activities towards speeding up diffusion generative modeling in practice, theoretical underpinnings for acceleration techniques remain severely limited. In this paper, we design novel training-free algorithms to accelerate popular deterministic (i.e., DDIM) and stochastic (i.e., DDPM) samplers. Our accelerated deterministic sampler converges at a rate $O(\frac{1}{{T}^2})$ with $T$ the number of steps, improving upon the $O(\frac{1}{T})$ rate for the DDIM sampler; and our accelerated stochastic sampler converges at a rate $O(\frac{1}{T})$, outperforming the rate $O(\frac{1}{\sqrt{T}})$ for the DDPM sampler. The design of our algorithms leverages insights from higher-order approximation, and shares similar intuitions as popular high-order ODE solvers like the DPM-Solver-2. Our theory accommodates $\ell_2$-accurate score estimates, and does not require log-concavity or smoothness on the target distribution.