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Tawfik Rahal-Arabi

dblp:44/3043 · DBLP profile ↗
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3ranked-venue papers
0as first author
1since 2021 · last 2026
—ORCID · none

Domains — the database's venue-derived domains; a paper can count in several

Systems, architecture and hardware · 3 · 1 since 2021

Expertise — from the expertise taxonomy: the topics of the expert's papers under the CCF categories. A weight counts papers with recency: 1 for a paper about the topic, 0.3 when the topic is its context, halved every five years.

Computer architecture, parallel and distributed computing, and storage systems
1 paper
Hardware reliability and fault tolerance · 50% Integrated circuit design · 50%

Topics — the 2 heaviest of 2, each with the papers that count most for it

TopicWeightPapersLastEvidence papers
Integrated circuit design
power delivery network
1.012026
Exploration of LLM Workload Reliability Based on di/dt Effects and Voltage Droops · HPCA 2026
Hardware reliability and fault tolerance
voltage droop
1.012026
Exploration of LLM Workload Reliability Based on di/dt Effects and Voltage Droops · HPCA 2026

Methods — techniques the papers use, named apart from their topics

stressmark framework · 1.0kernel staggering · 1.0
YearPublicationVenuePosition
2026 Exploration of LLM Workload Reliability Based on di/dt Effects and Voltage Droops
abstract
Large language model (LLM) inference workloads have emerged as a critical reliability challenge for cloud GPU systems. Unlike traditional workloads, the highly structured execution of LLMs creates large power oscillations. These oscillations become a vulnerability when their frequency aligns with the resonant modes of a GPU's power delivery network (PDN), leading to excessive voltage droops and unreliable operation. In this work, we present the first comprehensive profiling of LLM-induced power oscillations, revealing that many workloads generate oscillatory patterns in the MHz range-critically aligning with typical GPU PDN resonant frequencies and leading to excessive voltage droops. To systematically investigate this phenomenon, we developed a novel stressmark framework that generates workloads with controllable, high-frequency power oscillations and voltage droops. Our evaluation shows that operating at a resonant frequency induces voltage droops up to$2 \times$larger than conventional workloads, exceeding critical noise margins. Critically, we find that real LLM workloads operating even near these frequencies generate significant voltage droops greater than 100 mV. Based on these findings, we propose a kernel staggering technique that mitigates this threat by shifting power oscillation frequencies away from resonance frequency, successfully reducing voltage droops and reducing reliability concerns. This work provides the first systematic understanding of LLM-PDN resonance and offers a practical solution to improve GPU reliability in AI cloud environments.
Justin Garrigus, Allison Seigler, Ethan Syed, Yan-Lun Huang, Mehdi Sadi, Tawfik Rahal-Arabi, Lizy Kurian John
HPCA7
2014 An Algorithm-Centric Energy-Aware Design Methodology
abstract
The goal of this brief is to present a unique top-down design methodology for developing energy-aware algorithms based on energy profiling. The key idea revolves around identifying and measuring components of code with high energy consumption. There are two major contributions of this brief: 1) a method for identifying components with high energy consumption in compute-intensive applications. To this end, we target operations called kernels, which are frequently used operations in the algorithm; 2) a method for estimating software energy for the identified software components, in particular for kernels and load/store operations. The energy evaluation method involves isolated code with assembly injection. Furthermore, to ensure reliable results, we use physical energy measurements conducted on specially instrumented circuit boards to provide actual and not just simulated measurements. To evaluate the proposed methods, we conducted two case studies using data mining algorithms: K-nearest neighbors and linear regression. The results highlight the contributions of kernels and memory energy to total energy.
Hazem M. Hajj, Wassim El-Hajj, Mehiar Dabbagh, Tawfik Rahal-Arabi
IEEE Trans. Very Large Scale Integr. Syst.4
2004 I/O Self-Leakage Test
abstract
This work presents the implementation of the self-leakage test, a new approach for unconnected I/O leakage testing. It provides a path for leakage current through the on-chip leakers and uses the voltage drop at the pad to detect a pass/fail condition. A detailed methodology for defining the self-leakage test specifications has been developed. Preliminary silicon data shows that self-leakage test methodology provide a viable method for high-volume monitoring of I/O leakage at minimal on-die DFT (design-for-test) overhead.
Ali Muhtaroglu, Benoit Provost, Tawfik Rahal-Arabi, Greg Taylor
ITC3