Demo Data from EDBT 2026 / reviewers in the wild / expert
Xueqin Yang
dblp:42/3899
· DBLP profile ↗
6ranked-venue papers
4as first author
4since 2021 · last 2025
—ORCID · conflict
Domains — the database's venue-derived domains; a paper can count in several
Artificial intelligence and machine learning · 2 · 1 first-author · 2 since 2021Applied, interdisciplinary, general and emerging computing · 2 · 1 first-author · 1 since 2021Graphics, computer vision, multimedia, augmented reality and games · 1 · 1 first-author · 1 since 2021
Expertise — from the expertise taxonomy: the topics of the expert's papers under the CCF categories. A weight counts papers with recency: 1 for a paper about the topic, 0.3 when the topic is its context, halved every five years.
| Computer architecture, parallel and distributed computing, and storage systems
2 papers |
Integrated circuit design · 77% Hardware reliability and fault tolerance · 23% |
Topics — the 6 heaviest of 6, each with the papers that count most for it
| Topic | Weight | Papers | Last | Evidence papers |
|---|---|---|---|---|
Integrated circuit design › emerging device technologies
ferroelectric devices |
0.6 | 1 | 2022 | Total ionizing dose effects on aluminum oxide/zirconium-doped hafnium oxide stack ferroelectric tunneling junctions · Sci. China Inf. Sci. 2022 |
Integrated circuit design › semiconductor devices › semiconductor device design
transistor design |
0.4 | 1 | 2020 | Single-event-transient effects in silicon-on-insulator ferroelectric double-gate vertical tunneling field effect transistors · Sci. China Inf. Sci. 2020 |
Integrated circuit design › emerging device technologies
tunneling field effect transistor |
0.4 | 1 | 2020 | Single-event-transient effects in silicon-on-insulator ferroelectric double-gate vertical tunneling field effect transistors · Sci. China Inf. Sci. 2020 |
Hardware reliability and fault tolerance › radiation effects
total ionizing dose effects |
0.2 | 1 | 2022 | Total ionizing dose effects on aluminum oxide/zirconium-doped hafnium oxide stack ferroelectric tunneling junctions · Sci. China Inf. Sci. 2022 |
Hardware reliability and fault tolerance › soft errors
single event transient |
0.1 | 1 | 2020 | Single-event-transient effects in silicon-on-insulator ferroelectric double-gate vertical tunneling field effect transistors · Sci. China Inf. Sci. 2020 |
Hardware reliability and fault tolerance
soft errors |
0.1 | 1 | 2020 | Single-event-transient effects in silicon-on-insulator ferroelectric double-gate vertical tunneling field effect transistors · Sci. China Inf. Sci. 2020 |
Methods — techniques the papers use, named apart from their topics
material characterization · 0.6
| Year | Publication | Venue | Position |
|---|---|---|---|
| 2025 | Bidirectional Semantic Fusion Network for Camouflaged Object Detection
Xueqin Yang, Guogang Cao |
PRCV (8) | 1 |
| 2025 | Fault diagnosis of multi-unit nonlinear industrial processes based on a global-local attention convolutional neural network
Xueqin Yang, Lijuan Qian, Gangyue Ye, Weirong Ye |
Eng. Appl. Artif. Intell. | 1 |
| 2025 | Soft Sensing for Time Series With Irregular Sampling Internals Based on a Denoising Interval Attention LSTM NetworkabstractThe prediction of key quality variables plays an important role in industrial status identification and monitoring. Due to process disturbance and hard device limitation, data collection in modern industries often exhibits high noise and irregular data sampling. To solve the above problems, this article proposes a stacked supervised and reconstructed input denoising autoencoder integrated with internal attention long short-term memory (SSRDAE-IALSTM) network for soft sensing modeling. First, a stacked supervised and reconstructed input denoising autoencoder (SSRDAE) is designed. Compared with the original DAE, each supervised and reconstructed input DAE (SRDAE) can simultaneously reconstruct the process data and quality data at the output layer, aiming to reduce information loss and extract quality-related features. Second, the denoised features are fed into the interval attention LSTM (IALSTM) to adjust the influence of different historical samples on the current sample in irregular sampling data to capture long-term temporal features. Finally, performance validations are carried out on an industrial debutanizer column and a penicillin fermentation process. The experimental results show that the proposed model can enhance the learning ability of process features and obtain better prediction performance than other comparison methods. Xueqin Yang, Lijuan Qian, Le Yao, Lingjian Ye, Ping Wu 0001, Gangyue Ye, Weirong Ye, Yafang Shen |
IEEE Trans. Neural Networks Learn. Syst. | 2 |
| 2022 | Total ionizing dose effects on aluminum oxide/zirconium-doped hafnium oxide stack ferroelectric tunneling junctions
Xueqin Yang, Yannan Xu, Jinshun Bi, Linjie Fan, Lanlong Ji, Gaobo Xu |
Sci. China Inf. Sci. | 1 |
| 2020 | Single-event-transient effects in silicon-on-insulator ferroelectric double-gate vertical tunneling field effect transistors
Guoliang Tian, Jinshun Bi, Gaobo Xu, Xueqin Yang, Sandip Majumdar, Huaxiang Yin, Qiuxia Xu, Wenwu Wang 0006 |
Sci. China Inf. Sci. | 5 |
| 2005 | AMS Based Reconstruction Algorithm with Two-dimensional Threshold for IP TracebackabstractIn this paper we present a new reconstruction algorithm. This algorithm is based on the Advanced Marking Scheme (AMS), and it works with a two-dimensional threshold mfd decides if a node is on the attack path by judging the situation of the edge of the packet and the Hash value match, then consequently reduces the time of reconstruction and overhead and improves the accuracy. Simulation results from the experiments carried on in the network test-bed show that obtained results are the same as theoretical results. Performance analysis and simulation experiment results shows, compared with the conventional methods, two-dimensional threshold reconstruction algorithm improves the performance of IP traceback technique obviously. Xueqin Yang, Changxing Pei, Changhua Zhu |
PDCAT | 1 |