Modern RISC-V designs are increasingly integrating cryptographic accelerators to provide better security features while enhancing performance; however, their vulnerability to power side-channel attacks remains insufficiently investigated. This paper presents a comprehensive evaluation of such vulnerabilities in a RISCV-based AES accelerator connected via the Core-V eXtension Interface (CV-X-IF). The analysis begins at the RTL using simulated power traces, employing KL (Kullback–Leibler) divergence alongside established statistical attacks such as Correlation Power Analysis (CPA) and Differential Power Analysis (DPA). Although the former serves as an early indicator of potential leakage, simulation results highlight its limitations compared to CPA and DPA. To validate these findings, leakage trends are further examined through FPGA-based power measurement. The proposed methodology is designed to be broadly applicable to a range of cryptographic workloads and accelerator architectures. It is demonstrated on an AES accelerator implementing the scalar cryptographic extension (Zk) with pre-expanded keys. Our findings reveal that side-channel vulnerabilities can persist even in tightly integrated instruction pipelines, underscoring the importance of early-stage leakage assessment. Notably, the close alignment between RTL-level simulations and FPGA-based measurements highlights the effectiveness of the approach and its practical value for guiding secure hardware design in RISC-V ecosystems. In particular, AES serves only as a case of study; the proposed RTL and FPGA validation flow is generic and can be applied to any cryptographic accelerator.

The widespread use of artificial intelligence (AI)-based systems has raised several concerns about their deployment in safety-critical systems. Industry standards, such as ISO26262 for automotive, require detecting hardware faults during the mission of the device. Similarly, new standards are being released concerning the functional safety of AI systems (e.g., ISO/IEC CD TR 5469). Hardware solutions have been proposed for the infield testing of the hardware executing AI applications; however, when used in applications such as Convolutional Neural Networks (CNNs) in image processing tasks, their usage may increase the hardware cost and affect the application performances. In this paper, for the very first time, a methodology to develop high-quality test images, to be interleaved with the normal inference process of the CNN application is proposed. An Image Test Library (ITL) is developed targeting the on-line test of GPU functional units. The proposed approach does not require changing the actual CNN (thus incurring in costly memory loading operations) since it is able to exploit the actual CNN structure. Experimental results show that a 6-image ITL is able to achieve about 95% of stuck-at test coverage on the floating-point multipliers in a GPU. The obtained ITL requires a very low test application time, as well as a very low memory space for storing the test images and the golden test responses.