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P. V. Krishna Iyer

dblp:46/6489 · DBLP profile ↗
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1ranked-venue papers
0as first author
0since 2021 · last 1990
—ORCID · none

Domains — the database's venue-derived domains; a paper can count in several

Systems, architecture and hardware · 1

Expertise — from the expertise taxonomy: the topics of the expert's papers under the CCF categories. A weight counts papers with recency: 1 for a paper about the topic, 0.3 when the topic is its context, halved every five years.

Computer architecture, parallel and distributed computing, and storage systems
1 paper
Hardware reliability and fault tolerance · 77% Performance modeling and evaluation · 23%

Topics — the 2 heaviest of 2, each with the papers that count most for it

TopicWeightPapersLastEvidence papers
Hardware reliability and fault tolerance
failure analysis
0.011990
Automatic Recognition of Intermittent Failures: An Experimental Study of Field Data · IEEE Trans. Computers 1990
Performance modeling and evaluation
field data analysis
0.011990
Automatic Recognition of Intermittent Failures: An Experimental Study of Field Data · IEEE Trans. Computers 1990

Methods — techniques the papers use, named apart from their topics

statistical analysis · 0.0
YearPublicationVenuePosition
1990 Automatic Recognition of Intermittent Failures: An Experimental Study of Field Data
abstract
A methodology is proposed for recognizing the symptoms of persistent problems in large systems. The system error rate is used to identify the error states among which relationships may exist. Statistical techniques are used to validate and quantify the strength of the relationship among these error states. As input, the approach takes the raw error logs containing a single entry for each error that is detected as an isolated event. As output, it produces a list of symptoms that characterize persistent errors. Thus, given a failure, it is determined whether the failure is an intermittent manifestation of a common fault or whether it is an isolated (transient) incident. The technique is shown to work on two CYBER systems and on IBM 3081 multiprocessor system. Comparisons to real failure/repair information obtained from field engineers show that, in about 85% of the cases, the error symptoms recognized by this approach correspond to real problems. The remaining 15% of the cases, although not directly supported by field data, are confirmed as being valid problems.>
Ravishankar K. Iyer, Luke T. Young, P. V. Krishna Iyer
IEEE Trans. Computers3