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O. Melstrand

dblp:35/377 · DBLP profile ↗
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1ranked-venue papers
1as first author
0since 2021 · last 1984
—ORCID · none

Domains — the database's venue-derived domains; a paper can count in several

Systems, architecture and hardware · 1 · 1 first-author

Expertise — from the expertise taxonomy: the topics of the expert's papers under the CCF categories. A weight counts papers with recency: 1 for a paper about the topic, 0.3 when the topic is its context, halved every five years.

Computer architecture, parallel and distributed computing, and storage systems
1 paper
Integrated circuit design · 87% Electronic design automation · 13%

Topics — the 2 heaviest of 3, each with the papers that count most for it

TopicWeightPapersLastEvidence papers
Integrated circuit design › analog and mixed-signal circuits › device modeling
device model parameter extraction		 0.011984
A Data Base Driven Automated System for MOS Device Characterization, Parameter Optimization and Modeling · IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 1984
Integrated circuit design
semiconductor device characterization		 0.011984
A Data Base Driven Automated System for MOS Device Characterization, Parameter Optimization and Modeling · IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 1984

Methods — techniques the papers use, named apart from their topics

constrained optimization · 0.0
YearPublicationVenuePosition
1984 A Data Base Driven Automated System for MOS Device Characterization, Parameter Optimization and Modeling
abstract
An automated system has been developed for use in the characterization and modeling of MOS transistors. The system, consisting of automatic testing, a dynamic data base, and device parameter extraction, has been applied to process characterization and device modeling. The data base handles storage and retrieval of the data. Parameter extraction is based on optimization with constraints.
O. Melstrand, Eamonn O'Neill, Gerald E. Sobelman, D. Dokos
 IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.1