Demo Data from EDBT 2026 / reviewers in the wild / expert
J. C. Chueh
dblp:49/51
· DBLP profile ↗
1ranked-venue papers
0as first author
0since 2021 · last 1967
—ORCID · none
Domains — the database's venue-derived domains; a paper can count in several
Applied, interdisciplinary, general and emerging computing · 1
Expertise — from the expertise taxonomy: the topics of the expert's papers under the CCF categories. A weight counts papers with recency: 1 for a paper about the topic, 0.3 when the topic is its context, halved every five years.
| Artificial intelligence
1 paper |
Learning theory · 50% Image recognition and object detection · 38% Probabilistic and Bayesian machine learning · 12% |
Topics — the 4 heaviest of 4, each with the papers that count most for it
| Topic | Weight | Papers | Last | Evidence papers |
|---|---|---|---|---|
Computer vision › Image recognition and object detection
character recognition |
0.0 | 1 | 1967 | Error Probability in Decision Functions for Character Recognition · J. ACM 1967 |
Machine learning › Learning theory › generalization bounds
error probability bounds |
0.0 | 1 | 1967 | Error Probability in Decision Functions for Character Recognition · J. ACM 1967 |
Machine learning › Learning theory › statistical pattern recognition
bayes optimal classifier |
0.0 | 1 | 1967 | Error Probability in Decision Functions for Character Recognition · J. ACM 1967 |
Machine learning › Probabilistic and Bayesian machine learning
statistical decision theory |
0.0 | 1 | 1967 | Error Probability in Decision Functions for Character Recognition · J. ACM 1967 |
Methods — techniques the papers use, named apart from their topics
feature selection · 0.0bayes decision functions · 0.0
| Year | Publication | Venue | Position |
|---|---|---|---|
| 1967 | Error Probability in Decision Functions for Character RecognitionabstractUpper bounds for the error probability of a Bayes decision function are derived in terms of the differences among the probability distributions of the features used in character recognition. Applications to feature selection and error reduction are discussed. It is shown that if a sufficient number of well-selected features is used, the error probability can be made arbitrarily small. John T. Chu, J. C. Chueh |
J. ACM | 2 |