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Franco Venturi

dblp:40/6973 · DBLP profile ↗
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4ranked-venue papers
2as first author
0since 2021 · last 1993
—ORCID · none

Domains — the database's venue-derived domains; a paper can count in several

Systems, architecture and hardware · 4 · 2 first-author

Expertise — from the expertise taxonomy: the topics of the expert's papers under the CCF categories. A weight counts papers with recency: 1 for a paper about the topic, 0.3 when the topic is its context, halved every five years.

Computer architecture, parallel and distributed computing, and storage systems
4 papers
Electronic design automation · 97% Integrated circuit design · 3%
Interdisciplinary, comprehensive, and emerging computing
1 paper
Computational science and engineering · 100%

Topics — the 4 heaviest of 4, each with the papers that count most for it

TopicWeightPapersLastEvidence papers
Electronic design automation › technology computer-aided design
device simulation
0.041993
A numerical method to compute isotropic band models from anisotropic semiconductor band structures · IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 1993
Monte Carlo simulations of high energy electrons and holes in Si-n-MOSFET's · IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 1991
A general purpose device simulator coupling Poisson and Monte Carlo transport with applications to deep submicron MOSFETs · IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 1989
Electronic design automation › technology computer-aided design › device simulation
monte carlo device simulation
0.041993
A numerical method to compute isotropic band models from anisotropic semiconductor band structures · IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 1993
Monte Carlo simulations of high energy electrons and holes in Si-n-MOSFET's · IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 1991
A general purpose device simulator coupling Poisson and Monte Carlo transport with applications to deep submicron MOSFETs · IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 1989
Computational science and engineering › statistical physics
boltzmann equation
0.011993
A numerical method to compute isotropic band models from anisotropic semiconductor band structures · IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 1993
Integrated circuit design › analog and mixed-signal circuits › device modeling
MOSFET modeling
0.011988
MOS2: an efficient MOnte Carlo Simulator for MOS devices · IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 1988

Methods — techniques the papers use, named apart from their topics

monte carlo simulation · 0.0isotropic band model · 0.0impact ionization modeling · 0.0vectorization · 0.0poisson equation coupling · 0.0monte carlo transport · 0.0monte carlo method · 0.0drift-diffusion model · 0.0
YearPublicationVenuePosition
1993 A numerical method to compute isotropic band models from anisotropic semiconductor band structures
abstract
A numerical method for the determination of isotropic band models has been developed and applied to silicon. The resulting model accurately approximates both density of states and group velocity of the corresponding anisotropic band structure, thus providing an excellent agreement with both the collision and nonhomogeneous terms of the Boltzmann transport equation. The model, represented by a simple set of energy-wave vector tables, has been implemented in a Monte Carlo device simulator, but can also be extended to alternative methods for solving the Boltzmann equation. Simulation of homogeneous silicon shows a very good agreement with available experimental data. Comparison with results obtained using the complete anisotropic band structure, both in homogeneous and nonhomogeneous silicon devices, confirms the validity of the model.>
Antonio Abramo, Franco Venturi, Enrico Sangiorgi, Jack M. Higman, Bruno Riccò
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.2
1991 Monte Carlo simulations of high energy electrons and holes in Si-n-MOSFET's
abstract
Monte Carlo simulations of high-energy electrons and holes in Si n-MOSFETs are presented. Key features of this work include the use of a suitable silicon model for carrier transport at high electric fields, an original impact ionization model, and sophisticated numerical techniques to speed up the calculation. The case of submicrometer Si n-MOSFETs is considered as a relevant application.>
Franco Venturi, Enrico Sangiorgi, Rossella Brunetti, Wolfgang Quade, Carlo Jacoboni, Bruno Riccò
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.1
1989 A general purpose device simulator coupling Poisson and Monte Carlo transport with applications to deep submicron MOSFETs
abstract
An efficient self-consistent device simulator coupling Poisson equation and Monte Carlo transport suitable for general silicon devices, including those with regions of high doping/carrier densities, is discussed. Key features include an original iteration scheme and an almost complete vectorization of the program. The simulator has been used to characterize nonequilibrium effects in deep submicron nMOSFETs. Substantial overshoot effects are noticeable at gate lengths of 0.25 mu m at room temperatures.>
Franco Venturi, R. Kent Smith, Enrico Sangiorgi, Mark R. Pinto, Bruno Riccò
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.1
1988 MOS2: an efficient MOnte Carlo Simulator for MOS devices
abstract
An efficient Monte Carlo device simulator has been developed as a postprocessor of a two-dimensional numerical analyzer based on the drift-diffusion model. The Monte Carlo package analyzes real VLSI MOSFETs in a minicomputer environment, overcoming some existing theoretical and practical problems. In particular, the particle free-flight time distribution is obtained by a new algorithm, leading to a CPU time saving of at least one order of magnitude compared with the traditional approach. To describe rare electron configurations, such as the high-energy tails of the distributions and the particle dynamics in the presence of large retarding fields, a multiple repetition scheme was implemented. Selected applications are presented to illustrate the simulator's capabilities.>
Enrico Sangiorgi, Bruno Riccò, Franco Venturi
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.3