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Paola Mauri

dblp:36/4006 · DBLP profile ↗
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1ranked-venue papers
1as first author
0since 2021 · last 1992
—ORCID · none

Domains — the database's venue-derived domains; a paper can count in several

Databases, data management, data science and information retrieval · 1 · 1 first-author

Expertise — from the expertise taxonomy: the topics of the expert's papers under the CCF categories. A weight counts papers with recency: 1 for a paper about the topic, 0.3 when the topic is its context, halved every five years.

Computer architecture, parallel and distributed computing, and storage systems
1 paper
Hardware reliability and fault tolerance · 100%
Databases, data mining, and information retrieval
1 paper
Data mining · 100%

Topics — the 3 heaviest of 3, each with the papers that count most for it

TopicWeightPapersLastEvidence papers
Hardware reliability and fault tolerance
failure analysis
0.011992
Database Structure and Discovery Tools for Integrated Circuit Reliability Evaluation · ICDE 1992
Hardware reliability and fault tolerance
integrated circuit reliability
0.011992
Database Structure and Discovery Tools for Integrated Circuit Reliability Evaluation · ICDE 1992
Data mining
pattern mining
0.011992
Database Structure and Discovery Tools for Integrated Circuit Reliability Evaluation · ICDE 1992
YearPublicationVenuePosition
1992 Database Structure and Discovery Tools for Integrated Circuit Reliability Evaluation
abstract
The reliability performance of integrated circuits is described by means of a large amount of quantitative and qualitative data that require computer tools for effective management. The author describes some design solutions in the implementation of these tools, in particular stressing the integration of different points of view to model reliability performance; the structure of the failure database that, following expert reasoning features, implicitly contains as cause-effect relationships the results of the failure analysis; and the procedures designed to discover regularities and relationships among stored data, thus helping engineers in reliability evaluation and failure analysis.>
Paola Mauri
ICDE1