Demo Data from EDBT 2026 / reviewers in the wild / expert
Linda L. King
dblp:36/5784
· DBLP profile ↗
1ranked-venue papers
0as first author
0since 2021 · last 1987
—ORCID · none
Domains — the database's venue-derived domains; a paper can count in several
Systems, architecture and hardware · 1
Expertise — from the expertise taxonomy: the topics of the expert's papers under the CCF categories. A weight counts papers with recency: 1 for a paper about the topic, 0.3 when the topic is its context, halved every five years.
| Computer architecture, parallel and distributed computing, and storage systems
1 paper |
Electronic design automation · 100% |
Topics — the 3 heaviest of 3, each with the papers that count most for it
| Topic | Weight | Papers | Last | Evidence papers |
|---|---|---|---|---|
Electronic design automation › hardware verification and test › fault diagnosis › system-level diagnosis
comparison-based diagnosis |
0.0 | 1 | 1987 | The Comparison Approach to Multiprocessor Fault Diagnosis · IEEE Trans. Computers 1987 |
Electronic design automation › hardware verification and test
fault diagnosis |
0.0 | 1 | 1987 | The Comparison Approach to Multiprocessor Fault Diagnosis · IEEE Trans. Computers 1987 |
Electronic design automation › hardware verification and test › fault diagnosis
system-level diagnosis |
0.0 | 1 | 1987 | The Comparison Approach to Multiprocessor Fault Diagnosis · IEEE Trans. Computers 1987 |
Methods — techniques the papers use, named apart from their topics
probabilistic analysis · 0.0
| Year | Publication | Venue | Position |
|---|---|---|---|
| 1987 | The Comparison Approach to Multiprocessor Fault DiagnosisabstractIn this correspondence a system-level, comparison-based strategy for identifying faulty processors in a multiprocessor system is described. Unlike other strategies which have been proposed in the literature, the comparison approach is more efficient and relies on more realistic assumptions about the system under consideration. The new strategy is shown to correctly identify the set of faulty processors with a remarkably high probability, making it an attractive and viable addition or alternative to present fault diagnosis techniques. Anton T. Dahbura, Krishan K. Sabnani, Linda L. King |
IEEE Trans. Computers | 3 |