Demo Data from EDBT 2026 / reviewers in the wild / expert
Brian Keng
dblp:35/1878
· DBLP profile ↗
12ranked-venue papers
9as first author
0since 2021 · last 2019
—ORCID · none
Domains — the database's venue-derived domains; a paper can count in several
Systems, architecture and hardware · 9 · 7 first-authorSoftware engineering, systems software and programming languages · 4 · 3 first-authorTheory of computation · 2 · 2 first-authorArtificial intelligence and machine learning · 1Graphics, computer vision, multimedia, augmented reality and games · 1
Expertise — from the expertise taxonomy: the topics of the expert's papers under the CCF categories. A weight counts papers with recency: 1 for a paper about the topic, 0.3 when the topic is its context, halved every five years.
| Computer architecture, parallel and distributed computing, and storage systems
3 papers |
Electronic design automation · 100% | |
| Databases, data mining, and information retrieval
1 paper |
Knowledge graphs · 100% |
Topics — the 7 heaviest of 7, each with the papers that count most for it
| Topic | Weight | Papers | Last | Evidence papers |
|---|---|---|---|---|
Knowledge graphs
knowledge graph embedding |
0.4 | 1 | 2019 | Unsupervised Embedding Enhancements of Knowledge Graphs using Textual Associations · IJCAI 2019 |
Knowledge graphs
link prediction |
0.4 | 1 | 2019 | Unsupervised Embedding Enhancements of Knowledge Graphs using Textual Associations · IJCAI 2019 |
Electronic design automation › hardware verification and test › formal verification
abstraction refinement |
0.3 | 2 | 2013 | Path-Directed Abstraction and Refinement for SAT-Based Design Debugging · IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 2013 Path directed abstraction and refinement in SAT-based design debugging · DAC 2012 |
Electronic design automation › hardware verification and test › debugging
design debugging |
0.3 | 2 | 2013 | Path-Directed Abstraction and Refinement for SAT-Based Design Debugging · IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 2013 Bounded Model Debugging · IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 2010 |
Electronic design automation
hardware verification and test |
0.3 | 2 | 2013 | Path-Directed Abstraction and Refinement for SAT-Based Design Debugging · IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 2013 Bounded Model Debugging · IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 2010 |
Electronic design automation › hardware verification and test
hardware verification |
0.1 | 1 | 2012 | Path directed abstraction and refinement in SAT-based design debugging · DAC 2012 |
Electronic design automation › hardware verification and test › debugging
SAT-based debugging |
0.0 | 1 | 2013 | Path-Directed Abstraction and Refinement for SAT-Based Design Debugging · IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 2013 |
Methods — techniques the papers use, named apart from their topics
word embeddings · 0.4knowledge graph embedding · 0.4path directed abstraction · 0.3time-windowing · 0.2sliding window analysis · 0.2SAT solving · 0.1error trace partitioning · 0.1bounded model checking · 0.1
| Year | Publication | Venue | Position |
|---|---|---|---|
| 2019 | Unsupervised Embedding Enhancements of Knowledge Graphs using Textual AssociationsabstractKnowledge graph embeddings are instrumental for representing and learning from multi-relational data, with recent embedding models showing high effectiveness for inferring new facts from existing databases. However, such precisely structured data is usually limited in quantity and in scope. Therefore, to fully optimize the embeddings it is important to also consider more widely available sources of information such as text. This paper describes an unsupervised approach to incorporate textual information by augmenting entity embeddings with embeddings of associated words. The approach does not modify the optimization objective for the knowledge graph embedding, which allows it to be integrated with existing embedding models. Two distinct forms of textual data are considered, with different embedding enhancements proposed for each case. In the first case, each entity has an associated text document that describes it. In the second case, a text document is not available, and instead entities occur as words or phrases in an unstructured corpus of text fragments. Experiments show that both methods can offer improvement on the link prediction task when applied to many different knowledge graph embedding models. Neil Veira, Brian Keng, Kanchana Padmanabhan, Andreas G. Veneris |
IJCAI | 2 |
| 2014 | Automated debugging of missing assumptionsabstractFormal verification has increased efficiency by detecting corner case design bugs but it has also introduced new challenges when failures are detected. Once a counter-example is returned by a formal tool, the user typically does not know if the failure is caused by a design bug, an incorrectly written assertion, or a missing assumption. Previous work in debug automation has focused on the former two cases. This paper introduces a novel methodology to automatically debug missing assumptions. It begins by generating multiple formal counter-examples for the error. Next, a function is extracted from these counter-examples that encodes the input combinations that cause the assertion to fail. This function is later used to generate a list of fixed cycle assumptions that prevent failures similar to the generated counter-examples. These filtered assumptions can then be used as hints for the actual missing assumption. Further, if a missing assumption is not the cause of the failure, the method offers the additional benefit that the counter-examples it generates can be utilized to debug the RTL and/or the assertion. An extensive set of experimental results on OpenCores designs and assertions show that the number of generated assumptions can be reduced by an average of 38% using ten counter-examples, while an average of 28 assumptions is returned to the user. Brian Keng, Evean Qin, Andreas G. Veneris, Bao Le |
