EDBT 2026 Demo / reviewers in the wild / expert
Paola Mauri
dblp:36/4006
· DBLP profile ↗
1ranked-venue papers
1as first author
0since 2021 · last 1992
—ORCID · none
Domains — the database's venue-derived domains; a paper can count in several
Databases, data management, data science and information retrieval · 1 · 1 first-author
Expertise — from the expertise taxonomy: the topics of the expert's papers under the CCF categories. A weight counts papers with recency: 1 for a paper about the topic, 0.3 when the topic is its context, halved every five years.
| Computer architecture, parallel and distributed computing, and storage systems
1 paper |
Hardware reliability and fault tolerance · 100% | |
| Databases, data mining, and information retrieval
1 paper |
Data mining · 100% |
Topics — the 3 heaviest of 3, each with the papers that count most for it
| Topic | Weight | Papers | Last | Evidence papers |
|---|---|---|---|---|
Hardware reliability and fault tolerance
failure analysis |
0.0 | 1 | 1992 | Database Structure and Discovery Tools for Integrated Circuit Reliability Evaluation · ICDE 1992 |
Hardware reliability and fault tolerance
integrated circuit reliability |
0.0 | 1 | 1992 | Database Structure and Discovery Tools for Integrated Circuit Reliability Evaluation · ICDE 1992 |
Data mining
pattern mining |
0.0 | 1 | 1992 | Database Structure and Discovery Tools for Integrated Circuit Reliability Evaluation · ICDE 1992 |
| Year | Publication | Venue | Position |
|---|---|---|---|
| 1992 | Database Structure and Discovery Tools for Integrated Circuit Reliability EvaluationabstractThe reliability performance of integrated circuits is described by means of a large amount of quantitative and qualitative data that require computer tools for effective management. The author describes some design solutions in the implementation of these tools, in particular stressing the integration of different points of view to model reliability performance; the structure of the failure database that, following expert reasoning features, implicitly contains as cause-effect relationships the results of the failure analysis; and the procedures designed to discover regularities and relationships among stored data, thus helping engineers in reliability evaluation and failure analysis.> Paola Mauri |
ICDE | 1 |