EDBT 2026 Demo / reviewers in the wild / expert
Alex Goryachev
dblp:38/10064
· DBLP profile ↗
5ranked-venue papers
0as first author
0since 2021 · last 2014
—ORCID · none
Domains — the database's venue-derived domains; a paper can count in several
Systems, architecture and hardware · 4Software engineering, systems software and programming languages · 1Graphics, computer vision, multimedia, augmented reality and games · 1
Expertise — from the expertise taxonomy: the topics of the expert's papers under the CCF categories. A weight counts papers with recency: 1 for a paper about the topic, 0.3 when the topic is its context, halved every five years.
| Computer architecture, parallel and distributed computing, and storage systems
3 papers |
Electronic design automation · 95% Processor architecture and microarchitecture · 5% | |
| Computer networks
1 paper |
Vehicular, aerial and satellite networks · 100% |
Topics — the 6 heaviest of 7, each with the papers that count most for it
| Topic | Weight | Papers | Last | Evidence papers |
|---|---|---|---|---|
Electronic design automation
hardware verification and test |
0.4 | 2 | 2014 | Verification of Non-Mainline Functions in Todays Processor Chips · DAC 2014 Using a High-Level Test Generation Expert System for Testing In-Car Networks · DAC 2014 |
Vehicular, aerial and satellite networks › vehicular networks
in-vehicle networks |
0.2 | 1 | 2014 | Using a High-Level Test Generation Expert System for Testing In-Car Networks · DAC 2014 |
Electronic design automation › hardware verification and test
functional verification |
0.2 | 1 | 2014 | Verification of Non-Mainline Functions in Todays Processor Chips · DAC 2014 |
Electronic design automation › hardware verification and test › test generation › high-level test generation
system-level test generation |
0.2 | 1 | 2014 | Using a High-Level Test Generation Expert System for Testing In-Car Networks · DAC 2014 |
Electronic design automation › hardware verification and test
hardware verification |
0.1 | 1 | 2011 | Facing the challenge of new design features: an effective verification approach · DAC 2011 |
Electronic design automation › hardware verification and test
test generation |
0.1 | 1 | 2011 | Facing the challenge of new design features: an effective verification approach · DAC 2011 |
Methods — techniques the papers use, named apart from their topics
ontology of testing knowledge · 0.4expert system · 0.4coverage monitors · 0.4verification IP reuse · 0.1test generation · 0.1
| Year | Publication | Venue | Position |
|---|---|---|---|
| 2014 | Using a High-Level Test Generation Expert System for Testing In-Car NetworksabstractThe rising size and complexity of in-car networks call for more advanced and scalable verification solutions. We propose a verification methodology for in-car networks based on a system level test generator tool used for creating massive random biased stimuli, and on coverage and checking monitors. The test generator is an expert system based on an ontology of testing knowledge. A significant challenge is the continuous nature of the stimuli needed to represent the physical environment and the state of the internal components controlled by the vehicle's electronic systems. We report on applying our methodology to an example in-car network simulator. Allon Adir, Alex Goryachev, Lev Greenberg, Tamer Salman |
DAC | 2 |
| 2014 | Verification of Non-Mainline Functions in Todays Processor ChipsabstractIn a modern chip development cycle non-mainline / nonfunctional verification is gaining importance compared to traditional functional verification tasks and takes up to one third of the total verification effort. The purpose of non-mainline logic is to operate, maintain, and debug the chip. Ever-increasing complexity of the chip, thus, directly affects the complexity of the non-mainline logic and as a result, the verification thereof. Moreover, the non-mainline world is no longer pure hardware, but an intricate mix of software and hardware. Johannes Koesters, Alex Goryachev |
DAC | 2 |
| 2014 | Panel: Future SoC verification methodology: UVM evolution or revolution?abstractWith increasing design complexity System on Chip (SoC) verification is becoming a more and more important and challenging aspect of the overall development process. The Universal Verification Methodology (UVM) is thereby a common solution to this problem; although it still keeps some problems unsolved. In this panel leading experts from industry (both users and vendors) and academy will discuss the future of SoC verification methodology. Rolf Drechsler, Christophe Chevallaz, Franco Fummi, Alan J. Hu, Ronny Morad, Frank Schirrmeister, Alex Goryachev |
DATE | 7 |
| 2014 | Offset polygon and annulus placement problems
Gill Barequet, Alex Goryachev |
Comput. Geom. | 2 |
| 2011 | Facing the challenge of new design features: an effective verification approachabstractVerifying new hardware systems is a daunting task. To reduce the amount of effort involved, verification teams attempt to reuse as much verification IP as possible. We introduce a novel approach for test generation that enables the reuse of verification IP to verify new functionality. This method applies to a significant category of features, which are variations on the functionality of an existing design. Our method is being successfully used in the verification of high-end IBM servers: System p and System z. We compared our technique to alternative approaches and show that it achieves the best quality while reducing manual effort. Wisam Kadry, Ronny Morad, Alex Goryachev, Eli Almog, Christopher A. Krygowski |
DAC | 3 |