Demonstration venue · read-only. Every page can be browsed; the buttons that would change it are switched off. Create an account to run TaxoReview on your own data.

Inderpal S. Bhandari

dblp:41/1011 · DBLP profile ↗
← Back
16ranked-venue papers
7as first author
0since 2021 · last 1997
—ORCID · none

Domains — the database's venue-derived domains; a paper can count in several

Systems, architecture and hardware · 5 · 2 first-authorSoftware engineering, systems software and programming languages · 5 · 2 first-authorHuman-computer interaction and ubiquitous computing · 2 · 2 first-authorArtificial intelligence and machine learning · 1Computer networks · 1Databases, data management, data science and information retrieval · 1 · 1 first-authorGraphics, computer vision, multimedia, augmented reality and games · 1Applied, interdisciplinary, general and emerging computing · 1

Expertise — from the expertise taxonomy: the topics of the expert's papers under the CCF categories. A weight counts papers with recency: 1 for a paper about the topic, 0.3 when the topic is its context, halved every five years.

Software engineering, system software, and programming languages
4 papers
Software maintenance and evolution · 63% Empirical software engineering · 17% Requirements engineering and software design · 13%
Computer architecture, parallel and distributed computing, and storage systems
4 papers
Distributed systems · 35% Electronic design automation · 27% Hardware reliability and fault tolerance · 20%
Computer networks
1 paper
Routing and switching · 100%
Theoretical computer science
1 paper
Logic in computer science · 50% Mathematical optimization · 50%
Artificial intelligence
1 paper
Knowledge representation and reasoning · 100%

Topics — the 21 heaviest of 22, each with the papers that count most for it

TopicWeightPapersLastEvidence papers
Software maintenance and evolution
software inspection
0.021993
In-Process Evaluation for Software Inspection and Test · IEEE Trans. Software Eng. 1993
Post-Process Feedback With and Without Attribute Focusing: A Comparative Evaluation · ICSE 1993
Software maintenance and evolution › software quality assurance › defect analysis
defect classification
0.021993
A Case Study of Software Process Improvement During Development · IEEE Trans. Software Eng. 1993
Orthogonal Defect Classification - A Concept for In-Process Measurements · IEEE Trans. Software Eng. 1992
Routing and switching › adaptive routing
deflection routing
0.011994
Fault-tolerant convergence routing · ICNP 1994
Empirical software engineering › software fault analysis
defect data analysis
0.011993
A Case Study of Software Process Improvement During Development · IEEE Trans. Software Eng. 1993
Requirements engineering and software design › software process
software process assessment
0.011993
In-Process Evaluation for Software Inspection and Test · IEEE Trans. Software Eng. 1993
Software maintenance and evolution
software process improvement
0.011993
A Case Study of Software Process Improvement During Development · IEEE Trans. Software Eng. 1993
Knowledge, reasoning and agents › Knowledge representation and reasoning
commonsense reasoning
0.011988
Formal Basis for Commonsense Abstraction of Dynamic Systems · AAAI 1988
Distributed systems
clock synchronization
0.011988
On the Graceful Degradation of Phase-Locked Clocks · RTSS 1988
Distributed systems
fault tolerance
0.011988
On the Graceful Degradation of Phase-Locked Clocks · RTSS 1988
Hardware reliability and fault tolerance › fault-tolerant architecture
fault-tolerant clock
0.011988
On the Graceful Degradation of Phase-Locked Clocks · RTSS 1988
Distributed systems › fault tolerance › resilience
graceful degradation
0.011988
On the Graceful Degradation of Phase-Locked Clocks · RTSS 1988
Electronic design automation › physical design › placement › partitioning-based placement
min-cut placement
0.011988
The Min-cut Shuffle: Toward a Solution for the Global Effect Problem of Min-cut Placement · DAC 1988
Electronic design automation
physical design
0.011988
The Min-cut Shuffle: Toward a Solution for the Global Effect Problem of Min-cut Placement · DAC 1988
Mathematical optimization
dynamical systems
0.011988
Formal Basis for Commonsense Abstraction of Dynamic Systems · AAAI 1988
Logic in computer science
formal methods
0.011988
Formal Basis for Commonsense Abstraction of Dynamic Systems · AAAI 1988
Embedded and real-time systems
distributed real-time systems
0.011987
Processor Tradeoffs in Distributed Real-Time Systems · IEEE Trans. Computers 1987
Interconnection networks and networks-on-chip › routing algorithms
fault-tolerant routing
0.011994
Fault-tolerant convergence routing · ICNP 1994
Hardware reliability and fault tolerance
network fault tolerance
0.011994
Fault-tolerant convergence routing · ICNP 1994
Empirical software engineering › mining software repositories
defect datasets
0.011993
A Case Study of Software Process Improvement During Development · IEEE Trans. Software Eng. 1993
Software testing
fault detection
0.011993
Post-Process Feedback With and Without Attribute Focusing: A Comparative Evaluation · ICSE 1993
Electronic design automation › physical design
placement
0.011988
The Min-cut Shuffle: Toward a Solution for the Global Effect Problem of Min-cut Placement · DAC 1988

