Demo Data from EDBT 2026 / reviewers in the wild / expert
John J. Barrett
dblp:43/6561
· DBLP profile ↗
1ranked-venue papers
0as first author
0since 2021 · last 1992
—ORCID · none
Domains — the database's venue-derived domains; a paper can count in several
Systems, architecture and hardware · 1
Expertise — from the expertise taxonomy: the topics of the expert's papers under the CCF categories. A weight counts papers with recency: 1 for a paper about the topic, 0.3 when the topic is its context, halved every five years.
| Computer architecture, parallel and distributed computing, and storage systems
1 paper |
Electronic design automation · 61% Integrated circuit design · 39% |
Topics — the 3 heaviest of 4, each with the papers that count most for it
| Topic | Weight | Papers | Last | Evidence papers |
|---|---|---|---|---|
Electronic design automation
interconnect modeling |
0.0 | 1 | 1992 | Modeling of multiconductor systems for packaging and interconnecting high-speed digital IC's · IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 1992 |
Integrated circuit design › interconnect
multiconductor transmission line |
0.0 | 1 | 1992 | Modeling of multiconductor systems for packaging and interconnecting high-speed digital IC's · IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 1992 |
Electronic design automation
signal integrity |
0.0 | 1 | 1992 | Modeling of multiconductor systems for packaging and interconnecting high-speed digital IC's · IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 1992 |
Methods — techniques the papers use, named apart from their topics
partial element equivalent circuit · 0.0finite element method · 0.0boundary element method · 0.0
| Year | Publication | Venue | Position |
|---|---|---|---|
| 1992 | Modeling of multiconductor systems for packaging and interconnecting high-speed digital IC'sabstractIn the design of high-speed circuits, it is important to consider the adverse effects of packaging and interconnections on signal integrity. A review of quasi-TEM capacitance and inductance analysis of multiconductor transmission line systems is presented. The development of three general modeling techniques is discussed, namely, the boundary element method, the finite element method, and the partial element equivalent circuit technique. The application of each method to practical systems is outlined, with particular reference to the literature. A complete formulation for the boundary element, which is applicable to multiconductor systems of arbitrary geometry in nonhomogeneous media, is provided. The analysis of a seven-line buried microstrip structure illustrates the main differences between the finite element and boundary element approaches.> Thomas F. Hayes, John J. Barrett |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. | 2 |