Demo Data from EDBT 2026 / reviewers in the wild / expert
Itai Jaeger
dblp:36/749
· DBLP profile ↗
5ranked-venue papers
0as first author
0since 2021 · last 2007
—ORCID · none
Domains — the database's venue-derived domains; a paper can count in several
Systems, architecture and hardware · 4Artificial intelligence and machine learning · 1Graphics, computer vision, multimedia, augmented reality and games · 1
Expertise — from the expertise taxonomy: the topics of the expert's papers under the CCF categories. A weight counts papers with recency: 1 for a paper about the topic, 0.3 when the topic is its context, halved every five years.
| Computer architecture, parallel and distributed computing, and storage systems
4 papers |
Electronic design automation · 87% Processor architecture and microarchitecture · 13% |
Topics — the 5 heaviest of 6, each with the papers that count most for it
| Topic | Weight | Papers | Last | Evidence papers |
|---|---|---|---|---|
Electronic design automation › hardware verification and test
hardware verification |
0.1 | 2 | 2007 | Intelligent Interleaving of Scenarios: A Novel Approach to System Level Test Generation · DAC 2007 Constraint-Based Random Stimuli Generation for Hardware Verification · AAAI 2006 |
Electronic design automation
hardware verification and test |
0.1 | 2 | 2007 | A Framework for the Validation of Processor Architecture Compliance · DAC 2007 Harnessing Machine Learning to Improve the Success Rate of Stimuli Generation · IEEE Trans. Computers 2006 |
Electronic design automation › hardware verification and test › test generation › high-level test generation
system-level test generation |
0.1 | 1 | 2007 | Intelligent Interleaving of Scenarios: A Novel Approach to System Level Test Generation · DAC 2007 |
Electronic design automation › hardware verification and test
test generation |
0.1 | 1 | 2007 | Intelligent Interleaving of Scenarios: A Novel Approach to System Level Test Generation · DAC 2007 |
Electronic design automation › hardware test
test stimulus generation |
0.1 | 1 | 2006 | Harnessing Machine Learning to Improve the Success Rate of Stimuli Generation · IEEE Trans. Computers 2006 |
Methods — techniques the papers use, named apart from their topics
model-based test case generator · 0.1flowcharts · 0.1dynamic scenario interleaving · 0.1coverage models · 0.1machine learning · 0.1constraint solving · 0.1
| Year | Publication | Venue | Position |
|---|---|---|---|
| 2007 | A Framework for the Validation of Processor Architecture ComplianceabstractWe present a framework for validating the compliance of a design with a given architecture. Our approach is centered on the concept of misinterpretations. These include missing behavior, wrong understanding of a behavior, or confusion with similar behavior described in the architecture or elsewhere. We formally capture the architecture behavior in the form of flowcharts and automatically derive a list of architecture misinterpretations from these flowcharts. These misinterpretations constitute the backbone of coverage models targeted by a suite of tests. The suite is automatically generated by a model-based test case generator. A compliance validation system based on these principles has been developed and used in two actual industrial processes of checking compliance with the PowerPC architecture. Allon Adir, Sigal Asaf, Laurent Fournier, Itai Jaeger, Ofer Peled |
DAC | 4 |
| 2007 | Intelligent Interleaving of Scenarios: A Novel Approach to System Level Test GenerationabstractParallelism in system architecture and design imposes a verification challenge as the exponential growth in the number of execution combinations becomes unwieldy. We report on a method for system-level test case generation. This method relies on dynamic interleaving of scenarios from the core level or sub-system level. We discuss the relevance of this method for the system level. We also describe a tool that implements this method and show how it was used in IBM for system verification of the Xbox 360 chip and power management in the cell processor, as well as verification of the pSeries eServers. We claim that this method shortened the system level verification cycle and allowed reuse in and across projects, which led to exposure of system-level bugs in a relatively short time. Shady Copty, Itai Jaeger, Yoav Katz, Michael Vinov |
DAC | 2 |
| 2006 | Constraint-Based Random Stimuli Generation for Hardware Verification
Yehuda Naveh, Michal Rimon, Itai Jaeger, Yoav Katz, Michael Vinov, Eitan Marcus, Gil Shurek |
AAAI | 3 |
| 2006 | Harnessing Machine Learning to Improve the Success Rate of Stimuli GenerationabstractThe initial state of a design under verification has a major impact on the ability of stimuli generators to successfully generate the requested stimuli. For complexity reasons, most stimuli generators use sequential solutions without planning ahead. Therefore, in many cases, they fail to produce a consistent stimuli due to an inadequate selection of the initial state. We propose a new method, based on machine learning techniques, to improve generation success by learning the relationship between the initial state vector and generation success. We applied the proposed method in two different settings, with the objective of improving generation success and coverage in processor and system level generation. In both settings, the proposed method significantly reduced generation failures and enabled faster coverage Shai Fine, Ari Freund 0001, Itai Jaeger, Yishay Mansour, Yehuda Naveh, Avi Ziv |
IEEE Trans. Computers | 3 |
| 2004 | Quality Improvement Methods for System-Level Stimuli GenerationabstractFunctional verification of systems is aimed at validating the integration of previously verified components. It deals with complex designs, and invariably suffers from scarce resources. We present a set of methods, collectively known as testing knowledge, aimed at increasing the quality of automatically generated system-level test-cases. Testing knowledge reduces the time and effort required to achieve high coverage of the verified design. Roy Emek, Itai Jaeger, Yoav Katz, Yehuda Naveh |
ICCD | 2 |