ASP-DAC | 1 |
| 2013 | Path-Directed Abstraction and Refinement for SAT-Based Design DebuggingabstractFunctional verification has become one of the most time-consuming tasks in the very large scale integration design flow accounting for up to 57% of the total project time. The largest component of this task is that of design debugging due to its resource-intensive manual nature. With the ever growing size of modern designs and their error traces, the complexity of the debugging problem poses a great challenge to automated debugging techniques. To overcome this challenge, this paper introduces a novel path-directed abstraction and refinement algorithm for design debugging to manage excessive error trace lengths. A sliding window of the error trace is iteratively analyzed in a time-windowing framework, which is made possible by the use of the path-directed abstraction. This abstraction forms a concise approximation of nonmodeled parts of the error trace while simultaneously providing an efficient representation for refinement. The result is an algorithm that dramatically reduces the memory requirements of debugging while mitigating the incomplete results of past techniques. Experimental results on industrial designs with long error traces show that the proposed approach can analyze traces that are 64.6% longer while simultaneously decreasing peak memory usage compared to previous work. Brian Keng, Andreas G. Veneris |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. | 1 |
| 2012 | Path directed abstraction and refinement in SAT-based design debuggingabstractThe past decade has seen a disproportionate amount of resources dedicated towards verification as compared to actual design. It is reported that one third of this overhead is due to the resource-intensive task of manual debugging. To relieve this burden, this work introduces the novel concept of path directed debugging within a window-based abstraction/refinement framework. The algorithm divides the error trace into non-overlapping time-windows where each window is analyzed separately. Subsequent windows are replaced with abstracted over-approximations derived from failing paths in the time domain. Using this abstracted model, each solution found is processed through an additional verification step that removes spurious solutions and simultaneously refines the problem. This paper also develops the theory that shows that the proposed approach is complete, a fact that mitigates the incompleteness inherent in past time-window based debugging methods. Experimental results on industrial designs with long error traces show a 55% decrease in peak memory usage resulting in 78% more instances being solved when compared to previous work. Brian Keng, Andreas G. Veneris |
DAC | 1 |
| 2012 | Non-solution implications using reverse domination in a modern SAT-based debugging environmentabstractWith the growing complexity of VLSI designs, functional debugging has become a bottleneck in modern CAD flows. To alleviate this cost, various SAT-based techniques have been developed to automate bug localization in the RTL. In this context, dominance relationships between circuit blocks have been recently shown to reduce the number of SAT solver calls, using the concept of solution implications. This paper first introduces the dual concepts of reverse domination and non-solution implications. A SAT solver is tailored to leverage reverse dominators for the early on-the-fly detection of bug-free components. These are non-solution areas and their early pruning significantly reduces the the debugging search-space. This process is expedited by branching on error-select variables first. Extensive experiments on tough real-life industrial debugging cases show an average speedup of 1.7x in SAT solving time over the state-of-the-art, a testimony of the practicality and effectiveness of the proposed approach. Bao Le, Hratch Mangassarian, Brian Keng, Andreas G. Veneris |
DATE | 3 |
| 2012 | Automated debugging of missing input constraints in a formal verification environment
Brian Keng, Andreas G. Veneris |
FMCAD | 1 |
| 2011 | Managing complexity in design debugging with sequential abstraction and refinementabstractDesign debugging is becoming an increasingly difficult task in the VLSI design flow with the growing size of modern designs and their error traces. In this work, a novel abstraction and refinement technique for design debugging is presented that addresses two key components of the debugging complexity, the design size and the error trace length. The abstraction technique works by under-approximating the debugging problem by removing modules of the original design and replacing them with simulated values of the erroneous circuit. After each abstract problem is solved, the refinement strategy uses the resulting UNSAT core to direct which modules should be refined. This refinement strategy is extended by allowing refinement of across time-frames in addition to modules. Experimental results show that the proposed algorithm is able to return solutions for all instances compared to only 41% without the technique demonstrating the viability of this approach in tackling real-world debugging problems. Brian Keng, Andreas G. Veneris |
ASP-DAC | 1 |
| 2011 | From RTL to silicon: The case for automated debugabstractComputer-aided design tools are continuously improving their scalability and efficiency to mitigate the high cost associated with designing and fabricating modern VLSI systems. A key step in the design process is the root-cause analysis of detected errors. Debugging may take months to close, introduce high cost and uncertainty ultimately jeopardizing the chip release date. This study makes the case for debug automation in each part of the design flow (RTL to silicon) to bridge the gap. Contemporary research, challenges and future directions motivate for the urgent need in automation to relieve the pain from this highly manual task. Andreas G. Veneris, Brian Keng, Sean Safarpour |
