Control channels on microfluidic large-scale integration (mLSI) chips are prone to blockage and leakage defects. In this work, we propose a built-in self-test (BIST) method that drastically improves the test efficiency. Given n to-be-tested control channels, we reduced the number of test patterns for blockage and leakage tests from [EQUATION] to 1, and from ⌈log2(n + 1)⌉ to ⌈log2(χ(G) + 1)⌉, respectively, where χ(G) denotes the vertex chromatic number of a graph G consisting of n vertices. We fabricated our design and demonstrated the feasibility and efficiency of our method.