Methods — techniques the papers use, named apart from their topics

virtual addressing · 0.0spanning tree · 0.0machine-assisted data exploration · 0.0formal basis · 0.0defect trigger distribution analysis · 0.0comparative evaluation · 0.0defect type distribution · 0.0defect trigger distribution · 0.0fault model analysis · 0.0clock synchronization bounds · 0.0heuristic optimization · 0.0
YearPublicationVenuePosition
1997 Advanced Scout: Data Mining and Knowledge Discovery in NBA Data
Inderpal S. Bhandari, Edward Colet, Jennifer Parker 0001, Zachary Pines, Rajiv Pratap, Krishnakumar Ramanujam
Data Min. Knowl. Discov.1
1997 Fault-Tolerant Convergence Routing
Bülent Yener, Inderpal S. Bhandari, Yoram Ofek, Moti Yung
J. Parallel Distributed Comput.2
1995 Models of test selection
abstract
Complex systems such as computers, aerospace systems, etc., are often tested by using a sequence of tests to exercise the functionality of the system. If the system fails a test, an error message is generated, initiating the test selection (TS) phase. The troubleshooter must decide whether or not to run more tests. Should the troubleshooter decide to conduct more tests, a test must be chosen as it may no longer be useful to conform to the predefined sequence. While in the TS phase, the troubleshooter will repeatedly make these decisions until he is done. The authors present a domain-independent framework to automate TS that is based on two computational models, TI and TP. Both models are needed for the authors show there are applications for which one model performs well, while the other model performs poorly. The use of the appropriate model for automating TS is indicated by certain characteristics of the testing sequence and the system under test.>
Inderpal S. Bhandari, Herbert A. Simon, Daniel P. Siewiorek
IEEE Trans. Syst. Man Cybern.1
1994 Fault-tolerant convergence routing
abstract
This paper presents fault-tolerant protocols for fast packet switch networks with convergence routing. The objective is to provide, after a link or a node (switch) failure, fast reconfiguration and continuous host-to-host communication. Convergence routing is a variant of deflection routing, which combines in a dynamic fashion, the on-line routing decision with the traffic load inside the network. Unlike other deflection techniques, convergence routing guarantees that packets will reach or converge to their destinations. This fault-tolerant solution is designed for a switch-based (i.e., arbitrary topology) LAN architecture called MetaNet. The original MetaNet's convergence routing scheme has been modified in order to facilitate the property that the packet header need not be recomputed after a failure and/or a reconfiguration. This is achieved by having, at the network interface, a translator that maps the unique destination address to a virtual address. The virtual addresses are stored at the packet header, and used for convergence routing, with a global sense of direction over (i) a single spanning tree, and (ii) over two edge-disjoint spanning trees, for redundancy (fault tolerance) and greater efficiency.>
Bülent Yener, Inderpal S. Bhandari, Yoram Ofek, Moti Yung
ICNP2
1994 Experiences in transferring a software process improvement methodology to production laboratories
Michael J. Halliday, Inderpal S. Bhandari, Jarir K. Chaar, Ram Chillarege
J. Syst. Softw.2
1993 Post-Process Feedback With and Without Attribute Focusing: A Comparative Evaluation
Inderpal S. Bhandari, Norman Roth
ICSE1
1993 On the Evaluation of Software Inspections and Tests
abstract
The goal of software inspections and tests is to reduce the expected cost of software failure over the life of a product. This paper extends the use of defect triggers, the events which cause defects to be discovered, to help evaluate the effectiveness of inspection and test activities. In the case of inspections, the defect trigger is defined as a set of values which associate the skills of the inspector with the discovered defect. Similarly, for tests, the defect trigger values embody the various strategies being used in creating test scenarios. The usefulness of triggers in evaluating the effectiveness of software inspections and tests is demonstrated by evaluating the inspection and test activities of some software products. These evaluations are used to point to both deficiencies in inspection and test strategies, and progress made in improving such strategies.>
Jarir K. Chaar, Michael J. Halliday, Inderpal S. Bhandari, Ram Chillarege
ITC3
1993 A Case Study of Software Process Improvement During Development
abstract
We present a case study of the use of a software process improvement method which is based on the analysis of defect data. The first step of the method is the classification of software defects using attributes which relate defects to specific process activities. Such classification captures the semantics of the defects in a fashion which is useful for process correction. The second step utilizes a machine-assisted approach to data exploration which allows a project team to discover such knowledge from defect data as is useful for process correction. We show that such analysis of defect data can readily lead a project team to improve their process during development.>
Inderpal S. Bhandari, Michael J. Halliday, Eric Tarver, Jarir K. Chaar, Ram Chillarege
IEEE Trans. Software Eng.1
1993 In-Process Evaluation for Software Inspection and Test
abstract