ASP-DAC | 2 |
| 2011 | Automated debugging of SystemVerilog assertionsabstractIn the last decade, functional verification has become a major bottleneck in the design flow. To relieve this growing burden, assertion-based verification has gained popularity as a means to increase the quality and efficiency of verification. Although robust, the adoption of assertion-based verification poses new challenges to debugging due to presence of errors in the assertions. These unique challenges necessitate a departure from past automated circuit debugging techniques which are shown to be ineffective. In this work, we present a methodology, mutation model and additional techniques to debug errors in SystemVerilog assertions. The methodology uses the failing assertion, counterexample and mutation model to produce alternative properties that are verified against the design. These properties serve as a basis for possible corrections. They also provide insight into the design behavior and the failing assertion. Experimental results show that this process is effective in finding high quality alternative assertions for all empirical instances. Brian Keng, Sean Safarpour, Andreas G. Veneris |
DATE | 1 |
| 2010 | Bounded Model DebuggingabstractDesign debugging is a major bottleneck in modern very large scale integration design flows as both the design size and the length of the error trace contribute to its inherent complexity. With typical design blocks exceeding half a million synthesized logic gates and error traces in the thousands of clock cycles, the complexity of the debugging problem poses a great challenge to automated debugging techniques. This paper aims to address this daunting challenge by introducing the bounded model debugging methodology that iteratively analyzes bounded sequences of the error trace. Two techniques are introduced in this methodology to solve this growing problem. The first technique iteratively analyzes bounded subsequences of the error trace of increasing size until the error is found or the entire trace is analyzed. The second technique partitions the error trace into non-overlapping bounded sequences of clock cycles which are each separately analyzed. A discussion of these two techniques is presented and a unified methodology that leverages the strengths of both techniques is developed. Empirical results on real industrial designs show that for large designs and long error traces the proposed methodology can find the actual error in 79% of cases with the first technique and 100% of cases with the second technique. In cases where the methodology is not used only 21% of cases are able to find the actual error. These numbers confirm the benefits of the proposed methodology to allow conventional automated debuggers to handle much larger real-life circuits. Brian Keng, Sean Safarpour, Andreas G. Veneris |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. | 1 |
| 2009 | Scaling VLSI design debugging with interpolationabstractGiven an erroneous design, functional verification returns an error trace exhibiting a mismatch between the specification and the implementation of a design. Automated design debugging uses these error traces to identify potentially erroneous modules causing the error. With the increasing size and complexity of modern VLSI designs, error traces have become longer and harder to analyze. At the same time, design debugging has become one of the most resource-intensive steps in the chip design cycle. This work proposes a scalable SAT-based design debugging algorithm that uses interpolants to over-approximate sets of constraints that model the erroneous behavior. The algorithm partitions the original problem into a sequence of smaller subproblems by using subsections of the error trace that are examined iteratively. This is made possible by using interpolants to properly constrain the erroneous behavior for each subproblem, significantly reducing the number of simultaneous time-frames examined in the error trace. The described method is shown to be complete and an additional technique is presented to improve the quality of the debugging results using multiple interpolants. Experiments on real designs show a 57% reduction in memory and 23% decrease in run-time compared to previous work. Brian Keng, Andreas G. Veneris |
FMCAD | 1 |
| 2008 | A succinct memory model for automated design debuggingabstractIn todaypsilas complex SoC designs, verification and debugging are becoming ever more crucial and increasingly time-consuming tasks. The prevalence of embedded memories adds to the difficulty of the problem by exponentially increasing the state-space of the design. In this work, a novel memory model for design debugging is presented. It models memory succinctly by avoiding an explicit representation for each memory bit. The method uses the simulation of the erroneous design to guide the debugging process. This results in a parameterizable formal encoding that grows linearly with the erroneous trace length, significantly reducing the memory requirements of the debugging problem. In addition, the proposed model is extended to handle an arbitrary initial memory configuration, as well as non-cycle accurate output traces where only a final expected memory state is available for comparison. Experiments on industrial designs show a 96% average reduction in memory usage along with a noticeable performance improvement compared to previous work. Brian Keng, Hratch Mangassarian, Andreas G. Veneris |
ICCAD | 1 |