Although offering great potential for energy-efficient edge-AI, memristor-based CIM accelerators are severely hindered by IR drop induced errors. To tackle this, we propose a low-cost mitigation technique by first quantifying the impact of IR drop on the accuracy. Then, a mitigation strategy is developed to compensate for IR drop-induced inference accuracy reduction by combining an optimized mapping scheme with a fine-tuned calibration of the ADC. Results show the proposed solution can effectively mitigate IR drop with a negligible overhead.

Computing-in-Memory (CIM) architectures using memristive crossbar arrays enable energy-efficient AI acceleration. Analog non-idealities, such as IR drop and nonlinearity, impose design constraints that existing simulators cannot capture and thus explore effectively. Current approaches sacrifice either modeling accuracy or simulation speed, preventing systematic design space exploration. In this paper we propose X-Sim, a crossbar simulator that resolves this trade-off through a modular architecture. Our approach decouples device physics from circuit analysis using a fixed-point scheme, avoiding expensive Jacobian computations while preserving device fidelity. X-Sim delivers SPICE-level accuracy (< 1% error) with up to 200× speedup over physics-based simulators. This enables quick and systematic design space exploration across thousands of configurations, guiding reliable system design. X-Sim will be released as open source.

Compute-in-memory (CIM) AI accelerators using non-volatile memories like RRAM enable energy-efficient edge inference by executing Multiply-Accumulate (MAC) operations directly in memory in a single cycle. These designs modify memory cells and analog-to-digital converters (ADCs), introducing faults not seen in standard memories. We present the first structural testing methodology and framework for RRAM-based CIM MAC circuits, including defect and fault models for memory cells and ADCs. Our robust inference-driven tests exercise full MAC functionality, significantly reducing test time compared to traditional methods, and integrating cell and peripheral testing to ensure high reliability, defect coverage, and operational efficiency.