The goal of software inspection and test is to reduce the expected cost of software failure over the life of a product. The authors extend the use of defect triggers, the events that cause defects to be discovered, to help evaluate the effectiveness of inspections and test scenarios. In the case of inspections, the defect trigger is defined as a set of values that associate the skills of the inspector with the discovered defect. Similarly, for test scenarios, the defect trigger values embody the deferring strategies being used in creating these scenarios. The usefulness of triggers in evaluating the effectiveness of software inspections and tests is demonstrated by evaluating the inspection and test activities of some software products. These evaluations are used to point to deficiencies in inspection and test strategies, and to progress made in improving such strategies. The trigger distribution of the entire inspection or test series may then be used to highlight areas for further investigation, with the aim of improving the design, implementation, and test processes.>
Jarir K. Chaar, Michael J. Halliday, Inderpal S. Bhandari, Ram Chillarege
IEEE Trans. Software Eng.3
1992 Orthogonal Defect Classification - A Concept for In-Process Measurements
abstract
Orthogonal defect classification (ODC), a concept that enables in-process feedback to software developers by extracting signatures on the development process from defects, is described. The ideas are evolved from an earlier finding that demonstrates the use of semantic information from defects to extract cause-effect relationships in the development process. This finding is leveraged to develop a systematic framework for building measurement and analysis methods. The authors define ODC and discuss the necessary and sufficient conditions required to provide feedback to a developer; illustrate the use of the defect type distribution to measure the progress of a product through a process; illustrate the use of the defect trigger distribution to evaluate the effectiveness and eventually the completeness of verification processes such as inspection or testing; provides sample results from pilot projects using ODC; and open the doors to a wide variety of analysis techniques for providing effective and fast feedback based on the concepts of ODC.>
Ram Chillarege, Inderpal S. Bhandari, Jarir K. Chaar, Michael J. Halliday, Diane S. Moebus, Bonnie K. Ray, Man-Yuen Wong
IEEE Trans. Software Eng.2
1990 Optimal probe selection in diagnostic search
abstract
Probe selection (PS) in machine diagnosis is viewed as a collection of models that apply under specific conditions. This makes it possible for three polynomial-time optimal algorithms to be developed for simplified PS models that allow different probes to have different costs. The work is compared with previous research, wherein H.A. Simon and J.B. Kadane (1975) review and develop a collection of models for optimal problem-solving search. The relationship between these models and the three newly developed algorithms for PS is explored. Two of the algorithms are unlike the ones discussed by Simon and Kadane. The third cannot be related to the problem-solving models.>
Inderpal S. Bhandari, Herbert A. Simon, Daniel P. Siewiorek
IEEE Trans. Syst. Man Cybern.1
1988 Formal Basis for Commonsense Abstraction of Dynamic Systems
Yumi Iwasaki, Inderpal S. Bhandari
AAAI2
1988 The Min-cut Shuffle: Toward a Solution for the Global Effect Problem of Min-cut Placement
Inderpal S. Bhandari, Mark Hirsch, Daniel P. Siewiorek
DAC1
1988 A Parallel Algorithm for Colouring Graphs
abstract
A simple and effective parallel algorithm to color the nodes of a graph is presented. The algorithm is useful in its own right. It also provides a vehicle to demonstrate the tradeoffs between performance and speed implicit in many parallel algorithms. The algorithm is used when the parallel machine has at least as many processors as there are nodes to color.>
Inderpal S. Bhandari, C. Mani Krishna 0001, Daniel P. Siewiorek
ICDCS1
1988 On the Graceful Degradation of Phase-Locked Clocks
abstract
The use of phase-locked clocks to limit clock skews to fractions of the clock period while keeping the algorithm overhead very small is investigated. The number of clocks in the system required to ensure that up to m arbitrary failures can be tolerated with all the good clocks still in synchrony has been shown to be N>or=3m+1. It is shown here that, if N>
C. Mani Krishna 0001, Inderpal S. Bhandari
RTSS2
1987 Processor Tradeoffs in Distributed Real-Time Systems
abstract
Optimizing the design of real-time distributed systems is important since the systems are frequently critical to life. This optimization is a difficult problem, and heuristics and designer judgment are called for in the process. The chief cause of the difficulty is the large number of parameters under the designer's control which impact performance and life-cycle cost. We study the interplay between the more important parameters in this paper using two objective measures, i. e., the mean cost and the probability of dynamic failure in [6], [10]. Among these are the processor burn-in time and processor replacement policy. A central feature of this work is a look at how the application requirements affect the optimality of the distributed systems; indeed, the application requirements are an integral part of the analysis.
C. Mani Krishna 0001, Kang G. Shin, Inderpal S. Bhandari
IEEE Trans. Computers3