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Bhaskar Pal

dblp:40/3682 · DBLP profile ↗
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6ranked-venue papers
4as first author
1since 2021 · last 2026
—ORCID · none

Domains — the database's venue-derived domains; a paper can count in several

Systems, architecture and hardware · 4 · 2 first-authorSoftware engineering, systems software and programming languages · 1 · 1 first-authorTheory of computation · 1 · 1 first-author

Expertise — from the expertise taxonomy: the topics of the expert's papers under the CCF categories. A weight counts papers with recency: 1 for a paper about the topic, 0.3 when the topic is its context, halved every five years.

Computer architecture, parallel and distributed computing, and storage systems
2 papers
Electronic design automation · 100%

Topics — the 7 heaviest of 7, each with the papers that count most for it

TopicWeightPapersLastEvidence papers
Electronic design automation › hardware verification and test
test generation
0.122008
Accelerating Assertion Coverage With Adaptive Testbenches · IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 2008
Test generation games from formal specifications · DAC 2006
Electronic design automation › hardware verification and test › hardware verification › assertion-based verification
assertion coverage
0.112008
Accelerating Assertion Coverage With Adaptive Testbenches · IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 2008
Electronic design automation › hardware verification and test › test generation › functional test generation
constrained-random test generation
0.112008
Accelerating Assertion Coverage With Adaptive Testbenches · IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 2008
Electronic design automation › hardware verification and test
hardware verification
0.112008
Accelerating Assertion Coverage With Adaptive Testbenches · IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 2008
Electronic design automation › hardware verification and test
formal verification
0.112006
Test generation games from formal specifications · DAC 2006
Electronic design automation
hardware verification and test
0.112006
Test generation games from formal specifications · DAC 2006
Electronic design automation › hardware verification and test › functional verification
simulation-based verification
0.012008
Accelerating Assertion Coverage With Adaptive Testbenches · IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 2008

Methods — techniques the papers use, named apart from their topics

black-box simulation steering · 0.1adaptive testbench · 0.1layered test bench architecture · 0.1game-based test generation · 0.1
YearPublicationVenuePosition
2026 DXInject: GPU-Based Payload Transport and Execution via DirectX Compute Shaders
Bhaskar Pal, Naseem Halder, Vasudevan A. R.
IWCMC1
2009 Design intent coverage revisited
abstract
Design intent coverage is a formal methodology for analyzing the gap between a formal architectural specification of a design and the formal functional specifications of the component RTL blocks of the design. In this article we extend the design intent coverage methodology to hybrid specifications containing both state-machines and formal properties. We demonstrate the benefits of this extension in two domains of considerable recent interest, namely (a) the use of auxiliary state-machines in formal specifications, and (b) the use of modest sized RTL blocks in the design intent coverage analysis.
Pallab Dasgupta, Bhaskar Pal, Sayantan Das 0001, Prasenjit Basu, P. P. Chakrabarti 0001
ACM Trans. Design Autom. Electr. Syst.3
2008 Accelerating Assertion Coverage With Adaptive Testbenches
abstract
We present a new approach to bias random test generation for accelerating assertion coverage. The novelty of the proposed approach is that it treats the design under test as a black box and attempts to steer the simulation toward coverage points that are relevant for targeted assertions purely through external control. We present this approach over three different models with varying degrees of observability and control. The results demonstrate a significant speedup in assertion coverage as compared to randomized simulation.
Bhaskar Pal, Ansuman Banerjee, Pallab Dasgupta
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.1
2007 BUSpec: A framework for generation of verification aids for standard bus protocol specifications
Bhaskar Pal, Ansuman Banerjee, Pallab Dasgupta, P. P. Chakrabarti 0001
Integr.1
2006 Test generation games from formal specifications
abstract
In this paper, we present methods for automatic test generation from formal specifications. These are used to create intelligent test benches that are able to cover corner case behaviors in much less time. We have developed a prototype tool for intelligent test generation within the layered test bench architecture proposed in RVM. We present results on verification IPs of standard bus protocols to show the effectiveness of our approach.
Ansuman Banerjee, Bhaskar Pal, Pallab Dasgupta
DAC2
2004 The BUSpec platform for automated generation of verification aids for standard bus protocols
abstract
A typical verification IP (VIP) of a bus protocol such as ARM AMBA or PCI consists of a set of assertions and associated verification aids like test-benches and coverage metrics. While, several languages have been formalized for specifying assertions (examples include OVA, Sugar, ForSpec, SVA, etc), the tasks of writing test-benches that produce protocol compliant stimuli and coverage monitors that reflect the coverage of the protocol functionality are also of significant importance. This paper presents a platform for high-level specification of a bus protocol and an automated methodology for generating a variety of verification aids that must supplement the set of assertions in a VIP.
Bhaskar Pal, Ansuman Banerjee, Pallab Dasgupta, P. P. Chakrabarti 0001
MEMOCODE1