Analysis of power grid IR-drop during scan test application has drawn growing attention because excessive IR-drop may cause a functionally correct device to fail at-speed testing. The analysis is challenging since the power grid IR-drop profile depends on not only the switching cells locations but also the power grid structure. This paper presents a scalable implementation methodology for quantifying the IR-drop effects of a set of switching cells. An example of its application to guide power-safe scan pattern generation is illustrated. The scalability and effectiveness of the proposed quantitative measure is evaluated with a 130 nm industrial design with 800 K cells.

Extraordinary power consumption during the scan test may inadvertently cause a functional good die to fail. This paper proposes a peak power reduction algorithm for the scan test which considers both the shift cycles and capture cycles simultaneously to limit the peak power of all test cycles during the test generation. In addition, the analysis also recommends the types of circuit structures that are more suitable to add test logic for maximum power reduction with the minimum test cost. The proposed methodology is highly efficient and can be applied to large industrial designs.

Low power circuits have become a necessary part in modern designs. Retention flip-flop is one of the most important components in low power designs. Conventional test methodologies are not sufficient to test the retention flip-flop thoroughly. This paper presents four new fault models and the testing of retention flip-flop. The four fault models are awake-mode stuck-at fault, sleep-mode stuck-at fault, awake-mode transition fault, and sleep-mode transition fault. The four faults model the defects that affect the retained value, wakeup time, and sleep time of retention flip-flops. Based on the new fault models, test patterns for retention flip-flop can be easily generated by current automatic test pattern generation tools. The proposed test methodology is validated by performing experiments on ISCAS'89 benchmark circuits and some realistic industrial low power designs. The experimental results show that the faults of retention flip-flops can be easily detected by our method and the average fault coverage is higher than 98%. The fault coverage of conventional single stuck-at fault and transition fault test can be increased by more than 1%.

Low power designs create new challenges in design implementation, verification and testing. DFT practice that overlooks test power may result in yield loss/overkill during manufacturing test. This paper addresses the practical problems often encountered during DFT implementation and manufacturing test for complex low power designs.

This poster presents Power Scan, a design-for-testability for power switches in VLSI designs. It measures IR drop in function mode and detects leakage current in sleep mode. Power Scan reduces the test cost at the price of small area overhead.

Test patterns of path delay faults (PDFs) are usually generated with static or robust sensitizing criteria for side inputs of gates, because defects affecting the delays of the PDFs will be captured by these patterns unconditionally. However, under functional sensitization (FS), there exist a class of defects that can be tested unconditionally, if they are not masked by the off-input controlling values. In this paper, we propose a new pattern generation method for functionally sensitizable PDFs to improve the detectability of defects. It is shown in the experiments that with the proposed method, extra segments (up to 24.02% for one benchmark) of critical paths become testable compared with only robust/non-robust patterns.

The increasing use of embedded software, often implemented on a core processor in a single-chip system, is a clear trend in the telecommunications, multimedia, and consumer electronics industries. A companion paper (Paulin et al., 1997) presents a survey of application and architecture trends for embedded systems in these growth markets. However, the lack of suitable design technology remains a significant obstacle in the development of such systems. One of the key requirements is more efficient software compilation technology. Especially in the case of fixed-point digital signal processor (DSP) cores, it is often cited that commercially available compilers are unable to take full advantage of the architectural features of the processor. Moreover, due to the shorter lifetimes and the architectural specialization of many processor cores, processor designers are often compelled to neglect the issue of compiler support. This situation has resulted in an increased research activity in the area of design tool support for embedded processors. This paper discusses design technology issues for embedded systems using processor cores, with a focus on software compilation tools. Architectural characteristics of contemporary processor cores are reviewed and tool requirements are formulated. This is followed by a comprehensive survey of both existing and new software compilation techniques that are considered important in the context of embedded processors.