Negative Bias Temperature Instability (NBTI) is a leading reliability concern for integrated circuits (ICs). It gradually increases the threshold voltages of PMOS transistors, thereby increasing delay. We propose scheduled voltage scaling, a technique that gradually increases the operating voltage of the IC to compensate for NBTI-related performance degradation. Scheduled voltage scaling has the potential to increase IC lifetime by 46% relative to the conventional approach using guard banding for ICs fabricated using a 45 nm process.

Within-die variation in leakage power consumption is substantial and increasing for chip-level multiprocessors (CMPs) and multiprocessor systems-on-chip. Dealing with this problem via conservative assumptions is sub-optimal. Instead, operating systems may adapt task assignment and power management decisions to the variable characteristics of cores, improving system-wide power consumption and performance. Researchers have proposed such adaptation techniques. However, they rely on knowledge of CMP process variation (PV) maps. These maps are not provided by processor vendors, providing them would impose additional cost during the testing process, and static maps would not permit adaptation to aging effects. Further progress on developing and validating PV aware control techniques for CMPs requires access to PV maps for real processors. We present an online technique to extract the PV maps of CMPs. Potentially automatic temperature measurements with built-in on-die sensors during the execution of characterization workloads are used to determine variation in leakage power consumption. The proposed technique is applied to real CMPs, and the resulting PV maps are used within a PV aware task assignment and scheduling algorithm.