Chang Liu 0019

dblp:52/5716-19 · DBLP profile ↗
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5ranked-venue papers
1as first author
4since 2021 · last 2025
0000-0002-5991-6879ORCID · verified

Domains — the database's venue-derived domains; a paper can count in several

Systems, architecture and hardware · 5 · 1 first-author · 4 since 2021
YearPublicationVenuePosition
2025 SI-Aware Wire Timing Prediction at Pre-Routing Stage with Multi-Corner Consideration
abstract
Timing closure is a critical but effort-taking task in VLSI designs. Early design stages have relatively ample room for changes that can fix timing problems in a proactive manner. However, accurate timing prediction is very challenging at early stages due to the absence of information determined by later stages in the design flow. At the pre-routing stage, it is generally believed that the prediction of wire delay is more complicated than that of gate delay, since the former is highly dependent on the routing information and PVT conditions. Addressing that, in this work, the prediction model is studied and the importance of multiple features, including Signal-Integrity (SI) related ones, is explored, with the purpose of boosting the turnaround time of physical design and reducing the performance penalty caused by worst-case scenario assumptions. Experimental results show that the proposed timing predictor has achieved a correlation of over 0.98 with the sign-off timing results in SI-mode under multi-corner scenarios.
Renjun Zhao, Yao Wang 0002, Chang Liu 0019, Yang Guo 0003
ASP-DAC5
2023 A Soft-Error Mitigation Approach Using Pulse Quenching Enhancement at Detailed Placement for Combinational Circuits
abstract
As technology continuously shrinks, radiation-induced soft errors have become a great threat to the circuit reliability. Among all the causes, the Single-Event Transient (SET) effect is the dominating one for the radiation-induced soft errors. SET-induced soft errors can be mitigated by multiple methods. In terms of area and power overhead, blocking SET propagation is considered to be the most efficient way for soft error reduction. It is found that the SET pulse width can be shrunk by a pulse quenching effect, which can be utilized to mitigate soft errors without introducing any area and power overhead. In this article, we present an effective detailed placer to exploit the pulse quenching effect for soft error reduction in combinational circuits. In our method, the quenching effect enhancement is globally optimized while the cell displacement is minimized. The experimental results demonstrate that our method reduces the soft error vulnerability of the circuits by 29.53% versus 18.38% of the state-of-the-art solution. Meanwhile, our method has a minimal effect on the displacement and half-perimeter wire length (HPWL) compared with the previous solutions, which means a minimum timing influence to the original design.
Yao Wang 0002, Chang Liu 0019, Qiang Wu 0015, Juan Luo, Yang Guo 0003
ACM Trans. Design Autom. Electr. Syst.3
2022 Accurate timing prediction at placement stage with look-ahead RC network
abstract
Timing closure is a critical but effort-taking task in VLSI designs. In placement stage, a fast and accurate net delay estimator is highly desirable to guide the timing optimization prior to routing, and thus reduce the timing pessimism and shorten the design turn-around time. To handle the timing uncertainty at the placement stage, we propose a fast net delay timing predictor based on machine learning, which extract the fully timing features using a look-ahead RC network. Experimental results show that the proposed timing predictor has achieved average correlation over 0.99 with the post-routing sign-off timing results obtained in Synopsys PrimeTime.
Zhiyong Fu, Yao Wang 0002, Chang Liu 0019, Yang Guo 0003
DAC4
2021 Advancing DSP into HPC, AI, and beyond: challenges, mechanisms, and future directions
Chen Li 0015, Chang Liu 0019, Sheng Liu 0001, Yuanwu Lei, Jian Zhang 0022, Yang Guo 0003
CCF Trans. High Perform. Comput.3
2018 Detailed placement for pulse quenching enhancement in anti-radiation combinational circuit design
Chang Liu 0019, Yang Guo 0003
Integr.1