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S. Karunanithi

dblp:44/4315 · DBLP profile ↗
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2ranked-venue papers
2as first author
0since 2021 · last 1979
—ORCID · none

Domains — the database's venue-derived domains; a paper can count in several

Systems, architecture and hardware · 2 · 2 first-author

Expertise — from the expertise taxonomy: the topics of the expert's papers under the CCF categories. A weight counts papers with recency: 1 for a paper about the topic, 0.3 when the topic is its context, halved every five years.

Computer architecture, parallel and distributed computing, and storage systems
2 papers
Electronic design automation · 60% Hardware reliability and fault tolerance · 28% Integrated circuit design · 11%

Topics — the 7 heaviest of 7, each with the papers that count most for it

TopicWeightPapersLastEvidence papers
Electronic design automation › hardware verification and test › fault diagnosis › system-level diagnosis
sequential diagnosis
0.011979
Analysis of Digital Systems Using a New Measure of System Diagnosis · IEEE Trans. Computers 1979
Hardware reliability and fault tolerance
system diagnosis
0.011979
Analysis of Digital Systems Using a New Measure of System Diagnosis · IEEE Trans. Computers 1979
Electronic design automation › logic synthesis
logic elements
0.011978
Some New Types of Logical Completeness · IEEE Trans. Computers 1978
Electronic design automation
logic synthesis
0.011978
Some New Types of Logical Completeness · IEEE Trans. Computers 1978
Integrated circuit design › digital circuit design
combinational logic
0.011978
Some New Types of Logical Completeness · IEEE Trans. Computers 1978
Hardware reliability and fault tolerance
fault-tolerant design
0.011979
Analysis of Digital Systems Using a New Measure of System Diagnosis · IEEE Trans. Computers 1979
Integrated circuit design › digital circuit design
threshold logic
0.011978
Some New Types of Logical Completeness · IEEE Trans. Computers 1978
YearPublicationVenuePosition
1979 Analysis of Digital Systems Using a New Measure of System Diagnosis
abstract
A new measure of system diagnosis, t/s diagnosability, originally proposed by Friedman, is used to study the diagnosability of digital systems. This new measure incorporates the concept of possible replacement of fault-free units in system repair, whereas the previous measures have only considered the replacement of faulty units. Two categories of the new measure, one-step t/s diagnosability and sequential t/s diagnosability, are investigated. Two canonical classes of systems, single loop systems and DδAsystems (⌊t/2⌋ < A ≤ t), are examined based on these two categories of diagnosability. For each system class, the necessary and sufficient condition for one-step ts diagnosability is obtained and related to some previous results on t-fault diagnosability; also, an efficient one-step t/s repair procedure is presented. For both these system classes, optimal one-step t/s diagnosable system designs, which minimize the number of units and test links, are considered. Several sequential diagnosis strategies are presented for each system class. For all these diagnosis strategies optimal system designs are also considered. Finally, all the diagnosis strategies are compared and the tradeoff between the number of units replaced and the number of test iterations performed is discussed.
S. Karunanithi, Arthur D. Friedman
IEEE Trans. Computers1
1978 Some New Types of Logical Completeness
abstract
In this paper, we consider the problem of determining if a given set of simple combinational functions, called logic primitives, can be used to realize any arbitrarily complex combinational function. The complex combinational function is realized by suitably interconnecting the primitives, and in most cases several copies of the primitives. Such a set of primitives is said to be complete in some sense. Two important types of logical completeness that have been previously studied are: 1) strong completeness where the circuit inputs are the uncomplemented variables x1,x2,···,xn, and 2) weak completeness where the circuit inputs are 0,1,x1,x2,···,xn. In this paper, we discuss two new types of logical completeness: strong c-completeness with inputs x1, x̄1, x2, x̄2,···,xn, x̄n and weak c-completeness with inputs 1, 0, x1, x̄1, x2, x̄2,···, xn, x̄n, and we derive necessary and sufficient conditions for a set of primitives to be strong c-complete or weak c-complete. We also discuss the relations between the above four types of completeness. Finally, we consider two more types, complement completeness and dual completeness, which may have applications to some recent technologies.
S. Karunanithi, Arthur D. Friedman
IEEE Trans. Computers1