Demo Data from EDBT 2026 / reviewers in the wild / expert
Michael Y. Zhang
dblp:36/558
· DBLP profile ↗
1ranked-venue papers
0as first author
0since 2021 · last 1995
—ORCID · none
Domains — the database's venue-derived domains; a paper can count in several
Systems, architecture and hardware · 1
Expertise — from the expertise taxonomy: the topics of the expert's papers under the CCF categories. A weight counts papers with recency: 1 for a paper about the topic, 0.3 when the topic is its context, halved every five years.
| Computer architecture, parallel and distributed computing, and storage systems
1 paper |
Electronic design automation · 87% Integrated circuit design · 13% |
Topics — the 3 heaviest of 3, each with the papers that count most for it
| Topic | Weight | Papers | Last | Evidence papers |
|---|---|---|---|---|
Electronic design automation
power estimation |
0.0 | 1 | 1995 | Extreme Delay Sensitivity and the Worst-Case Switching Activity in VLSI Circuits · DAC 1995 |
Electronic design automation › power estimation
switching activity estimation |
0.0 | 1 | 1995 | Extreme Delay Sensitivity and the Worst-Case Switching Activity in VLSI Circuits · DAC 1995 |
Integrated circuit design
digital circuit design |
0.0 | 1 | 1995 | Extreme Delay Sensitivity and the Worst-Case Switching Activity in VLSI Circuits · DAC 1995 |
Methods — techniques the papers use, named apart from their topics
simulation · 0.0
| Year | Publication | Venue | Position |
|---|---|---|---|
| 1995 | Extreme Delay Sensitivity and the Worst-Case Switching Activity in VLSI CircuitsabstractWe observe that the switching activity at a circuit node, also called the transition density, can be extremely sensitive to the circuit internal delays.As a result, slight delay v ariations can lead to several orders of magnitude changes in the node activity.This has important implications for CAD in that, if the transition density is estimated by simulation, then minor inaccuracies in the timing models can lead to very large errors in the estimated activity.As a solution, we propose an efcient technique for estimating an upper bound on the transition density a t e v ery node.While it is not always very tight, the upper bound is robust, i n the sense that it is valid irrespective of delay v ariations and modeling errors.We will describe the technique and present experimental results based on a prototype implementation. Farid N. Najm, Michael Y. Zhang |
DAC | 2 |