Demo Data from EDBT 2026 / reviewers in the wild / expert
Joseph E. Hall
dblp:52/3595
· DBLP profile ↗
1ranked-venue papers
1as first author
0since 2021 · last 1987
—ORCID · none
Domains — the database's venue-derived domains; a paper can count in several
Systems, architecture and hardware · 1 · 1 first-author
Expertise — from the expertise taxonomy: the topics of the expert's papers under the CCF categories. A weight counts papers with recency: 1 for a paper about the topic, 0.3 when the topic is its context, halved every five years.
| Computer architecture, parallel and distributed computing, and storage systems
1 paper |
Electronic design automation · 67% Hardware reliability and fault tolerance · 33% |
Topics — the 3 heaviest of 3, each with the papers that count most for it
| Topic | Weight | Papers | Last | Evidence papers |
|---|---|---|---|---|
Hardware reliability and fault tolerance › device reliability
electromigration analysis |
0.0 | 1 | 1987 | SPIDER -- A CAD System for Modeling VLSI Metallization Patterns · IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 1987 |
Electronic design automation
physical design |
0.0 | 1 | 1987 | SPIDER -- A CAD System for Modeling VLSI Metallization Patterns · IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 1987 |
Electronic design automation › power integrity
voltage drop analysis |
0.0 | 1 | 1987 | SPIDER -- A CAD System for Modeling VLSI Metallization Patterns · IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 1987 |
Methods — techniques the papers use, named apart from their topics
optimization algorithm · 0.0hierarchical analysis · 0.0
| Year | Publication | Venue | Position |
|---|---|---|---|
| 1987 | SPIDER -- A CAD System for Modeling VLSI Metallization PatternsabstractA system of CAD programs, called SPIDER, for ensuring adequate current-carrying capacity in VLSI circuits has been developed. The approach is hierarchical, and it automates and simplifies many of the tasks previously performed by the circuit designer. The system converts transient current waveforms into dc electromigration equivalent values, and includes an algorithm for determining the line width adjustments necessary for meeting specified median-time-to-failure (MTF) requirements. SPIDER also computes voltage drops with respect to a reference node and calls upon an optimization algorithm for correcting violations of a voltage drop specification. Joseph E. Hall, Dale E. Hocevar, Ping Yang 0001, Michael J. McGraw |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. | 1 |