EDBT 2026 Demo / reviewers in the wild / expert
Bhaskar Pal
dblp:40/3682
· DBLP profile ↗
6ranked-venue papers
4as first author
1since 2021 · last 2026
—ORCID · none
Domains — the database's venue-derived domains; a paper can count in several
Systems, architecture and hardware · 4 · 2 first-authorSoftware engineering, systems software and programming languages · 1 · 1 first-authorTheory of computation · 1 · 1 first-author
Expertise — from the expertise taxonomy: the topics of the expert's papers under the CCF categories. A weight counts papers with recency: 1 for a paper about the topic, 0.3 when the topic is its context, halved every five years.
| Computer architecture, parallel and distributed computing, and storage systems
2 papers |
Electronic design automation · 100% |
Topics — the 7 heaviest of 7, each with the papers that count most for it
| Topic | Weight | Papers | Last | Evidence papers |
|---|---|---|---|---|
Electronic design automation › hardware verification and test
test generation |
0.1 | 2 | 2008 | Accelerating Assertion Coverage With Adaptive Testbenches · IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 2008 Test generation games from formal specifications · DAC 2006 |
Electronic design automation › hardware verification and test › hardware verification › assertion-based verification
assertion coverage |
0.1 | 1 | 2008 | Accelerating Assertion Coverage With Adaptive Testbenches · IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 2008 |
Electronic design automation › hardware verification and test › test generation › functional test generation
constrained-random test generation |
0.1 | 1 | 2008 | Accelerating Assertion Coverage With Adaptive Testbenches · IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 2008 |
Electronic design automation › hardware verification and test
hardware verification |
0.1 | 1 | 2008 | Accelerating Assertion Coverage With Adaptive Testbenches · IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 2008 |
Electronic design automation › hardware verification and test
formal verification |
0.1 | 1 | 2006 | Test generation games from formal specifications · DAC 2006 |
Electronic design automation
hardware verification and test |
0.1 | 1 | 2006 | Test generation games from formal specifications · DAC 2006 |
Electronic design automation › hardware verification and test › functional verification
simulation-based verification |
0.0 | 1 | 2008 | Accelerating Assertion Coverage With Adaptive Testbenches · IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 2008 |
Methods — techniques the papers use, named apart from their topics
black-box simulation steering · 0.1adaptive testbench · 0.1layered test bench architecture · 0.1game-based test generation · 0.1
| Year | Publication | Venue | Position |
|---|---|---|---|
| 2026 | DXInject: GPU-Based Payload Transport and Execution via DirectX Compute Shaders
Bhaskar Pal, Naseem Halder, Vasudevan A. R. |
IWCMC | 1 |
| 2009 | Design intent coverage revisitedabstractDesign intent coverage is a formal methodology for analyzing the gap between a formal architectural specification of a design and the formal functional specifications of the component RTL blocks of the design. In this article we extend the design intent coverage methodology to hybrid specifications containing both state-machines and formal properties. We demonstrate the benefits of this extension in two domains of considerable recent interest, namely (a) the use of auxiliary state-machines in formal specifications, and (b) the use of modest sized RTL blocks in the design intent coverage analysis. Pallab Dasgupta, Bhaskar Pal, Sayantan Das 0001, Prasenjit Basu, P. P. Chakrabarti 0001 |
ACM Trans. Design Autom. Electr. Syst. | 3 |
| 2008 | Accelerating Assertion Coverage With Adaptive TestbenchesabstractWe present a new approach to bias random test generation for accelerating assertion coverage. The novelty of the proposed approach is that it treats the design under test as a black box and attempts to steer the simulation toward coverage points that are relevant for targeted assertions purely through external control. We present this approach over three different models with varying degrees of observability and control. The results demonstrate a significant speedup in assertion coverage as compared to randomized simulation. Bhaskar Pal, Ansuman Banerjee, Pallab Dasgupta |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. | 1 |
| 2007 | BUSpec: A framework for generation of verification aids for standard bus protocol specifications
Bhaskar Pal, Ansuman Banerjee, Pallab Dasgupta, P. P. Chakrabarti 0001 |
Integr. | 1 |
| 2006 | Test generation games from formal specificationsabstractIn this paper, we present methods for automatic test generation from formal specifications. These are used to create intelligent test benches that are able to cover corner case behaviors in much less time. We have developed a prototype tool for intelligent test generation within the layered test bench architecture proposed in RVM. We present results on verification IPs of standard bus protocols to show the effectiveness of our approach. Ansuman Banerjee, Bhaskar Pal, Pallab Dasgupta |
DAC | 2 |
| 2004 | The BUSpec platform for automated generation of verification aids for standard bus protocolsabstractA typical verification IP (VIP) of a bus protocol such as ARM AMBA or PCI consists of a set of assertions and associated verification aids like test-benches and coverage metrics. While, several languages have been formalized for specifying assertions (examples include OVA, Sugar, ForSpec, SVA, etc), the tasks of writing test-benches that produce protocol compliant stimuli and coverage monitors that reflect the coverage of the protocol functionality are also of significant importance. This paper presents a platform for high-level specification of a bus protocol and an automated methodology for generating a variety of verification aids that must supplement the set of assertions in a VIP. Bhaskar Pal, Ansuman Banerjee, Pallab Dasgupta, P. P. Chakrabarti 0001 |
MEMOCODE | 1 |