Demo Data from EDBT 2026 / reviewers in the wild / expert
Yuanyuan Chen 0017
dblp:37/7763-17
· DBLP profile ↗
1ranked-venue papers
0as first author
1since 2021 · last 2024
0009-0003-7761-0122ORCID · verified
Domains — the database's venue-derived domains; a paper can count in several
Software engineering, systems software and programming languages · 1 · 1 since 2021
Expertise — from the expertise taxonomy: the topics of the expert's papers under the CCF categories. A weight counts papers with recency: 1 for a paper about the topic, 0.3 when the topic is its context, halved every five years.
| Software engineering, system software, and programming languages
1 paper |
Software testing · 100% |
Topics — the 2 heaviest of 2, each with the papers that count most for it
| Topic | Weight | Papers | Last | Evidence papers |
|---|---|---|---|---|
Software testing
GUI testing |
0.8 | 1 | 2024 | GUI Test Repair Based on Test-Extension · ASE 2024 |
Software testing
test repair |
0.8 | 1 | 2024 | GUI Test Repair Based on Test-Extension · ASE 2024 |
Methods — techniques the papers use, named apart from their topics
sequence transduction probability · 0.8feature coverage · 0.8
| Year | Publication | Venue | Position |
|---|---|---|---|
| 2024 | GUI Test Repair Based on Test-ExtensionabstractGUI test repair is important to detect and repair obsolete test events to enhance the reliability of the software. From an interaction design perspective, designers usually design different routes to facilitate users to reach the same functional entry point. Based on this, we propose a novel test repair method to find paths with similar functions based on the feature coverage, to get as close as possible to the test target point during the repairing process, and to improve the effectiveness of the test fixing. A test extension algorithm is proposed to search for alternative event branches with similar features to the test script. Then, the sequence transduction probability is used to calculate the feature coverage of the mapping event paths in the updated version and guide the repair. Experiments conducted on popular applications demonstrate that the method can achieve a success rate of 79.63% in repairing tests, which significantly outperforms current approaches. The test-extension approach displays immense potential for optimizing test repairs. Yuanyuan Chen 0017, Xiangping Chen |
ASE | 2 |