Demo Data from EDBT 2026 / reviewers in the wild / expert
Mohamed Abdelaziz Marouf
dblp:50/6604
· DBLP profile ↗
1ranked-venue papers
1as first author
0since 2021 · last 1978
—ORCID · none
Domains — the database's venue-derived domains; a paper can count in several
Systems, architecture and hardware · 1 · 1 first-author
Expertise — from the expertise taxonomy: the topics of the expert's papers under the CCF categories. A weight counts papers with recency: 1 for a paper about the topic, 0.3 when the topic is its context, halved every five years.
| Computer architecture, parallel and distributed computing, and storage systems
1 paper |
Hardware reliability and fault tolerance · 67% Integrated circuit design · 33% |
Topics — the 3 heaviest of 3, each with the papers that count most for it
| Topic | Weight | Papers | Last | Evidence papers |
|---|---|---|---|---|
Integrated circuit design
digital circuit design |
0.0 | 1 | 1978 | Efficient Design of Self-Checking Checker for any m-Out-of-n Code · IEEE Trans. Computers 1978 |
Hardware reliability and fault tolerance › fault-tolerant design › fault-tolerant circuit design
m-out-of-n code checker |
0.0 | 1 | 1978 | Efficient Design of Self-Checking Checker for any m-Out-of-n Code · IEEE Trans. Computers 1978 |
Hardware reliability and fault tolerance
self-checking circuits |
0.0 | 1 | 1978 | Efficient Design of Self-Checking Checker for any m-Out-of-n Code · IEEE Trans. Computers 1978 |
Methods — techniques the papers use, named apart from their topics
unidirectional multiple stuck-type faults · 0.0stuck-at fault model · 0.0
| Year | Publication | Venue | Position |
|---|---|---|---|
| 1978 | Efficient Design of Self-Checking Checker for any m-Out-of-n CodeabstractThe use of self-checking checkers in the design of highly reliable systems has many significant advantages. It allows errors to be detected upon occurrence without testing, whether the error is caused by a permanent or intermittent fault. However, there are relatively few codes for which efficient self-checking checkers have been designed. In this paper we present procedures for designing efficient self-checking checkers for m-out-of-n codes (i.e., codes where each valid code word consists of m bits with value 1 and n – m bits with value 0). Codes for arbitrary values of m and n are considered. Realizations which require significantly less logic than previously known realizations are presented for all cases except n = 2m and m = 1. These checkers are totally self-checking for all single and unidirectional multiple stuck-type faults. They are also very easy to test compared with previously presented realizations. Saving in logic complexity and testing complexity of 70 to 97 percent is demonstrated. Mohamed Abdelaziz Marouf, Arthur D. Friedman |
IEEE Trans. Computers | 1 |