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Joseph W. Jerome

dblp:50/6568 · DBLP profile ↗
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4ranked-venue papers
2as first author
0since 2021 · last 1995
0000-0002-8312-0053ORCID · corroborated

Domains — the database's venue-derived domains; a paper can count in several

Systems, architecture and hardware · 4 · 2 first-author

Expertise — from the expertise taxonomy: the topics of the expert's papers under the CCF categories. A weight counts papers with recency: 1 for a paper about the topic, 0.3 when the topic is its context, halved every five years.

Interdisciplinary, comprehensive, and emerging computing
3 papers
Computational science and engineering · 100%
Computer architecture, parallel and distributed computing, and storage systems
2 papers
Electronic design automation · 72% Integrated circuit design · 28%

Topics — the 5 heaviest of 5, each with the papers that count most for it

TopicWeightPapersLastEvidence papers
Computational science and engineering
numerical analysis
0.031995
Transport effects and characteristic modes in the modeling and simulation of submicron devices · IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 1995
Numerical methods for the hydrodynamic device model: subsonic flow · IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 1989
The Role of Semiconductor Device Diameter and Energy-Band Bending in Convergence of Picard Iteration for Gummel's Map · IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 1985
Computational science and engineering › computational physics
semiconductor device simulation
0.021995
Transport effects and characteristic modes in the modeling and simulation of submicron devices · IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 1995
The Role of Semiconductor Device Diameter and Energy-Band Bending in Convergence of Picard Iteration for Gummel's Map · IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 1985
Electronic design automation › technology computer-aided design
device simulation
0.021991
Solution of the hydrodynamic device model using high-order nonoscillatory shock capturing algorithms · IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 1991
Numerical methods for the hydrodynamic device model: subsonic flow · IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 1989
Integrated circuit design › semiconductor device modeling
hydrodynamic device model
0.021991
Numerical methods for the hydrodynamic device model: subsonic flow · IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 1989
Solution of the hydrodynamic device model using high-order nonoscillatory shock capturing algorithms · IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 1991
Electronic design automation
technology computer-aided design
0.011991
Solution of the hydrodynamic device model using high-order nonoscillatory shock capturing algorithms · IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 1991

Methods — techniques the papers use, named apart from their topics

shock capturing algorithms · 0.0jacobian matrix analysis · 0.0characteristic value analysis · 0.0nonlinear wave analysis · 0.0hydrodynamic model · 0.0block iterative method · 0.0shock-capturing numerical algorithms · 0.0essentially nonoscillatory schemes · 0.0van roosbroeck system · 0.0slotboom variables · 0.0maximum principles · 0.0lipschitz constant analysis · 0.0
YearPublicationVenuePosition
1995 Transport effects and characteristic modes in the modeling and simulation of submicron devices
abstract
This paper has two major goals: (1) to study the effect of the common practice of neglecting the convective terms (inertial approximation) in the hydrodynamic model in the simulation of n/sup +/-n-n/sup +/ diodes and two dimensional MESFET devices; and (2) to test analytical criteria, formulated in terms of characteristic values of the Jacobian matrix, as a method of determining the impact of first derivative perturbation terms in this model, and in related energy transport models. This characteristic value analysis can be thought of as generalizing the usual analytical solution of first order linear systems of ordinary differential equations with constant coefficients. Concerning (1), we find that the inertial approximation is invalid near the diode junctions, and near the contact regions of the MESFET device. In regard to (2), we find a proper arrangement of terms, expressing the flux, such that the first derivative part of the system is hyperbolic, both for the hydrodynamic model and the energy transport model. For the hydrodynamic model, two forms of the heat conduction term are studied, including the case of a convective term. This suggests and validates the use of shock capturing algorithms for the simulation.>
Joseph W. Jerome, Chi-Wang Shu
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.1
1991 Solution of the hydrodynamic device model using high-order nonoscillatory shock capturing algorithms
abstract
Simulation results for the hydrodynamic model are presented for an n/sup +/-n-n/sup +/ diode by use of shock-capturing numerical algorithms applied to the transient model with subsequent passage to the steady state. The numerical method is first order in time, but of high spatial order in regions of smoothness. Implementation typically requires a few thousand time steps. These algorithms, termed essentially nonoscillatory, have been successfully applied in other contexts to model the flow in gas dynamics, magnetohydrodynamics, and other physical situations involving the conservation laws of fluid mechanics. The presented semiconductor simulations reveal temporal and spatial velocity overshot, as well as overshoot relative to an electric field induced by the Poisson equation. Shocks are observed in the transient simulations for certain low-temperature parameter regimes.>
Emad Fatemi, Joseph W. Jerome, Stanley J. Osher
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.2
1989 Numerical methods for the hydrodynamic device model: subsonic flow
abstract
An introduction to the hydrodynamic model for semiconductor devices is presented. Special attention is paid to classifying the hydrodynamic PDEs (partial differential equations) and analyzing their nonlinear wave structure. Numerical simulations of the ballistic diode using the hydrodynamical device model are presented, as an illustrative elliptic problem. The importance of nonlinear block iterative methods is emphasized. Arguments for existence of solutions and convergence of numerical methods are given for the case of subsonic electron flow.>
Carl L. Gardner, Joseph W. Jerome, Donald J. Rose
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.2
1985 The Role of Semiconductor Device Diameter and Energy-Band Bending in Convergence of Picard Iteration for Gummel's Map
abstract
Steady-state semiconductor-device simulation is studied. A mathematical analysis of the so-called Lipschitz constant of the Gummel map, in the Slotboom variables, is given in terms of the device diameter d and the band-bending. This constant is directly related to the convergence of Picard iteration, within a convex, compact solution set, determined by the steady state, Van Roosbroeck system maximum principles. Allowing for specified gradient singularities, of order cr /sup -1/2/, we obtain an asymptotic dependence of d /sup 5/2/ as d -> 0. Functions of sup-inf boundary values of the data also appear, particularly as related to doping concentrations, in the representation of the band-bending. For simplicity, constant mobilities and zero recombination are assumed, at thermodynamic equilibrium. The setting is general, but motivated by FET devices. For micron devices at room temperature, convergence and unique solutions are expected up to, perhaps, band-bending of 0.42 /sup -2/3/ log c(kT) electronvolts in width across the intrinsic energy level. The definition of the Gummel map used herein employs the potential equation as a fractional step, based upon given values of the Slotboom variables. The continuity equations are then solved for the values associated with the Gummel map. The condition given for convergence of Picard iteration also guarantees uniqueness of solutions of the device model for prescribed doping and contact conditions. Finally, the constant c is estimated on the basis of heuristic considerations.
Joseph W. Jerome
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.1